Damage Formed by Plasma Boron Doping in Silicon

1994 ◽  
Vol 33 (Part 1, No. 10) ◽  
pp. 5608-5611
Author(s):  
Tohru Hara ◽  
Kiyotaka Shinada ◽  
Shigeaki Nakamura
Keyword(s):  
Author(s):  
Xiangyu Lu ◽  
Hailong Yuan ◽  
Zhifeng Huang ◽  
Yujuan Zhou ◽  
Fei Chen ◽  
...  

2020 ◽  
Vol 128 (4) ◽  
pp. 045309
Author(s):  
Zhenfei Li ◽  
Liping Zhang ◽  
Zhuopeng Wu ◽  
Wenzhu Liu ◽  
Renfang Chen ◽  
...  

1997 ◽  
Vol 93 (2-3) ◽  
pp. 247-253 ◽  
Author(s):  
R.J. Matyi ◽  
D.L. Chapek ◽  
D.P. Brunco ◽  
S.B. Felch ◽  
B.S. Lee

1997 ◽  
Vol 6 (2-4) ◽  
pp. 521-525 ◽  
Author(s):  
X.Z. Liao ◽  
R.J. Zhang ◽  
C.S. Lee ◽  
S.Tong Lee ◽  
Y.W. Lam

CrystEngComm ◽  
2017 ◽  
Vol 19 (42) ◽  
pp. 6305-6313 ◽  
Author(s):  
Abraham Adenle ◽  
De-Kun Ma ◽  
De-Peng Qu ◽  
Wei Chen ◽  
Shaoming Huang

BiVO4hollow microplates co-modified by boron doping and Co(OH)2nanoparticle loading achieved enhanced photocatalytic activity.


Carbon ◽  
2021 ◽  
Author(s):  
Saikat Sarkar ◽  
Rajarshi Roy ◽  
Bikram Kumar Das ◽  
Kalyan Kumar Chattopadhyay

2016 ◽  
Vol 380 (41) ◽  
pp. 3384-3388 ◽  
Author(s):  
Xiaohui Deng ◽  
Jing Zeng ◽  
Mingsu Si ◽  
Wei Lu

1991 ◽  
Vol 236 ◽  
Author(s):  
A. Slaoui ◽  
M. Elliq ◽  
H. Pattyn ◽  
E. Fogarassy ◽  
S. De Unamuno ◽  
...  

AbstractThis work describes phosphorus (P) and boron (B) doping of polysilicon filns deposited on quartz. Doping is achieved by means of a pulsed ArF excimer laser to melt a controlled thickness of amorphous or polycristalline silicon film coated with a spinon silicate glass (SOG) film containing the dopant (P or B). We have investigated the influence of doping parameters such as laser fluence, number of shots and dopant film thickness on the sheet resistance and the incorporation rate. From these results, we have shown that high doped, shallow junctions presenting sheet resistance lower than 5 kΩ/∠ can be obtained. Poly-Si TFT's with good electrical characteristics were successfully fabricated using this doping technique.


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