EFFECT OF THE C2H2 AND N2 FLOW RATE ON NANOCOMPOSITE nc-ZrCN/a-C:H(N) FILM SYNTHESIZED BY FILTERED CATHODIC VACUUM ARC TECHNIQUE

2008 ◽  
Vol 15 (06) ◽  
pp. 781-786 ◽  
Author(s):  
KUI ZHOU ◽  
XIANYING WU ◽  
XU ZHANG ◽  
LIZHAO QIN ◽  
BIN LIAO
Keyword(s):  
Internal Stress ◽  
Flow Rate ◽  
Photoelectron Spectroscopy ◽  
Vacuum Arc ◽  
X Ray Diffraction ◽  
Xps Spectra ◽  
Xrd Pattern ◽  
X Ray ◽  
Filtered Cathodic Vacuum Arc ◽  
N2 Flow Rate

Nanocomposite nc - ZrCN / a - C : H(N) films were prepared by filtered cathodic vacuum arc technique using the C 2 H 2 and N 2 gas as the precursor. The effect of the C 2 H 2 and N 2 flow rate on the microstructure, internal stress, phase composition, and mechanical properties of nanocomposite nc - ZrCN / a - C : H(N) films has been investigated by glancing incidence X-ray diffraction (GIXRD), surface profiler, and X-ray photoelectron spectroscopy(XPS). It was revealed that the C 2 H 2 and N 2 flow rate affected the structure, Zr content, and internal stress of the films significantly. Furthermore, XRD pattern indicated the presence of the ZrCN crystalline grains in the range of 3–10 nm, and the deconvolution results for XPS spectra showed that the film mainly was constituted by Zr – C , C = C (sp2) and C – C (sp3) bonds.

NANOCOMPOSITE nc-TiC/a-C:H FILMS FABRICATED BY DUAL PLASMA TECHNIQUE

2007 ◽  
Vol 14 (05) ◽  
pp. 891-897
Author(s):  
YAOHUI WANG ◽  
XU ZHANG ◽  
YUANZHI XU ◽  
XIANYING WU ◽  
HUIXING ZHANG ◽  
...  
Keyword(s):  
Flow Rate ◽  
Photoelectron Spectroscopy ◽  
Mechanical Tests ◽  
Vacuum Arc ◽  
X Ray Diffraction ◽  
Coil Current ◽  
X Ray ◽  
Mechanical And Tribological Properties ◽  
Nanocrystalline Graphite ◽  
Filtered Cathodic Vacuum Arc

Nanocomposite nc-TiC / a-C : H films have been deposited via filtered cathodic vacuum arc technique, employing Ti target and C 2 H 2 gas as material precursors. The composition and nanostructure of film, correlated to mechanical and tribological properties of film, are varied by changing C 2 H 2 flow rate and filter coil current. Glancing angle X-ray diffraction has been used to show that salient TiC (111) peak exists in film with grain size of order of 8–10 nm, as a function of filter coil current. Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) investigations demonstrate that the nc-TiC / a-C : H films mainly contain nanocrystalline graphite and sp2-bonded carbon, both as a function of C 2 H 2 flow rate. Mechanical tests confirm that the nc-TiC / a-C : H films possess superior hardness of 33.9 GPa and elastic modulus of 237.6 GPa.

The Influence of C2H2 Flow Rate on the Composition, Structural and Properties of the Ni/α-C:H Films Deposited by FCVA

2016 ◽  
Vol 852 ◽  
pp. 1132-1139
Author(s):  
Han Zhou ◽  
Qing Yan Hou ◽  
Tian Qing Xiao ◽  
Bin Liao ◽  
Xian Ying Wu ◽  
...  
Keyword(s):  
Flow Rate ◽  
Photoelectron Spectroscopy ◽  
Nanocomposite Films ◽  
Vacuum Arc ◽  
X Ray Diffraction ◽  
Raman Scattering Spectroscopy ◽  
X Ray ◽  
The Mean ◽  
Filtered Cathodic Vacuum Arc ◽  
Carbon Nanocomposite

