OPTICAL PROPERTIES OF GLASSY CARBON

2002 ◽  
Vol 09 (01) ◽  
pp. 473-477 ◽  
Author(s):  
L. PAJASOVÁ ◽  
L. SOUKUP ◽  
L. JASTRABÍK ◽  
D. CHVOSTOVÁ
Keyword(s):  
Heat Treatment ◽  
Optical Properties ◽  
Glassy Carbon ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Three Dimensional ◽  
Polarized Light ◽  
Electron Plasma ◽  
Electron Transitions ◽  
Average Size

The optical constants and dielectric functions of a series of samples of glassy carbon subjected to a heat treatment from 1000°C to 3000°C have been evaluated in the spectral region of 1.5–13.8 eV. In the region of 1.5–5.0 eV the method of spectroscopic ellipsometry and multiangle reflectivity with p-polarized light was applied, while in the VUV region the optical constants were evaluated by means of multiangle reflectivity with partially polarized light as well as by means of Kramers–Kronig analysis. The optical spectra are discussed, in analogy with graphite, in terms of single-electron transitions and π electron plasma excitations. The changes in the spectra by heating are ascribed to increasing average size of ordered regions and sample densification in the absence of three-dimensional graphitization.

Effects of alloying on the optical properties of organic–inorganic lead halide perovskite thin films

2016 ◽  
Vol 4 (33) ◽  
pp. 7775-7782 ◽  
Author(s):  
Paul F. Ndione ◽  
Zhen Li ◽  
Kai Zhu
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Optical Transitions ◽  
Inorganic Perovskite ◽  
Inorganic Lead ◽  
Halide Perovskite ◽  
Lead Halide

Spectroscopic ellipsometry analysis of optical transitions and optical constants in hybrid organic–inorganic perovskite alloys.

Determination and Critical Assessment of the Optical Properties of Common Substrate Materials Used in III-V Nitride Heterostructures with Vacuum Ultraviolet Spectroscopic Ellipsometry

2001 ◽  
Vol 693 ◽  
Author(s):  
N.V. Edwards ◽  
O.P.A. Lindquist ◽  
L.D. Madsen ◽  
S. Zollner ◽  
K. Järrehdahl ◽  
...  
Keyword(s):  
Optical Properties ◽  
Dielectric Function ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Vacuum Ultraviolet ◽  
Critical Assessment ◽  
Optical Transitions ◽  
Common Substrate ◽  
Materials Used

AbstractAs a first step toward enabling the in-line metrology of III-V nitride heterostructure and materials, we present the optical constants of the two common substrate materials over an unprecendented spectral range. Vacuum Ultraviolet spectroscopic ellipsometry (VUVSE) was used to obtain the optical constants for Al2O3 and the ordinary and extra-ordinary component of the dielectric function for both 4H- and 6H-SiC. The results are discussed in the context of anisotropy, polytypism, bandstructure, optical transitions, and preparation/characterization of abrupt surfaces, where appropriate.

scholarly journals Simple and Multi-layered Quantum dot in various structures

2018 ◽  
Vol 2 (4) ◽  
Author(s):  
Manu Mitra
Keyword(s):  
Quantum Dots ◽  
Wave Function ◽  
Optical Properties ◽  
Quantum Dot ◽  
Three Dimensional ◽  
Polarized Light ◽  
High Peak ◽  
Different Color ◽  
Incoming Light ◽  
Dimensional Wave

Abstract: Quantum dots have interesting optical properties. They absorb incoming light of one color and emit out light of a completely different color. This research paper discloses eigen states of a simple and multilayer quantum dot in various structures for cuboid, cylinder, dome, cone, and pyramid, and its three-dimensional wave function, energy states, light and dark transitions (X-polarized), light and dark transitions (Y-polarized), light and dark transitions (Zpolarized), light and dark transitions (phi = 0 and theta= 45), absorption (phi = 0 and theta = 45), absorption sweep of angle theta, and integrated absorption are plotted and the observations of high peak values are noted and documented.

scholarly journals Optical properties of AlN determined by vacuum ultraviolet spectroscopy and spectroscopic ellipsometry data

1999 ◽  
Vol 14 (11) ◽  
pp. 4337-4344 ◽  
Author(s):  
D. J. Jones ◽  
R. H. French ◽  
H. Müllejans ◽  
S. Loughin ◽  
A. D. Dorneich ◽  
...  
Keyword(s):  
Optical Properties ◽  
Spectroscopic Ellipsometry ◽  
Optical Constants ◽  
Vacuum Ultraviolet ◽  
Accurate Knowledge ◽  
Vacuum Ultraviolet Spectroscopy ◽  
Data Extrapolation ◽  
Compact Disks ◽  
Ellipsometry Data ◽  
Interatomic Bonding

