A logging framework for the on-line failure analysis of Android smart phones

2012 ◽  
Author(s):  
Marcello Cinque ◽  
Domenico Cotroneo ◽  
Alessandro Testa
Keyword(s):  
Failure Analysis ◽  
Smart Phones ◽  
On Line

On-Line Failure Analysis of a Biogas Plant by a Tracer Test

1990 ◽  
Vol 62 (2) ◽  
pp. 124-125
Author(s):  
Britt K. Nilsson ◽  
Hans T. Karlsson
Keyword(s):  
Failure Analysis ◽  
Tracer Test ◽  
Biogas Plant ◽  
On Line

scholarly journals Az információterjedés szerepe az innováció-elfogadásban. Az okostelefonok és az on-line kollektív intelligencia (Role of informationspread in the innovation acceptance: the smart phones and the online collective intelligence)

2012 ◽  
pp. 64-73
Author(s):  
Tamás Csordás ◽  
Nóra Nyirő
Keyword(s):  
Diffusion Of Innovations ◽  
Collective Intelligence ◽  
Smart Phone ◽  
Online Discussions ◽  
Smart Phones ◽  
Bulletin Boards ◽  
On Line ◽  
Asking Questions ◽  
Rich Data ◽  
Perceived Complexity

A tanulmány célja az innováció-terjedés marketingvonzatú irodalmának bemutatása, valamint betekintés az exploratív tartalomelemzés módszerével az informális, kollektív intelligenciát generáló on-line felületek, nevesül a blogok és fórumok kutathatóságába. Az okostelefonok innováció-elfogadásának példáján keresztül a szerzők megpróbálják felderíteni az információterjedés elméletének megvalósulását az elemzett felületeken. Bemutatnak három, a mintára jellemző információterjedési és felvett szerep mintát, melyek alapul szolgálhatnak a további célirányú kutatások számára. / === / Adaptive smart phones that give space for user-added functions create active online discussions. Committed users are ready to share information, advise others, while less expert users seek this information. In their paper the authors show that related user-generated content i.e. blogs and bulletin boards provide a rich data source for analysis, which gives them the opportunity to further elaborate on the diffusion of information in the case of smart phone usage among online Hungarian users. Online collective intelligence may well contribute to the diffusion of innovations through diffusing information. Following a thorough review on the literature on the diffusion of innovations, in their exploratory content analysis, they found two categories of users on the analyzed boards: a first group we dubbed "experts" (corresponding to innovators in Bass's typology) that made a special effort trying to solve particular problems thus contributing to collective intelligence, thus reducing (among others) the perceived complexity of these phones and adding to their trialability, both factors influencing users' innovation acceptance, and a second group, "simple users" (or imitators in Bass's typology), uninterested in product innovation, still asking questions and searching for solutions concerning extant technology. Manufacturers do not seem yet to regard these boards as a source of valuable data, even though these clearly serve as an important pool of information and a growing factor of decision for their potential customers.

scholarly journals Human Activity Recognition Using Smart phones

2020 ◽  
Vol 6 (12) ◽  
pp. 445-448
Author(s):  
Aman Gupta and Nidhi Senger
Keyword(s):  
Activity Recognition ◽  
Daily Living ◽  
Inertial Sensors ◽  
Research Field ◽  
Smart Phones ◽  
Body Motion ◽  
Support Vector ◽  
On Line ◽  
Multiclass Support Vector Machine ◽  
Infor Mation

Human-centered computing is an emerging research field that aims to understand human behavior and integrate users and their social context with computer systems. One of the most recent, challenging and appealing applications in this framework consists in sensing human body motion using smartphones to gather context infor-mation about people actions. In this context, we describe in this work an Activity Recognition database, built from the recordings of 30 subjects doing Activities of Daily Living (ADL) while carrying a waist-mounted smartphone with embedded inertial sensors, which is released to public domain on a well-known on-line repos-itory. Results, obtained on the dataset by exploiting a multiclass Support Vector Machine (SVM), are also acknowledged.

Failure Analysis With the Scanning Electron Microscope

1972 ◽  
Vol 30 ◽  
pp. 482-483
Author(s):  
John R. Devaney
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Integrated Circuits ◽  
Failure Analysis ◽  
High Reliability ◽  
Military Applications ◽  
Small Structure ◽  
Useful Life ◽  
Insight Into ◽  
Scanning Electron

Occasionally in history, an event may occur which has a profound influence on a technology. Such an event occurred when the scanning electron microscope became commercially available to industry in the mid 60's. Semiconductors were being increasingly used in high-reliability space and military applications both because of their small volume but, also, because of their inherent reliability. However, they did fail, both early in life and sometimes in middle or old age. Why they failed and how to prevent failure or prolong “useful life” was a worry which resulted in a blossoming of sophisticated failure analysis laboratories across the country. By 1966, the ability to build small structure integrated circuits was forging well ahead of techniques available to dissect and analyze these same failures. The arrival of the scanning electron microscope gave these analysts a new insight into failure mechanisms.

