Large scale high precision nano-oxidation using an atomic force microscope

2004 ◽  
Vol 566-568 ◽  
pp. 343-348 ◽  
Author(s):  
H. Kuramochi ◽  
K. Ando ◽  
T. Tokizaki ◽  
M. Yasutake ◽  
F. Pérez-Murano ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
High Precision ◽  
Large Scale ◽  
Atomic Force

CASIMIR FORCE EXPERIMENTS IN AIR: TWO BIRDS WITH ONE STONE

2010 ◽  
Vol 25 (11) ◽  
pp. 2231-2239 ◽  
Author(s):  
S. DE MAN ◽  
K. HEECK ◽  
K. SMITH ◽  
R. J. WIJNGAARDEN ◽  
D. IANNUZZI
Keyword(s):  
Atomic Force Microscope ◽  
High Precision ◽  
Electrostatic Potential ◽  
Casimir Force ◽  
Hydrodynamic Force ◽  
Force Sensor ◽  
Force Measurements ◽  
Atomic Force ◽  
Potential Measure ◽  
Interacting Surfaces

We present a short overview of the recent efforts of our group in the design of high precision Casimir force setups. We first describe our Atomic Force Microscope based technique that allows one to simultaneously and continuously calibrate the instrument, compensate for a residual electrostatic potential, measure the Casimir force, and, in the presence of a fluid in the gap between the interacting surfaces, measure the hydrodynamic force. Then we briefly discuss a new force sensor that adapts well to Casimir force measurements in critical environments.

Height Measurement Using High-Precision Atomic Force Microscope Scanner Combined with Laser Interferometers

2006 ◽  
Vol 45 (11) ◽  
pp. 8832-8838 ◽  
Author(s):  
Ken Murayama ◽  
Satoshi Gonda ◽  
K. Kinoshita ◽  
Hajime Koyanagi ◽  
Tsuneo Terasawa ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
High Precision ◽  
Height Measurement ◽  
Atomic Force ◽  
Laser Interferometers

Fabrication of large scale nanostructures based on a modified atomic force microscope nanomechanical machining system

2011 ◽  
Vol 82 (12) ◽  
pp. 125102 ◽  
Author(s):  
Z. J. Hu ◽  
Y. D. Yan ◽  
X. S. Zhao ◽  
D. W. Gao ◽  
Y. Y. Wei ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Large Scale ◽  
Atomic Force ◽  
Machining System

Design of High-Precision Signal Acquisition Module in Atomic Force Microscope

2015 ◽  
Vol 10 (2) ◽  
pp. 104-108
Author(s):  
Ke Xu ◽  
Yuanwei Qi ◽  
Zhijun Gao ◽  
Xiaoting Yu ◽  
Xiyang Liu ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
High Precision ◽  
Signal Acquisition ◽  
Atomic Force

Experiments on hydrolysis of Bi(2201) thin film via atomic force microscope

2018 ◽  
Vol 32 (15) ◽  
pp. 1850191
Author(s):  
Jiapeng Li ◽  
Yan Zhang ◽  
Haochen Wang ◽  
Yusheng Li
Keyword(s):  
Thin Film ◽  
Relative Humidity ◽  
Atomic Force Microscope ◽  
Spectrum Analysis ◽  
Large Scale ◽  
Optical Image ◽  
Atomic Force ◽  
The Stability ◽  
Hydrolysis Of

In this paper, large-scale Bi(2201) nanofilm was mechanically exfoliated. The thin film Bi(2201) was characterized by means of optical image and XRD spectrum analysis. AFM is used to study the stability of Bi(2201) thin film. We found that the Bi(2201) nanofilm was less sensitive to CO2 while it extremely got affected by humidity. With the rise in the humidity, the hydrolytic speed of Bi(2201) film was greatly increased. When the relative humidity of the air is lower than 20%, the Bi(2201) thin film can be stable in two days. However, when the relative humidity is about 90% RH, Bi(2201) film will be hydrolyzed in few minutes.

Sign in / Sign up

Export Citation Format

Share Document