Nickel/carbon nanocomposite films with different C2H2 flow rate were deposited by filtered cathodic vacuum arc (FCVA) device. The composition and nanostructure of the films were investigated by X-ray diffraction (XRD), Raman scattering spectroscopy, X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM). The grain size increase from 8.7 nm at the C2H2 flow rate of 10 sccm to the maximum of 11.5 nm at 30 sccm, after that it decrease. The mean phase separation is in the range of 0.2-2.6 nm. The hardness of 21.6 Gpa was obtained at 50sccm.

Influence of N2 Flows on Sputtered Ta(N) films: Electrical, Structural, Chemical and Optical Properties

2021 ◽  
Author(s):  
Yingying Hu ◽  
Md Rasadujjaman ◽  
Yanrong Wang ◽  
Jing Zhang ◽  
Jiang Yan ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Optical Properties ◽  
Flow Rate ◽  
Photoelectron Spectroscopy ◽  
Crystal Size ◽  
Silicon Substrates ◽  
X Ray Diffraction ◽  
Dc Magnetron Sputtering ◽  
X Ray ◽  
N2 Flow Rate

By reactive DC magnetron sputtering from a pure Ta target onto silicon substrates, Ta(N) films were prepared with a different N2 flow rate of 0, 12, 17, 25, 38, 58 sccm. The effects of N2 flow rate on the electrical properties, crystal structure, elemental composition and optical properties of Ta(N) were studied. These properties were characterized by the four-probe method, X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and spectroscopic ellipsometry (SE). Results show that the deposition rate decreases with an increase of the N2 flows. On the other hand, the resistivity increases, the crystal size decreases, and the crystal structure transitions from β-Ta to TaN(111), and finally becomes the N-rich phase Ta3N5 (130,040). Studying the optical properties, it is found that there are differences in the refractive index (n) and extinction coefficient (k) of Ta(N) with different thicknesses and different N2 flow rates, and dependent on the crystal size and crystal phase structure.

SURFACE METALIZATION ON THE PHOTO-EMISSION, PHOTO-ABSORPTION AND CORE-LEVEL SHIFT OF NANOSOLID SILICON

2009 ◽  
Vol 16 (02) ◽  
pp. 265-270 ◽  
Author(s):  
LIKUN PAN ◽  
HAIBO LI ◽  
ZHUO SUN ◽  
CHANGQING SUN
Keyword(s):  
Photoelectron Spectroscopy ◽  
Room Temperature ◽  
Vacuum Arc ◽  
Level Shift ◽  
Field Variation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Filtered Cathodic Vacuum Arc ◽  
Si Wafer ◽  
Ti Films

Cu , Al , and Ti films of ~ 10 nm thickness were deposited on porous silicon (PS) at room temperature using Filtered Cathodic Vacuum Arc system and annealed at 800°C for 10 min in vacuum. The PS layers were obtained by anodization of Si wafer. X-ray photoelectron spectroscopy, photoluminescence (PL), photo-absorption (PA), and X-ray diffraction studies revealed that before annealing just Cu -deposited sample exhibited PL blueshift, PA redshift, and Si -2p level shift due to the Cu diffusion at the surface of PS. While after annealing, Cu - and Ti -deposited samples exhibited obvious PA redshift and Si -2p level shift, which arise from the crystal field variation due to the formation of Cu / Ti silicides at the surface as well as the conduction electronic transportation.

scholarly journals Study on the Electrical, Structural, Chemical and Optical Properties of PVD Ta(N) Films Deposited with Different N2 Flow Rates

Coatings ◽  
2021 ◽  
Vol 11 (8) ◽  
pp. 937
Author(s):  
Yingying Hu ◽  
Md Rasadujjaman ◽  
Yanrong Wang ◽  
Jing Zhang ◽  
Jiang Yan ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Optical Properties ◽  
Photoelectron Spectroscopy ◽  
Crystal Size ◽  
Silicon Substrates ◽  
X Ray Diffraction ◽  
Dc Magnetron Sputtering ◽  
Flow Rates ◽  
X Ray ◽  
N2 Flow Rate