Precise and accurate knowledge of the optical properties of aluminum nitride (AlN) in the ultraviolet (UV) and visible (VIS) regions is important because of the increasing application of AlN in optical and electro-optical devices, including compact disks, phase shift lithography masks, and AlN/GaN multilayer devices. The interband optical properties in the vacuum ultraviolet (VUV) region of 6–44 eV have been investigated previously because they convey detailed information on the electronic structure and interatomic bonding of the material. In this work, we have combined spectroscopic ellipsometry with UV/VIS and VUV spectroscopy to directly determine the optical constants of AlN in this range, thereby reducing the uncertainty in the preparation of the low-energy data extrapolation essential for Kramers–Kronig analysis of VUV reflectance. We report the complex optical properties of AlN, over the range of 1.5–42 eV, showing improved agreement with theory when contrasted with earlier results.

scholarly journals Оптические и магнитные свойства трехслойных систем Dy-=SUB=-x-=/SUB=-Co-=SUB=-1-x-=/SUB=-/Bi/Py

2021 ◽  
Vol 47 (3) ◽  
pp. 7
Author(s):  
Н.Н. Косырев ◽  
В.Ю. Яковчук ◽  
Г.С. Патрин ◽  
В.А. Комаров ◽  
Е.Н. Волченко ◽  
...  
Keyword(s):  
Optical Properties ◽  
Temperature Dependence ◽  
Exchange Interaction ◽  
Spectroscopic Ellipsometry ◽  
Kerr Effect ◽  
Optical Constants ◽  
Compensation Temperature ◽  
Optical Kerr Effect ◽  
Magneto Optical Kerr Effect

The optical and magneto-optical properties of the DyxCo1-x/Bi/NiFe three-layer systems are presented. The magneto-optical Kerr effect to study the temperature dependence of the magnetization and spectroscopic ellipsometry to obtain optical constants were used. It is shown that the thickness of the bismuth interlayer affects the exchange interaction between the NiFe and DyCo layers, which is manifested in a change of the magnetisation compensation temperature.

Roughness Characterization by Optical Spectroscopy of CoSi2 Thin Films

1996 ◽  
Vol 440 ◽  
Author(s):  
S. Bocelli ◽  
G. Guizzetti ◽  
F. Marabelli ◽  
S. Hatziconstantinidou ◽  
C.S. Petersson
Keyword(s):  
Thin Films ◽  
Heat Treatment ◽  
Optical Properties ◽  
Surface Quality ◽  
Optical Spectroscopy ◽  
Spectroscopic Ellipsometry ◽  
Diffuse Reflectance ◽  
Growth Technique

AbstractSpecular and diffuse reflectance and spectroscopic ellipsometry were used to characterize a series of Cosi2 films obtained by heat treatment on a Co/Ti bilayer. The surface quality is strongly affected by etching procedures. The intrinsic optical properties of the CoSi2 film exhibit a small dependence on the growth technique.

Differential polarization imaging of sickled cells

1988 ◽  
Vol 46 ◽  
pp. 62-63
Author(s):  
Marcos F. Maestre
Keyword(s):  
Optical Properties ◽  
Theoretical Approach ◽  
Polarized Light ◽  
Polarization Microscopy ◽  
Spectroscopic Techniques ◽  
Polarization Imaging ◽  
Circularly Polarized Light ◽  
Circularly Polarized ◽  
Microscopic Scale ◽  
Chiral Structures

Recently we have developed a form of polarization microscopy that forms images using optical properties that have previously been limited to macroscopic samples. This has given us a new window into the distribution of structure on a microscopic scale. We have coined the name differential polarization microscopy to identify the images obtained that are due to certain polarization dependent effects. Differential polarization microscopy has its origins in various spectroscopic techniques that have been used to study longer range structures in solution as well as solids. The differential scattering of circularly polarized light has been shown to be dependent on the long range chiral order, both theoretically and experimentally. The same theoretical approach was used to show that images due to differential scattering of circularly polarized light will give images dependent on chiral structures. With large helices (greater than the wavelength of light) the pitch and radius of the helix could be measured directly from these images.

scholarly journals Mass-resolved electronic circular dichroism ion spectroscopy

Science ◽  
2020 ◽  
Vol 368 (6498) ◽  
pp. 1465-1468 ◽  
Author(s):  
Steven Daly ◽  
Frédéric Rosu ◽  
Valérie Gabelica
Keyword(s):  
Circular Dichroism ◽  
Three Dimensional ◽  
Polarized Light ◽  
Negative Ions ◽  
Data Interpretation ◽  
Electronic Circular Dichroism ◽  
Circularly Polarized Light ◽  
Chiral Compounds ◽  
Electron Photodetachment ◽  
Circular Dichroïsm

DNA and proteins are chiral: Their three-dimensional structures cannot be superimposed with their mirror images. Circular dichroism spectroscopy is widely used to characterize chiral compounds, but data interpretation is difficult in the case of mixtures. We recorded the electronic circular dichroism spectra of DNA helices separated in a mass spectrometer. We studied guanine-rich strands having various secondary structures, electrosprayed them as negative ions, irradiated them with an ultraviolet nanosecond optical parametric oscillator laser, and measured the difference in electron photodetachment efficiency between left and right circularly polarized light. The reconstructed circular dichroism ion spectra resembled those of their solution-phase counterparts, thereby allowing us to assign the DNA helical topology. The ability to measure circular dichroism directly on biomolecular ions expands the capabilities of mass spectrometry for structural analysis.

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