Computerized X-Ray Data Periodic Table

1993 ◽  
Vol 37 ◽  
pp. 725-728
Author(s):  
Krassimir N. Stoev ◽  
Joseph F. Dlouhy

Nowadays personal computers [PCs) have sufficiently high speed of calculation and large memory and can be used for precise modeling and implementation of the fundamental parameter methods in the x-ray fluorescence (XRF) analysis. Because of its low price the PC is generally a standard component of energy-dispersive and wavelength-dispersive x-ray fluorescence analyzers, and allows not only automation and control of the whole spectrometer during the scientific experiments or routine analysis, but also complete on-line calculation of concentrations {using sophisticated calibration models), QA/QC monitoring, and archivation of the data. Together with the development of faulti-task operation systems for personal computers the efficiency of their use became higher. A few years ago the main requirement for the software was that it be optimized in order to perform many sophisticated calculations in as short time as possible, and less attention was paid to the interface “computer-user”. Now, with much more powerful new generation PCs, one of the main requirements on the software for XRF analysis is to be “user-friendly”, i.e. not to require special education and extended learning period before using it and to ensure high flexibility of application of the programs.

1995 ◽  
Vol 50 (9) ◽  
pp. 817-825 ◽  
Author(s):  
Younan Hua ◽  
C. T. Yap

Abstract This paper introduces a method of calculating theorectical alpha coefficients for the X-ray fluorescence analysis of major and minor components in iron-rich samples. We choose a group of hypothetical standard samples whose average concentrations are those of the actual samples. The theoretical X-ray fluorescence relative intensities of the given components are calculated using the fundamental parameter NRLXRF program. We derived formulas from the Lachance-Traill equation and used these to calculate the basic, hybrid and modified alpha coefficients which are used respectively for the analysis of elements in compact specimens, oxides in compact specimens and oxides in diluted specimens. In order to use the theoretical alpha coefficients on-line, we also discuss the calculation of the alpha coefficients used in the D.J model.


Author(s):  
Alireza Marzbanrad ◽  
Jalil Sharafi ◽  
Mohammad Eghtesad ◽  
Reza Kamali

This is report of design, construction and control of “Ariana-I”, an Underwater Remotely Operated Vehicle (ROV), built in Shiraz University Robotic Lab. This ROV is equipped with roll, pitch, heading, and depth sensors which provide sufficient feedback signals to give the system six degrees-of-freedom actuation. Although its center of gravity and center of buoyancy are positioned in such a way that Ariana-I ROV is self-stabilized, but the combinations of sensors and speed controlled drivers provide more stability of the system without the operator involvement. Video vision is provided for the system with Ethernet link to the operation unit. Control commands and sensor feedbacks are transferred on RS485 bus; video signal, water leakage alarm, and battery charging wires are provided on the same multi-core cable. While simple PI controllers would improve the pitch and roll stability of the system, various control schemes can be applied for heading to track different paths. The net weight of ROV out of water is about 130kg with frame dimensions of 130×100×65cm. Ariana-I ROV is designed such that it is possible to be equipped with different tools such as mechanical arms, thanks to microprocessor based control system provided with two directional high speed communication cables for on line vision and operation unit.


1971 ◽  
Vol 15 ◽  
pp. 70-89
Author(s):  
Melvin H. Mueller

The use of on-line computers for control and acquisition of data from x-ray and neutron diffractometers has continuously improved and expanded. Systems vary from a small 4K core computer to a time-sharing system with a medium or large computer. The choice of a single time-shared computer or an individual standalone system must be based on one's own particular environment. As large high-speed electronic computers became available, increasingly complex chemical and magnetic structures have been analysed and solved; this has created a demand for rapid, reliable, and versatile means of obtaining diffraction data. Since small computers have been developed at reduced cost and with increased storage capacity, they must be considered for use in diffraction experimentation. Therefore, in x-ray and neutron scattering, small computers are needed for data acquisition and large computers are needed for data analysis.