By reactive DC magnetron sputtering from a pure Ta target onto silicon substrates, Ta(N) films were prepared with different N2 flow rates of 0, 12, 17, 25, 38, and 58 sccm. The effects of N2 flow rate on the electrical properties, crystal structure, elemental composition, and optical properties of Ta(N) were studied. These properties were characterized by the four-probe method, X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and spectroscopic ellipsometry (SE). Results show that the deposition rate decreases with an increase of N2 flows. Furthermore, as resistivity increases, the crystal size decreases, the crystal structure transitions from β-Ta to TaN(111), and finally becomes the N-rich phase Ta3N5(130, 040). Studying the optical properties, it is found that there are differences in the refractive index (n) and extinction coefficient (k) of Ta(N) with different thicknesses and different N2 flow rates, depending on the crystal size and crystal phase structure.

scholarly journals Optical, XPS and XRD Studies of Semiconducting Copper Sulfide Layers on a Polyamide Film

2009 ◽  
Vol 2009 ◽  
pp. 1-8 ◽  
Author(s):  
Valentina Krylova ◽  
Mindaugas Andrulevičius
Keyword(s):  
Photoelectron Spectroscopy ◽  
Copper Sulfide ◽  
Diffusion Method ◽  
X Ray Diffraction ◽  
Xps Spectra ◽  
X Ray ◽  
Xrd Studies ◽  
Polyamide Film ◽  
Indirect Band Gap ◽  
Xrd Method

Copper sulfide layers were formed on polyamide PA 6 surface using the sorption-diffusion method. Polymer samples were immersed for 4 and 5 h in 0.15 mol⋅  solutions and acidified with HCl (0.1 mol⋅) at . After washing and drying, the samples were treated with Cu(I) salt solution. The samples were studied by UV/VIS, X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) methods. All methods confirmed that on the surface of the polyamide film a layer of copper sulfide was formed. The copper sulfide layers are indirect band-gap semiconductors. The values of are 1.25 and 1.3 eV for 4 h and 5 h sulfured PA 6 respectively. Copper XPS spectra analyses showed Cu(I) bonds only in deeper layers of the formed film, while in sulfur XPS S 2p spectra dominating sulfide bonds were found after cleaning the surface with ions. It has been established by the XRD method that, beside , the layer contains as well. For PA 6 initially sulfured 4 h, grain size forchalcocite, , was  nm and fordjurleite, , it was 54.17 nm. The sheet resistance of the obtained layer varies from 6300 to 102 .

Surface Characterization of Carbon-Bearing Magnetite (CBM) and Carbon-Bearing Ni(II)-Ferrite (CBNF)

1994 ◽  
Vol 344 ◽  
Author(s):  
T. Sano ◽  
K. Akanuma ◽  
M. Tsuji ◽  
Y. Tamaura
Keyword(s):  
Photoelectron Spectroscopy ◽  
Spinel Structure ◽  
Surface Characterization ◽  
Carbon Deposition ◽  
X Ray Diffraction ◽  
Xps Spectra ◽  
X Ray ◽  
Oxygen Ions ◽  
Diffraction Patterns

