A Combined Scanning Electron Microscope/Electron Microprobe Analyzer

1968 ◽  
Vol 26 ◽  
pp. 368-369
Author(s):  
V.G. Macres ◽  
O. Preston ◽  
N.C. Yew ◽  
R. Buchanan
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Electron Microprobe ◽  
High Performance ◽  
Electron Gun ◽  
Objective Lens ◽  
Condenser Lens ◽  
X Ray ◽  
Low X ◽  
Scanning Electron

The instrument described here is the Materials Analysis Company Model 400S combined scanning electron microscope/electron micro-probe analyzer. It was designed specifically to incorporate the most advanced features of a high performance electron microprobe analyzer with those of a medium resolution (1000A°) scanning electron microscope. The high effective x-ray take-off angle of the instrument (38.5°) offers low x-ray absorption, and thus allows the analysis of fairly rough specimens. The large depth of focus of the scanned electron images further enhances the capability of examining rough specimens.The electron-optical column comprises a triode electron gun, double condenser lens and objective lens. The electron gun uses a conventional hairpin filament, autobiased Wehnelt cylinder and anode. An externally controlled filament/Wehnelt cylinder height adjustment is provided for optimizing gun performance at all operating potentials. The double condenser lens is unitized and has two lens regions and a common energizing coil.

The Materials Analysis Company Model 700 Scanning Electron Microscope

1968 ◽  
Vol 26 ◽  
pp. 370-371
Author(s):  
V.G. Macres ◽  
O. Preston ◽  
N.C. Yew ◽  
R. Buchanan
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Operating Conditions ◽  
Electron Gun ◽  
Objective Lens ◽  
Grid Spacing ◽  
Materials Analysis ◽  
Condenser Lens ◽  
Modular Concept ◽  
Scanning Electron

The Model 700 scanning electron microscope is a high resolution instrument which incorporates the same basic modular concept that has proven so satisfactory in the Materials Analysis Company Model 400 x-ray microprobe and its latest development, the Model 400S. The instrument described here is the basic building block to which accessories such as additional display tubes, special specimen holders, etc., can be easily added.The electron-optical column consists of a triode electron gun, double electromagnetic condenser lens, and objective lens. A .004″ tungsten hairpin filament is used as the electron source, and the filament to grid spacing is externally adjustable during operation to optimize gun performance for all operating conditions. The double condenser system is unitized and uses a single energizing coil. An adjustable multiple aperture holder is provided between the double condenser lens system and the objective lens, which serves to define the convergence angle of the probe in the specimen plane.

PHAX-SCAN: Functional integration of a Scanning Electron Microscope and an energy-dispersive x-ray analyser

1989 ◽  
Vol 47 ◽  
pp. 56-57
Author(s):  
Marc H. Peeters ◽  
Max T. Otten
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
Functional Integration ◽  
Energy Dispersive ◽  
X Rays ◽  
X Ray ◽  
High Speed Analysis ◽  
Scanning Electron

Over the past decades, the combination of energy-dispersive analysis of X-rays and scanning electron microscopy has proved to be a powerful tool for fast and reliable elemental characterization of a large variety of specimens. The technique has evolved rapidly from a purely qualitative characterization method to a reliable quantitative way of analysis. In the last 5 years, an increasing need for automation is observed, whereby energy-dispersive analysers control the beam and stage movement of the scanning electron microscope in order to collect digital X-ray images and perform unattended point analysis over multiple locations.The Philips High-speed Analysis of X-rays system (PHAX-Scan) makes use of the high performance dual-processor structure of the EDAX PV9900 analyser and the databus structure of the Philips series 500 scanning electron microscope to provide a highly automated, user-friendly and extremely fast microanalysis system. The software that runs on the hardware described above was specifically designed to provide the ultimate attainable speed on the system.

