Design of High-Precision Signal Acquisition Module in Atomic Force Microscope

2015 ◽  
Vol 10 (2) ◽  
pp. 104-108
Author(s):  
Ke Xu ◽  
Yuanwei Qi ◽  
Zhijun Gao ◽  
Xiaoting Yu ◽  
Xiyang Liu ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
High Precision ◽  
Signal Acquisition ◽  
Atomic Force

CASIMIR FORCE EXPERIMENTS IN AIR: TWO BIRDS WITH ONE STONE

2010 ◽  
Vol 25 (11) ◽  
pp. 2231-2239 ◽  
Author(s):  
S. DE MAN ◽  
K. HEECK ◽  
K. SMITH ◽  
R. J. WIJNGAARDEN ◽  
D. IANNUZZI
Keyword(s):  
Atomic Force Microscope ◽  
High Precision ◽  
Electrostatic Potential ◽  
Casimir Force ◽  
Hydrodynamic Force ◽  
Force Sensor ◽  
Force Measurements ◽  
Atomic Force ◽  
Potential Measure ◽  
Interacting Surfaces

We present a short overview of the recent efforts of our group in the design of high precision Casimir force setups. We first describe our Atomic Force Microscope based technique that allows one to simultaneously and continuously calibrate the instrument, compensate for a residual electrostatic potential, measure the Casimir force, and, in the presence of a fluid in the gap between the interacting surfaces, measure the hydrodynamic force. Then we briefly discuss a new force sensor that adapts well to Casimir force measurements in critical environments.

Height Measurement Using High-Precision Atomic Force Microscope Scanner Combined with Laser Interferometers

2006 ◽  
Vol 45 (11) ◽  
pp. 8832-8838 ◽  
Author(s):  
Ken Murayama ◽  
Satoshi Gonda ◽  
K. Kinoshita ◽  
Hajime Koyanagi ◽  
Tsuneo Terasawa ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
High Precision ◽  
Height Measurement ◽  
Atomic Force ◽  
Laser Interferometers

Large scale high precision nano-oxidation using an atomic force microscope

2004 ◽  
Vol 566-568 ◽  
pp. 343-348 ◽  
Author(s):  
H. Kuramochi ◽  
K. Ando ◽  
T. Tokizaki ◽  
M. Yasutake ◽  
F. Pérez-Murano ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
High Precision ◽  
Large Scale ◽  
Atomic Force

scholarly journals High-Precision Cutting Edge Radius Measurement of Single Point Diamond Tools Using an Atomic Force Microscope and a Reverse Cutting Edge Artifact

2020 ◽  
Vol 10 (14) ◽  
pp. 4799
Author(s):  
Kai Zhang ◽  
Yindi Cai ◽  
Yuki Shimizu ◽  
Hiraku Matsukuma ◽  
Wei Gao
Keyword(s):  
Atomic Force Microscope ◽  
High Precision ◽  
Measurement Method ◽  
Diamond Tool ◽  
Single Point ◽  
Cutting Edge ◽  
Cutting Edge Radius ◽  
Diamond Tools ◽  
Atomic Force ◽  
Edge Radius

This paper presents a measurement method for high-precision cutting edge radius of single point diamond tools using an atomic force microscope (AFM) and a reverse cutting edge artifact based on the edge reversal method. Reverse cutting edge artifact is fabricated by indenting a diamond tool into a soft metal workpiece with the bisector of the included angle between the tool’s rake face and clearance face perpendicular to the workpiece surface on a newly designed nanoindentation system. An AFM is applied to measure the topographies of the actual and the reverse diamond tool cutting edges. With the proposed edge reversal method, a cutting edge radius can be accurately evaluated based on two AFM topographies, from which the convolution effect of the AFM tip can be reduced. The accuracy of the measurement of cutting edge radius is significantly influenced by the geometric accuracy of reverse cutting edge artifact in the proposed measurement method. In the nanoindentation system, the system operation is optimized for achieving high-precision control of the indentation depth of reverse cutting edFigurege artifact. The influence of elastic recovery and the AFM cantilever tip radius on the accuracy of cutting edge radius measurement are investigated. Diamond tools with different nose radii are also measured. The reliability and capability of the proposed measurement method for cutting edge radius and the designed nanoindentation system are demonstrated through a series of experiments.

Characterization of photosystem II with the atomic-force microscope

1992 ◽  
Vol 50 (2) ◽  
pp. 1146-1147
Author(s):  
Kathleen M. Marr ◽  
Mary K. Lyon
Keyword(s):  
Photosystem Ii ◽  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Biologically Active ◽  
Atomic Force ◽  
Freeze Etching ◽  
Image Averaging ◽  
Oxygen Evolving ◽  
Averaging Techniques

Photosystem II (PSII) is different from all other reaction centers in that it splits water to evolve oxygen and hydrogen ions. This unique ability to evolve oxygen is partly due to three oxygen evolving polypeptides (OEPs) associated with the PSII complex. Freeze etching on grana derived insideout membranes revealed that the OEPs contribute to the observed tetrameric nature of the PSIl particle; when the OEPs are removed, a distinct dimer emerges. Thus, the surface of the PSII complex changes dramatically upon removal of these polypeptides. The atomic force microscope (AFM) is ideal for examining surface topography. The instrument provides a topographical view of individual PSII complexes, giving relatively high resolution three-dimensional information without image averaging techniques. In addition, the use of a fluid cell allows a biologically active sample to be maintained under fully hydrated and physiologically buffered conditions. The OEPs associated with PSII may be sequentially removed, thereby changing the surface of the complex by one polypeptide at a time.

Imaging polymers, proteins and dna in aqueous solutions with the atomic force microscope

1989 ◽  
Vol 47 ◽  
pp. 32-33
Author(s):  
S.A.C. Gould ◽  
B. Drake ◽  
C.B. Prater ◽  
A.L. Weisenhorn ◽  
S.M. Lindsay ◽  
...  
Keyword(s):  
Amino Acids ◽  
Dna Sequencing ◽  
Aqueous Solutions ◽  
Atomic Force Microscope ◽  
Piezoelectric Crystal ◽  
Atomic Force ◽  
Structure Of Molecules ◽  
Optical Lever

The atomic force microscope (AFM) is an instrument that can be used to image many samples of interest in biology and medicine. Images of polymerized amino acids, polyalanine and polyphenylalanine demonstrate the potential of the AFM for revealing the structure of molecules. Images of the protein fibrinogen which agree with TEM images demonstrate that the AFM can provide topographical data on larger molecules. Finally, images of DNA suggest the AFM may soon provide an easier and faster technique for DNA sequencing.The AFM consists of a microfabricated SiO2 triangular shaped cantilever with a diamond tip affixed at the elbow to act as a probe. The sample is mounted on a electronically driven piezoelectric crystal. It is then placed in contact with the tip and scanned. The topography of the surface causes minute deflections in the 100 μm long cantilever which are detected using an optical lever.

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