AbstractOxygen-deficient magnetite (ODM; Fe3O4-δ, δ>0) synthesized by reduction of magnetite with H2 at 300°C decomposed CO2 to carbon with an efficiency of nearly 100% at 300°C. In this reaction, two oxygen ions of the CO2 were incorporated into the spinel structure of ODM and carbon was deposited on the surface of ODM with zero valence to form visible particles. The particles of carbon separated from ODM were studied by Raman, energy-dispersive X-ray and wave-dispersive X-ray spectroscopies. The carbon which had been deposited on the ODM was found to be a mixture of graphite and amorphous carbon in at least two levels of crystallization. X-ray photoelectron spectroscopy and X-ray diffraction patterns of the carbon-bearing magnetite (CBM) showed no indication of carbide (Fe3C) or metallic iron (α-Fe) phase formation. In the C 1s XPS spectra of the CBM, no peaks were observed which could be assigned to CO2 or CO. X-ray diffractometry, chemical analysis and TG-MS measurement showed that the carbon-bearing Ni(II)-ferrite (CBNF) (Ni(II)/Fetotal = 0.15) synthesized by the carbon deposition reaction from CO2 with the H2-reduced Ni(II)-ferrite was represented by (Ni0.28Fe2.72O4.00)1-δ (Ni2+06.9Fe2+2.31O3.00)δCτ (δ= 0.27, τ= 0.17). The carbon of the CBNF gave the CIOlayer-like oxide containing some Ni2+ ions.

Study Behavior of XPS Spectra of Ni, Mn, Y and O in Y2NiMnO6 Ceramics

2015 ◽  
Vol 804 ◽  
pp. 97-103 ◽  
Author(s):  
Panakamon Deeyai ◽  
Thanapong Sareein ◽  
Bundit Putasaeng ◽  
Naphat Chathirat
Keyword(s):  
Photoelectron Spectroscopy ◽  
Ceramic Materials ◽  
Effect Of Temperature ◽  
Decomposition Technique ◽  
X Ray Diffraction ◽  
Xps Spectra ◽  
X Ray ◽  
Study Behavior ◽  
Sintering Time ◽  
Effects Of Temperature

Bulk Y2NiMnO6 samples were prepared by thermal decomposition technique at 800 °C for 6 hours. The effects of temperature on the structure of ceramics were investigated for different sintering temperatures in the range of 1000-1300 °C, while kept constant the sintering time of 12 hours. Structural characterization had been investigated via X-ray diffraction (XRD) on samples of different sintering temperatures. Results from the experiment had revealed that high temperature affected oxide in ceramic materials. Further analysis with X-ray photoelectron spectroscopy (XPS) technique had revealed an outstanding point of ceramics by investigating the Ni 2p, 2p3/2, Mn 2p1/2, 2p3/2, and Y 3d3/2, 3d5/2 at the surface of Y2NiMnO6 ceramics. The changes in relative intensity of XPS peaks and the shifts in their binding energy (eV) were observed in the results, while the effect of temperature on oxide in ceramics may be investigated with dielectric property in the future.

Superparamagnetic Behavior of Granular Co-C Films Consisting of Nanocrystalline Cobalt Encapsulated in Carbon

2000 ◽  
Vol 614 ◽  
Author(s):  
Hao Wang ◽  
S.P. Wong ◽  
W.Y. Cheung ◽  
N. Ke ◽  
M.F. Chiah ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Rutherford Backscattering Spectrometry ◽  
Magnetic Measurements ◽  
Magnetic Hysteresis ◽  
Blocking Temperature ◽  
Vacuum Arc ◽  
Zero Field ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy

ABSTRACTNanocomposite Co-C thin films of about 15 nm thick were prepared by pulsed filtered vacuum arc deposition. The films were characterized by x-ray photoelectron spectroscopy, non-Rutherford backscattering spectrometry, x-ray diffraction, magnetic force microscopy and magnetic measurements. The as-deposited films were amorphous. After annealing at 350°C for one hour in vacuum (< 10−3 Pa), the films were found to consist of nanocrystalline Co grains encapsulated in carbon. The superparamagnetism of the annealed Co36C64 film was demonstrated by the measurement of DC susceptibility and magnetic hysteresis using a SQUID magnetometer. The superparamagnetic relaxation blocking temperature was marked to be about 12K by the peak of the zero-field-cooled magnetization under a field of 100 Oe. The magnetic properties of these annealed granular Co-C films transform from superparamagnetism to ferromagnetism when the Co concentration increases.

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