Ternary Resistive Switching Memory Behavior in Graphene Oxide Layer
Keyword(s):
We report the application of graphene oxide (GO) as the active layer of memory devices. The indium-tin-oxide/GO/Al devices present the ternary write-once-read-many times resistive switching memory, and retain the data information for [Formula: see text][Formula: see text]s. In the OFF states, the [Formula: see text]–[Formula: see text] characteristics in the applied voltage dominantly followed the space-charge-limited-current behaviors. The intermediate resistance state was attributed to the thermionic emission mechanism. In the ON state, the curve in the applied voltage range was related to an Ohmic mechanism.
2019 ◽
Vol 66
(6)
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pp. 2595-2599
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2019 ◽
Vol 214
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pp. 213-220
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2014 ◽
Vol 61
(4)
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pp. 1071-1076
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2010 ◽
Vol 31
(9)
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pp. 1005-1007
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2019 ◽
Vol 1
(3)
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pp. 318-324
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