scholarly journals Influence of Crucible Thermal Conductivity on Crystal Growth in an Industrial Directional Solidification Process for Silicon Ingots

2016 ◽  
Vol 2016 ◽  
pp. 1-9 ◽  
Author(s):  
Zaoyang Li ◽  
Lijun Liu ◽  
Yunfeng Zhang ◽  
Genshu Zhou

We carried out transient global simulations of heating, melting, growing, annealing, and cooling stages for an industrial directional solidification (DS) process for silicon ingots. The crucible thermal conductivity is varied in a reasonable range to investigate its influence on the global heat transfer and silicon crystal growth. It is found that the crucible plays an important role in heat transfer, and therefore its thermal conductivity can influence the crystal growth significantly in the entire DS process. Increasing the crucible thermal conductivity can shorten the time for melting of silicon feedstock and growing of silicon crystal significantly, and therefore large thermal conductivity is helpful in saving both production time and power energy. However, the high temperature gradient in the silicon ingots and the locally concave melt-crystal interface shape for large crucible thermal conductivity indicate that high thermal stress and dislocation propagation are likely to occur during both growing and annealing stages. Based on the numerical simulations, some discussions on designing and choosing the crucible thermal conductivity are presented.

1995 ◽  
Vol 398 ◽  
Author(s):  
A.V. Bune ◽  
D.C. Gillies ◽  
S.L. Lehoczky

ABSTRACTA numerical model of heat transfer by combined conduction, radiation and convection was developed using the FIDAP finite element code for NASA's Advanced Automated Directional Solidification Furnace (AADSF). The prediction of the temperature gradient in an ampoule with HgCdTe is a necessity for the evaluation of whether or not the temperature set points for furnace heaters and the details of cartridge design ensure optimal crystal growth conditions for this material and size of crystal. A prediction of crystal/melt interface shape and the flow patterns in HgCdTe are available using a separate complementary model.


Crystals ◽  
2020 ◽  
Vol 11 (1) ◽  
pp. 27
Author(s):  
Satoshi Nakano ◽  
Xin Liu ◽  
Xue-Feng Han ◽  
Koichi Kakimoto

For bulk doping, boron and phosphorus are usually used as p-type and n-type dopants, respectively. The distribution of these dopant concentrations in a silicon crystal along the vertical direction is governed by the segregation phenomena. As the segregation coefficient of phosphorus is small, phosphorus concentration distribution in a silicon crystal becomes inhomogeneous; inhomogeneous phosphorus concentration distribution affects the distribution of resistivity in the crystal. Therefore, it is important to control the phosphorus concentration distribution in a silicon crystal and make it uniform. In this study, by numerical analysis, we investigated the effect of the evaporation flux at the melt surface on phosphorus concentration distribution during the directional solidification process. To obtain a homogeneous phosphorus concentration distribution in the silicon crystal, we had to control the phosphorous evaporation flux at the melt surface and maintain approximately the same phosphorus concentration in the melt during the entire solidification process even though the growth rate was always changing.


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