Nondestructive Characterization of Silicon Carbide by Impedance Spectroscopy Method.
1995 ◽
Vol 61
(585)
◽
pp. 940-945
◽
2006 ◽
Vol 527-529
◽
pp. 733-736
2014 ◽
Vol 118
(10)
◽
pp. 2649-2661
◽
2013 ◽
Vol 117
(5)
◽
pp. 1458-1466
◽
2016 ◽
Vol 65
◽
pp. 118-127
◽
1983 ◽
Vol 41
◽
pp. 72-73
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