SURFACE METALIZATION ON THE PHOTO-EMISSION, PHOTO-ABSORPTION AND CORE-LEVEL SHIFT OF NANOSOLID SILICON

2009 ◽  
Vol 16 (02) ◽  
pp. 265-270 ◽  
Author(s):  
LIKUN PAN ◽  
HAIBO LI ◽  
ZHUO SUN ◽  
CHANGQING SUN
Keyword(s):  
Photoelectron Spectroscopy ◽  
Room Temperature ◽  
Vacuum Arc ◽  
Level Shift ◽  
Field Variation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Filtered Cathodic Vacuum Arc ◽  
Si Wafer ◽  
Ti Films

Cu , Al , and Ti films of ~ 10 nm thickness were deposited on porous silicon (PS) at room temperature using Filtered Cathodic Vacuum Arc system and annealed at 800°C for 10 min in vacuum. The PS layers were obtained by anodization of Si wafer. X-ray photoelectron spectroscopy, photoluminescence (PL), photo-absorption (PA), and X-ray diffraction studies revealed that before annealing just Cu -deposited sample exhibited PL blueshift, PA redshift, and Si -2p level shift due to the Cu diffusion at the surface of PS. While after annealing, Cu - and Ti -deposited samples exhibited obvious PA redshift and Si -2p level shift, which arise from the crystal field variation due to the formation of Cu / Ti silicides at the surface as well as the conduction electronic transportation.

NANOCOMPOSITE nc-TiC/a-C:H FILMS FABRICATED BY DUAL PLASMA TECHNIQUE

2007 ◽  
Vol 14 (05) ◽  
pp. 891-897
Author(s):  
YAOHUI WANG ◽  
XU ZHANG ◽  
YUANZHI XU ◽  
XIANYING WU ◽  
HUIXING ZHANG ◽  
...  
Keyword(s):  
Flow Rate ◽  
Photoelectron Spectroscopy ◽  
Mechanical Tests ◽  
Vacuum Arc ◽  
X Ray Diffraction ◽  
Coil Current ◽  
X Ray ◽  
Mechanical And Tribological Properties ◽  
Nanocrystalline Graphite ◽  
Filtered Cathodic Vacuum Arc

Nanocomposite nc-TiC / a-C : H films have been deposited via filtered cathodic vacuum arc technique, employing Ti target and C 2 H 2 gas as material precursors. The composition and nanostructure of film, correlated to mechanical and tribological properties of film, are varied by changing C 2 H 2 flow rate and filter coil current. Glancing angle X-ray diffraction has been used to show that salient TiC (111) peak exists in film with grain size of order of 8–10 nm, as a function of filter coil current. Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) investigations demonstrate that the nc-TiC / a-C : H films mainly contain nanocrystalline graphite and sp2-bonded carbon, both as a function of C 2 H 2 flow rate. Mechanical tests confirm that the nc-TiC / a-C : H films possess superior hardness of 33.9 GPa and elastic modulus of 237.6 GPa.

EFFECT OF THE C2H2 AND N2 FLOW RATE ON NANOCOMPOSITE nc-ZrCN/a-C:H(N) FILM SYNTHESIZED BY FILTERED CATHODIC VACUUM ARC TECHNIQUE

2008 ◽  
Vol 15 (06) ◽  
pp. 781-786 ◽  
Author(s):  
KUI ZHOU ◽  
XIANYING WU ◽  
XU ZHANG ◽  
LIZHAO QIN ◽  
BIN LIAO
Keyword(s):  
Internal Stress ◽  
Flow Rate ◽  
Photoelectron Spectroscopy ◽  
Vacuum Arc ◽  
X Ray Diffraction ◽  
Xps Spectra ◽  
Xrd Pattern ◽  
X Ray ◽  
Filtered Cathodic Vacuum Arc ◽  
N2 Flow Rate

Nanocomposite nc - ZrCN / a - C : H(N) films were prepared by filtered cathodic vacuum arc technique using the C 2 H 2 and N 2 gas as the precursor. The effect of the C 2 H 2 and N 2 flow rate on the microstructure, internal stress, phase composition, and mechanical properties of nanocomposite nc - ZrCN / a - C : H(N) films has been investigated by glancing incidence X-ray diffraction (GIXRD), surface profiler, and X-ray photoelectron spectroscopy(XPS). It was revealed that the C 2 H 2 and N 2 flow rate affected the structure, Zr content, and internal stress of the films significantly. Furthermore, XRD pattern indicated the presence of the ZrCN crystalline grains in the range of 3–10 nm, and the deconvolution results for XPS spectra showed that the film mainly was constituted by Zr – C , C = C (sp2) and C – C (sp3) bonds.