Metallography and Corrosion Product Studies on Archaeological Bronze Fragments from the Qu Cun Site

1996 ◽  
Vol 462 ◽  
Author(s):  
W. T. Chase ◽  
Quanyu Wang
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Corrosion Product ◽  
Electron Microprobe ◽  
X Ray Diffraction ◽  
X Ray ◽  
Heat Treated ◽  
Western Zhou ◽  
Future Work ◽  
Scanning Electron

ABSTRACTThe authors studied a suite of fragments of corroded bronzes from the Tienma-Qu Cun site, a Western Zhou city and cemetery complex dating from ca. 1000 to ca. 650 B.C‥ Conventional metallographic techniques were used along with scanning electron microscope, electron microprobe and x-ray diffraction. The bronzes are very varied in structure and composition. Most are cast, moderate-tin bronzes, but some are high or low in tin or lead. A few show a worked and annealed structure, and some of the cast bronzes were also heat treated (possibly by use as cooking pots). corrosion patterns also vary greatly, from almost uncorroded to total mineralization. Periodic and esquential corrosion phenomena were detected, as well as patination applied when the bronzes were made. We had hoped to be able to ascertain the causes of the different penetration of corrosion in these samples, but that must remain for future work.

scholarly journals Silk Textiles from the Topkapi Palace Museum, Istanbul: An Analytical Study

2021 ◽  
pp. 67-75
Keyword(s):  
High Performance Liquid Chromatography ◽  
Liquid Chromatography ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Elemental Analysis ◽  
High Performance ◽  
Analytical Study ◽  
Color Measurement ◽  
X Ray ◽  
Scanning Electron

Eight historical textile objects belonging to the 16th-20th centuries in the collection of the Topkapi Palace Museum in Istanbul were analyzed with the purpose of reaching improved conservation and restoration methods. The historical textiles underwent dyestuff analysis by High Performance Liquid Chromatography, morphological and elemental analysis by Scanning Electron Microscope with energy Dispersive X-ray Spectroscopy, CIEL*a*b color measurement as well as technical analysis by optical microscopy.

Direct growth of Mn0.6Ni0.4CO3 nanosheet assembles on Ni foam for high-performance supercapacitor electrodes

2022 ◽  
Author(s):  
RongMin Cheng ◽  
Conghong Zhan ◽  
Juanjuan Gao
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Powder Diffraction ◽  
High Performance ◽  
Ni Foam ◽  
X Ray ◽  
Transmission Electron ◽  
Direct Growth ◽  
Calcination Treatment ◽  
Scanning Electron

Using Ni foam as a template, Mn0.6Ni0.4CO3 nanosheet assembles were synthesized by hydrothermal method and calcination treatment. X-ray powder diffraction (XRD), scanning electron microscope (SEM), transmission electron microscope (TEM), Inductively...

scholarly journals Does the Scanning Electron Microscope Have an Objective Lens?

1994 ◽  
Vol 2 (3) ◽  
pp. 11-12
Author(s):  
Ivan L. Roth
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Source ◽  
Light Microscope ◽  
Objective Lens ◽  
Ocular Lens ◽  
Microscope Slide ◽  
Condenser Lens ◽  
Scanning Electron

No, Virginia, there is no objective lens in the Scanning Electron Microscope.There is much confusion about the lenses in a scanning electron microscope (SEM). All of the lenses in a SEM are condenser lenses. The fact that some scanning electron microscope manufacturers have labelled the controls for the final condenser “objective lens” is misleading and this may have contributed to the confusion.To get some perspective on this matter, observe your compound light microscope. Starting with the light source, the first lens encountered is the condenser lens (the lens that handles the light before it interacts with the specimen). Next the light interacts with the specimen on a microscope slide. Then the light enters the objective lens (the first lens the light enters after interacting with the specimen) and finally the light travels through the ocular lens and then it enters your eye.

scholarly journals The Origins of the Obsidian Artifacts from Gua Pawon, Dago and Bukit Karsamanik in Bandung, Indonesia

AMERTA ◽  
2020 ◽  
Vol 25 (1) ◽  
pp. 48-57
Author(s):  
Stephen Chia ◽  
Lutfi Yondri ◽  
Truman Simanjuntak
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Electron Microprobe ◽  
Energy Dispersive ◽  
Kuala Lumpur ◽  
Element Analysis ◽  
X Ray ◽  
The University ◽  
Different Sources ◽  
Scanning Electron

