Structural and Optical Properties of Ge Nanocrystals Embedded in Al2O3
2008 ◽
Vol 8
(2)
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pp. 572-576
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Keyword(s):
X Ray
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Ge nanocrystals (NCs) embedded in aluminum oxide were grown by RF-magnetron sputtering. Raman, high resolution transmission electron microscopy (HRTEM), selected area diffraction (SAD), and X-ray diffraction (XRD) techniques confirmed good cristallinity of the NCs from samples annealed at 800 °C. The average NC size was estimated to be around 7 nm. Photoluminescence (PL) measurements show an emission related to the NCs. The temperature dependence of the PL confirms the confinement phenomenon in the Ge NCs.
2019 ◽
Vol 17
(2)
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2006 ◽
Vol 6
(1)
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pp. 162-167
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1982 ◽
Vol 40
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pp. 722-723
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