The Influence of C2H2 Flow Rate on the Composition, Structural and Properties of the Ni/α-C:H Films Deposited by FCVA

2016 ◽  
Vol 852 ◽  
pp. 1132-1139
Author(s):  
Han Zhou ◽  
Qing Yan Hou ◽  
Tian Qing Xiao ◽  
Bin Liao ◽  
Xian Ying Wu ◽  
...  
Keyword(s):  
Flow Rate ◽  
Photoelectron Spectroscopy ◽  
Nanocomposite Films ◽  
Vacuum Arc ◽  
X Ray Diffraction ◽  
Raman Scattering Spectroscopy ◽  
X Ray ◽  
The Mean ◽  
Filtered Cathodic Vacuum Arc ◽  
Carbon Nanocomposite

Nickel/carbon nanocomposite films with different C2H2 flow rate were deposited by filtered cathodic vacuum arc (FCVA) device. The composition and nanostructure of the films were investigated by X-ray diffraction (XRD), Raman scattering spectroscopy, X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy (SEM). The grain size increase from 8.7 nm at the C2H2 flow rate of 10 sccm to the maximum of 11.5 nm at 30 sccm, after that it decrease. The mean phase separation is in the range of 0.2-2.6 nm. The hardness of 21.6 Gpa was obtained at 50sccm.

scholarly journals Synthesis of Magnetic Ferrocene-Containing Polymer with Photothermal Effects for Rapid Degradation of Methylene Blue

Polymers ◽  
2021 ◽  
Vol 13 (4) ◽  
pp. 558
Author(s):  
Wenhui Zhu ◽  
Caiyun Zhang ◽  
Yali Chen ◽  
Qiliang Deng
Keyword(s):  
Methylene Blue ◽  
Photoelectron Spectroscopy ◽  
Room Temperature ◽  
Degradation Rate ◽  
Model Compound ◽  
Vibrating Sample Magnetometer ◽  
Simulated Sunlight ◽  
X Ray Diffraction ◽  
X Ray ◽  
Ft Ir

Photothermal materials are attracting more and more attention. In this research, we synthesized a ferrocene-containing polymer with magnetism and photothermal properties. The resulting polymer was characterized by Fourier-transform infrared (FT-IR), vibrating sample magnetometer (VSM), scanning electron microscope (SEM), energy dispersive X-ray spectroscopy (EDS), X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), and thermogravimetric analysis (TGA). Its photo-thermocatalytic activity was investigated by choosing methylene blue (MB) as a model compound. The degradation percent of MB under an irradiated 808 nm laser reaches 99.5% within 15 min, and the degradation rate is 0.5517 min−1, which is 145 times more than that of room temperature degradation. Under irradiation with simulated sunlight, the degradation rate is 0.0092 min−1, which is approximately 2.5 times more than that of room temperature degradation. The present study may open up a feasible route to degrade organic pollutants.

ROOM TEMPERATURE PHOTOLUMINESCENCE OF POLYCRYSTALLINE SIC PREPARED FROM CARBON-SATURATED SI MELT

2002 ◽  
Vol 16 (06n07) ◽  
pp. 1047-1051
Author(s):  
JIANPING MA ◽  
ZHIMING CHEN ◽  
GANG LU ◽  
MINGBIN YU ◽  
LIANMAO HANG ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Photoelectron Spectroscopy ◽  
Room Temperature ◽  
Uv Light ◽  
X Ray Diffraction ◽  
X Ray ◽  
Room Temperature Photoluminescence ◽  
Composition And Structure ◽  
Light Excitation ◽  
Scanning Electron

Intense photoluminescence (PL) has been observed at room temperature from the polycrystalline SiC samples prepared from carbon-saturated Si melt at a temperature ranging from 1500 to 1650°C. Composition and structure of the samples have been confirmed by means of X-ray photoelectron spectroscopy, X-ray diffraction and scanning electron microscopy. PL measurements with 325 nm UV light excitation revealed that the room temperature PL spectrum of the samples consists of 3 luminescent bands, the peak energies of which are 2.38 eV, 2.77 eV and 3.06 eV, respectively. The 2.38 eV band is much stronger than the others. It is suggested that some extrinsic PL mechanisms associated with defect or interface states would be responsible to the intensive PL observed at room temperature.

