High-Speed Measurement of Large Area Micro-Structured Surfaces(Nano/micro measurement and intelligent instrument)

2005 ◽  
Vol 2005.2 (0) ◽  
pp. 381-384
Author(s):  
Jun AOKI ◽  
Wei GAO ◽  
Satoshi KIYONO
Keyword(s):  
High Speed ◽  
Large Area ◽  
Structured Surfaces ◽  
Speed Measurement ◽  
Intelligent Instrument

scholarly journals Current-limiting amplifier for high speed measurement of resistive switching data

2021 ◽  
Vol 92 (5) ◽  
pp. 054701
Author(s):  
T. Hennen ◽  
E. Wichmann ◽  
A. Elias ◽  
J. Lille ◽  
O. Mosendz ◽  
...  
Keyword(s):  
Resistive Switching ◽  
High Speed ◽  
Limiting Amplifier ◽  
Speed Measurement ◽  
Current Limiting

scholarly journals High-speed high-efficiency large-area resonant cavity enhanced p-i-n photodiodes for multimode fiber communications

2001 ◽  
Vol 13 (12) ◽  
pp. 1349-1351 ◽  
Author(s):  
M. Gokkavas ◽  
O. Dosunmu ◽  
M.S. Unlu ◽  
G. Ulu ◽  
R.P. Mirin ◽  
...  
Keyword(s):  
High Speed ◽  
High Efficiency ◽  
Resonant Cavity ◽  
Multimode Fiber ◽  
Large Area ◽  
Fiber Communications

Development of high speed measurement system for cell-scaffold interaction

2015 ◽  
Author(s):  
Yu Hirano ◽  
Masaru Kojima ◽  
Mitsuhiro Horade ◽  
Kazuto Kamiyama ◽  
Yasushi Mae ◽  
...  
Keyword(s):  
Measurement System ◽  
High Speed ◽  
Speed Measurement ◽  
Cell Scaffold

Ripple Technique; a Novel Non-Contact Wafer Emissivity and Temperature Method for RTP

1991 ◽  
Vol 224 ◽  
Author(s):  
C. Schietinger ◽  
B. Adams ◽  
C. Yarling
Keyword(s):  
Optical Fiber ◽  
Measurement Technique ◽  
Thermal Processing ◽  
High Speed ◽  
Rapid Thermal Processing ◽  
Wafer Surface ◽  
Speed Measurement ◽  
Temperature Method ◽  
Emissivity Measurement ◽  
Emissivity Measurements

AbstractA novel wafer temperature and emissivity measurement technique for rapid thermal processing (RTP) is presented. The ‘Ripple Technique’ takes advantage of heating lamp AC ripple as the signature of the reflected component of the radiation from the wafer surface. This application of Optical Fiber Thermometry (OFT) allows high speed measurement of wafer surface temperatures and emissivities. This ‘Ripple Technique’ is discussed in theoretical and practical terms with wafer data presented. Results of both temperature and emissivity measurements are presented for RTP conditions with bare silicon wafers and filmed wafers.

An Investigation onto Polydimethylsiloxane (PDMS) Printing Plate of Multiple Functional Solid Line by Flexographic

2013 ◽  
Vol 844 ◽  
pp. 158-161 ◽  
Author(s):  
M.I. Maksud ◽  
Mohd Sallehuddin Yusof ◽  
M. Mahadi Abdul Jamil
Keyword(s):  
Laser Ablation ◽  
Line Width ◽  
High Speed ◽  
Printed Electronics ◽  
Low Cost ◽  
Flexible Substrates ◽  
Large Area ◽  
Printing Plate ◽  
Roll To Roll ◽  
Printing Processes

Recently low cost production is vital to produce printed electronics by roll to roll manufacturing printing process like a flexographic. Flexographic has a high speed technique which commonly used for printing onto large area flexible substrates. However, the minimum feature sizes achieved with roll to roll printing processes, such as flexographic is in the range of fifty microns. The main contribution of this limitation is photopolymer flexographic plate unable to be produced finer micron range due to film that made by Laser Ablation Mask (LAMs) technology not sufficiently robust and consequently at micron ranges line will not be formed on the printing plate. Hence, polydimethylsiloxane (PDMS) is used instead of photopolymer. Printing trial had been conducted and multiple solid lines successfully printed for below fifty microns line width with no interference between two adjacent lines of the printed images.

THE DESIGN AND FABRICATION OF HIGH-SPEED HBT CIRCUITS FOR FIBER-OPTIC COMMUNICATION SYSTEMS

1994 ◽  
Vol 05 (03) ◽  
pp. 253-274 ◽  
Author(s):  
MASAO OBARA ◽  
JUNKO AKAGI
Keyword(s):  
Measurement System ◽  
Communication Systems ◽  
High Speed ◽  
Fiber Optic ◽  
Heterojunction Bipolar Transistor ◽  
Fiber Amplifiers ◽  
Speed Measurement ◽  
Fiber Optic Communication ◽  
Optical Fiber Amplifiers ◽  
Optic Communication

AlGaAs/GaAs heterojunction bipolar transistor (HBT) high speed ICs have been paving the way for the most sophisticated fiber-optic communication systems since the late 1980s. Recently 20 Gbps HBT ICs have been developed to accommodate the emergence of optical fiber amplifiers. HBT technology is now proceeding towards the development of 40 Gbps systems where the lack of high speed measurement system remains an issue.

scholarly journals Diffuse Coplanar Surface Barrier Discharge in Artificial Air: Statistical Behaviour of Microdischarges

2014 ◽  
Vol 13 (1) ◽  
Author(s):  
Jan Čech ◽  
Jana Hanusová ◽  
Pavel Sťahel ◽  
Mirko Černák
Keyword(s):  
High Speed ◽  
Barrier Discharge ◽  
Atmospheric Pressure Plasma ◽  
Input Voltage ◽  
Half Period ◽  
Surface Barrier ◽  
Electrical Measurements ◽  
Large Area ◽  
Electrode Gap ◽  
Surface Barrier Discharge

AbstractDiffuse Coplanar Surface Barrier Discharge (DCSBD) is a novel type of atmospheric-pressure plasma source developed for high-speed large-area surface plasma treatments. The statistical behavior of microdischarges of DCSBD generated in artificial air atmosphere was studied using time-correlated optical and electrical measurements. Changes in behavior of microdischarges are shown for various electrode gap widths and input voltage amplitudes. They are discussed in the light of correlation of the number of microdischarges and the number of unique microdischarges’ paths per discharge event.The ‘memory effect’ was observed in the behavior of microdischarges and it manifests itself in a significant number of microdischarges reusing the path of microdischarges from previous half-period. Surprisingly this phenomenon was observed even for microdischarges of the same half-period of the discharge, where mechanisms other than charge deposition have to be involved. The phenomenon of discharge paths reuse is most pronounced for wide electrode

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