The instrument described here is the Materials Analysis Company Model 400S combined scanning electron microscope/electron micro-probe analyzer. It was designed specifically to incorporate the most advanced features of a high performance electron microprobe analyzer with those of a medium resolution (1000A°) scanning electron microscope. The high effective x-ray take-off angle of the instrument (38.5°) offers low x-ray absorption, and thus allows the analysis of fairly rough specimens. The large depth of focus of the scanned electron images further enhances the capability of examining rough specimens.The electron-optical column comprises a triode electron gun, double condenser lens and objective lens. The electron gun uses a conventional hairpin filament, autobiased Wehnelt cylinder and anode. An externally controlled filament/Wehnelt cylinder height adjustment is provided for optimizing gun performance at all operating potentials. The double condenser lens is unitized and has two lens regions and a common energizing coil.