Effects of Bi Doping on the In15Sb85 Phase Change Recording Thin Film

2008 ◽  
Vol 47-50 ◽  
pp. 813-816
Author(s):  
Sin Liang Ou ◽  
Po Cheng Kuo ◽  
Shu Chi Sheu ◽  
Chih Hsiang Hsiao ◽  
Don Yau Chiang ◽  
...  
Keyword(s):  
Room Temperature ◽  
X Ray Diffraction ◽  
Crystallization Activation Energy ◽  
Composite Target ◽  
X Ray ◽  
Transmission Electron ◽  
Thermal Analyzer ◽  
Crystallization Speed ◽  
Bi Doping ◽  
Si Wafer

The (In15Sb85)100-xBix films (x = 0~18.3) were deposited on nature oxidized Si wafer and glass substrate at room temperature by magnetron co-sputtering of Sb target and InBi composite target. The optical and thermal properties of the films were examined by reflectivity thermal analyzer. Microstructures of the films were analyzed by X-ray diffraction and transmission electron microscope. The crystallization activation energy of the (In15Sb85)100-xBix film (x = 0~18.3) was decreased with increasing Bi content, this indicated that the crystallization speed was improved by doping Bi. The structure of as-deposited (In15Sb85)100-xBix films was amorphous and it would transform to Sb, InSb, Bi, and BiIn2 coexisting phases after annealing at 250 °C for 30 min.

XRD and XPS studies of room temperature spontaneous interfacial reaction of CeO2 thin films on Si and Si3N4 substrates

RSC Advances ◽  
2014 ◽  
Vol 4 (108) ◽  
pp. 62935-62939 ◽  
Author(s):  
Parthasarathi Bera ◽  
Chinnasamy Anandan
Keyword(s):  
Thin Films ◽  
Interfacial Reaction ◽  
Photoelectron Spectroscopy ◽  
Room Temperature ◽  
Interfacial Reactions ◽  
X Ray Diffraction ◽  
X Ray

X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) investigations of interfacial reactions between Ce and Si have been carried out on as-deposited and 15 month aged CeO2/Si and CeO2/Si3N4 thin films.

scholarly journals Room-Temperature Formation of Hard BCx Films by Low Power Magnetron Sputtering

2021 ◽  
Vol 11 (21) ◽  
pp. 9896
Author(s):  
Veronica Sulyaeva ◽  
Maxim Khomyakov ◽  
Marina Kosinova
Keyword(s):  
Magnetron Sputtering ◽  
Photoelectron Spectroscopy ◽  
Room Temperature ◽  
X Ray Diffraction ◽  
Film Properties ◽  
X Ray ◽  
Sputtering Power ◽  
Chemical States ◽  
Rf Signal ◽  
Dual Target

Boron carbide is one of the most important non-metallic materials. Amorphous BCx films were synthesized at room temperature by single- and dual-target magnetron sputtering processes. A B4C target and C target were operated using an RF signal and a DC signal, respectively. The effect of using single- and dual-target deposition and process parameters on the chemical bonding and composition of the films as well as their functional properties were characterized by Fourier transform infrared spectroscopy, Raman spectroscopy, X-ray photoelectron spectroscopy, X-ray energy dispersive analysis, X-ray diffraction, ellipsometry, and spectrophotometry. It was found that the film properties depend on the sputtering power and the used targets. EDX data show that the composition of the samples varied from B2C to practically BC2 in the case of using an additional C target. According to the XPS data, it corresponds to the different chemical states of the boron atom. A nanoindentation study showed that the film with a composition close to B2C deposited with the highest B4C target power reached a hardness of 25 GPa and Young’s modulus of 230 GPa. The optical properties of the films also depend on the composition, so the band gap (Eg) of the BCx film varied in the range of 2.1–2.8 eV, while the Eg of the carbon-rich films decreased to 1.1 eV.

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