The on-line use of histogram data for high-speed correction and alignment of electron microscope images

1984 ◽  
Vol 42 ◽  
pp. 556-557
Author(s):  
William Krakow
Keyword(s):  
Power Spectrum ◽  
High Speed ◽  
Direct Memory Access ◽  
Digital Television ◽  
Contrast Transfer Function ◽  
The Past ◽  
High Resolution Tem ◽  
On Line ◽  
Correction Of Astigmatism ◽  
The Fourier Transform

In the past few years on-line digital television frame store devices coupled to computers have been employed to attempt to measure the microscope parameters of defocus and astigmatism. The ultimate goal of such tasks is to fully adjust the operating parameters of the microscope and obtain an optimum image for viewing in terms of its information content. The initial approach to this problem, for high resolution TEM imaging, was to obtain the power spectrum from the Fourier transform of an image, find the contrast transfer function oscillation maxima, and subsequently correct the image. This technique requires a fast computer, a direct memory access device and even an array processor to accomplish these tasks on limited size arrays in a few seconds per image. It is not clear that the power spectrum could be used for more than defocus correction since the correction of astigmatism is a formidable problem of pattern recognition.

Image registration with a computer driven S.T.E.M.

1978 ◽  
Vol 36 (1) ◽  
pp. 98-99
Author(s):  
A.M.H. Schepman ◽  
J.A.P. van der Voort ◽  
J.E. Mellema
Keyword(s):  
Spot Size ◽  
Scanning Transmission Electron Microscope ◽  
Small Computer ◽  
Structural Studies ◽  
Area Of Interest ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Specimen Area ◽  
On Line ◽  
Minimum Distances

A Scanning Transmission Electron Microscope (STEM) was coupled to a small computer. The system (see Fig. 1) has been built using a Philips EM400, equipped with a scanning attachment and a DEC PDP11/34 computer with 34K memory. The gun (Fig. 2) consists of a continuously renewed tip of radius 0.2 to 0.4 μm of a tungsten wire heated just below its melting point by a focussed laser beam (1). On-line operation procedures were developped aiming at the reduction of the amount of radiation of the specimen area of interest, while selecting the various imaging parameters and upon registration of the information content. Whereas the theoretical limiting spot size is 0.75 nm (2), routine resolution checks showed minimum distances in the order 1.2 to 1.5 nm between corresponding intensity maxima in successive scans. This value is sufficient for structural studies of regular biological material to test the performance of STEM over high resolution CTEM.

Design and calibration of an IVEM for general 3-dimensional imaging of non-diffracting materials

1992 ◽  
Vol 50 (2) ◽  
pp. 1040-1041
Author(s):  
Neil Rowlands ◽  
Jeff Price ◽  
Michael Kersker ◽  
Seichi Suzuki ◽  
Steve Young ◽  
...  
Keyword(s):  
3D Imaging ◽  
Tomographic Reconstruction ◽  
Three Dimensional ◽  
3 Dimensional ◽  
3D Microstructure ◽  
Image Translation ◽  
Digital Correlation ◽  
On Line ◽  
Mechanical Stage ◽  
Projection Angle

Three-dimensional (3D) microstructure visualization on the electron microscope requires that the sample be tilted to different positions to collect a series of projections. This tilting should be performed rapidly for on-line stereo viewing and precisely for off-line tomographic reconstruction. Usually a projection series is collected using mechanical stage tilt alone. The stereo pairs must be viewed off-line and the 60 to 120 tomographic projections must be aligned with fiduciary markers or digital correlation methods. The delay in viewing stereo pairs and the alignment problems in tomographic reconstruction could be eliminated or improved by tilting the beam if such tilt could be accomplished without image translation.A microscope capable of beam tilt with simultaneous image shift to eliminate tilt-induced translation has been investigated for 3D imaging of thick (1 μm) biologic specimens. By tilting the beam above and through the specimen and bringing it back below the specimen, a brightfield image with a projection angle corresponding to the beam tilt angle can be recorded (Fig. 1a).

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