2021 ◽  
Vol 3 (1) ◽  
pp. 24
Author(s):  
Silvia Barella ◽  
Andrea Gruttadauria ◽  
Riccardo Gerosa ◽  
Giacomo Mainetti ◽  
Teodoro Mainetti

During the last fifty years, the metal forming of aluminum alloys advanced significantly, leading to a more competitive market on which production rate and overall quality are kept as high as possible. Within the aluminum industries, extrusion plays an important role, since many industrial products with structural or even aesthetic functions are realized with this technology. Especially in the automotive industry, the use of aluminum alloys is growing very fast, since it permits a considerable weight loss and thus a reduction of the emission. Nevertheless, the stringent quality standards required don’t allow the use of extruded aluminum alloys produced for common building applications. An important parameter that can be used as an index of the quality of the extruded product is the emergent temperature: if the temperature at the exit of the press is kept constant within a certain limit, products with homogeneous properties and high-quality surface are obtained and the so called “isothermal extrusion” is achieved. As extrusion industries are spread all over the world with different levels of automation and control, a universal but simple on-line tool for determining the best process condition to achieve isothermal extrusion is of particular interest. The aim of this work is to implement this model, which allows evaluation of the thermal gradient which has to be imposed on the billet. Several experiments have been carried out on an industrial extrusion press, and the outer temperature was recorded and compared with the simulated one to demonstrate the model consistency.


1985 ◽  
Vol 29 ◽  
pp. 485-492
Author(s):  
Claude R. Hudgens

This project was Initiated for the purpose of demonstrating the feasibility of on-line x-ray fluorescence (XRF) analysis for the nondestructive assay of fissile elements (SNM) in reactor fuel reprocessing (dlssolver) solutions, using wavelength dispersive x-ray fluorescence analysis because of its high immunity to the intense gamma emissions of the solutions. A prime objective of this project was the identification and dimensioning of.the parameters critical to XRF assays of high accuracy. The concepts presented herein, though directed primarily to assay of solutions with emphasis on low signal-to-noise conditions and low count rates, are applicable to all assays of solids, slurries, and gases.


1974 ◽  
Vol 18 ◽  
pp. 259-264
Author(s):  
W. A. N. Severance

AbstractThis paper describes the development of a radioisotope x-ray fluorescence gauge built to continuously measure and control the coating weight of wet silver emulsion. The method and apparatus for correcting the basic measurement for variations in water content and base film thickness are described. Design considerations, including source selection and arrangement to minimize radiation scattering and emulsion exposure while providing acceptable measurement precision or accuracy, are discussed.


1988 ◽  
Vol 32 ◽  
pp. 39-44
Author(s):  
D.J. Leland ◽  
D.E. Leyden ◽  
A.R. Harding

X-ray fluorescence analysis (XRF) is an analytical method which has been adapted with considerable success to on-line industrial process analysis with various degrees of sophistication. Process analysis XRF systems range from relatively simple units utilizing radioisotope sources with non-dispersive analyzers to complex wavelength dispersive systems in a central location receiving samples from a number of process streams. The advantages of on-line process analytical instrumentation for quality control, regulatory 2 compliance and safety considerations are well documented. ' Advances in the development of low maintenance thermoelectrically cooled Si(Li) detectors have made energy dispersive X-ray fluorescence analysis (EDXRF) even more amendable to on-line process analysis. EDXRF is an important method of on-line instrumentation because of its ability to simultaneously detect many elements.


2006 ◽  
Vol 304-305 ◽  
pp. 545-549
Author(s):  
Jia Shun Shi ◽  
Guang Qi Cai ◽  
Ming Hu ◽  
Q.Y. Liang

In this paper, a new on-line diamond grinding wheel dresser, which is comprised of high-speed rotatory dressing wheel, micro-feed mechanism and control system, is presented. The principle of micro-feed machine working at requiring dressing depth, the control method of the dressing wheel speed adjusting and dressing depth, and structure of the control system are also introduced. The experiments we have done show that the dresser reach the goal of diamond grinding wheel on-line dressing.


1981 ◽  
Vol 25 ◽  
pp. 81-84
Author(s):  
B. E. Artz ◽  
M. J. Rokosz

Methods of correction for matrix differences are required in X-ray Fluorescence (XRF) Analysis when the overall composition of the unknowns is substantially different from the available standards. Sample preparation techniques used to minimize matrix differences often require development time and can consume irreplaceable sample material. Alternatively, the increasing computer power available to the analyst and the refinement of computer programs using fundamental parameter calculations has made this approach more attractive.A system-consisting of a Siemens SRS-1 wavelength dispersive spectrometer (WDS), a KEVEX 0810-A/NS880 energy dispersive spectrometer (EDS), software for data collection and manipulation and a 40 element version of the NRLXRF fundamental-parameters analysis program has been put together to simplify XRF analysis of samples lacking standards of a similar composition. This configuration is shown schematically in Figure I.


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