Abstract. This paper presents the results of a study to determine whether the obsidian artifacts found in Gua Pawon, Dago and Bukit Karsamanik in Bandung came from the well-known sources of Gunung Kendan in Nagreg, Kampung Rejeng in Garut or elsewhere. Obsidian artifacts for this study were obtained from earlier archaeological excavations at Gua Pawon and from chance finds at the sites of Dago and Bukit Karsamanik in Bandung. Samples of obsidian were also collected from the known obsidian sources in Gunung Kendan in Nagreg and Kampung Rejeng in Garut for comparative purposes.Analyses of these samples were done on a scanning electron microscope using the energy dispersive X-ray spectrometer at the University of Science Malaysia, Penang and the electron microprobe at the University of Malaya, Kuala Lumpur. Multi-element analysis was undertaken, and statistical procedures were performed on data obtained from the artifacts and the sources. The results of the study thus far suggested that the obsidian artifacts from Gua Pawon were made using obsidian obtained from both Gunung Kendan and Kampung Rejeng sources while those from Dago and Bukit Karsamanik have yet to be determined. More samples from all the known obsidian sources are needed to determine the variability within and between all the different sources. Temporally, the study also revealed that prehistoric humans at Gua Pawon exploited or used the same obsidian resources over several thousands of years. Abstrak. Tulisan ini membahas hasil studi tentang sumber bahan baku artefak obsidian yang ditemukan di Gua Pawon, Dago, dan Bukit Karsamanik, Bandung. Analisis dilakukan terhadap sejumlah artefak obsidian, temuan ekskavasi di Gua Pawon dan temuan permukaan di Situs Dago dan Bukit Karsamanik. Untuk perbandingan dilakukan juga analisis terhadap obsidian dari Gunung Kendan di Nagrek dan Kampung Rejeng di Garut, dua lokasi sumber obsidian di Jawa Barat.Analisis dilakukan dengan cara "scanning electron microscope", menggunakan "energy dispersive X-ray spectrometer" di Universitas Sains Malaysia, Penang dan "electron microprobe" di Universitas Malaya, Kuala Lumpur. Analisis multielemen dan perhitungan statistic dilakukan terhadap data yang diperoleh dari artefak dan bahan. Hasil studi memperlihatkan artefak obsidian dari Gua Pawon menggunakan bahan dari Gunung Kendan dan Kampung Rejeng, sementara artefak Dago dan Bukit Karsamanik belum diketahui sumbernya. Analisis terhadap bahan dari sumber-sumber lain sangat diperlukan untuk menentukan variabilitas di dalam dan di antarasumber-sumber yang berbeda. Untuk sementara, hasil studi memperlihatkan manusia prasejarah Gua Pawon mengeksploitasi dan menggunakan sumber-sumber obsidian yang sama selama beberapa ribu tahun.

A Scanning Electron Microscope from Hitachi

1969 ◽  
Vol 27 ◽  
pp. 88-89
Author(s):  
Yoshirou Onuma ◽  
Tatsuo Hujiyasu ◽  
Yukio Kakinuma
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Mechanical Vibration ◽  
Electron Gun ◽  
Objective Lens ◽  
Lens System ◽  
Beam Path ◽  
External View ◽  
Electrical Fields ◽  
Scanning Electron

Hitachi, Limited has recently completed the development of a commercial scanning electron microscope, the features of which are discussed herein. Fig. 1 is an external view of the instrument.Lens SystemA three-stage reduction lens system is employed to obtain a short electron beam path. This minimizes the effects of any external electromagnetic or stray electrical fields as well as mechanical vibration or shock. Axial alignment is easily accomplished by transverse adjustment of the electron gun and lens system. Aperture plates with different hole sizes are provided in the condenser lens, deflection coil, and on the principal plane of the objective lens. The apertures are easily removed for cleaning. The electromagnetic stigmator is located outside the objective lens to facilitate removal for cleaning. Resolution of 200Å~250Å is guaranteed.

Influence of Nano-SiO2 on the Strength of High Performance Concrete

2011 ◽  
Vol 686 ◽  
pp. 432-437 ◽  
Author(s):  
Bao Min Wang
Keyword(s):  
Compressive Strength ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Performance ◽  
High Performance Concrete ◽  
Mixing Ratio ◽  
X Ray Diffraction ◽  
X Ray ◽  
Injection Experiment ◽  
Scanning Electron

The influence of Nano-SiO2 (NS) on the strength of high-performance concrete (W/B=0.24, W/B=0.29, W/B=0.34) has been studied in this paper. The results show that compressive strengths of concrete in both the early and later stage can be improved by adding Nano-SiO2 content. And the influence on the early compressive strength is greater than that on the later compressive strength. According to the results, 3%-5% Nano-SiO2can be used as the proper mixing ratio. X-ray diffraction, SEM (scanning electron microscope) and mercury injection experiment were used to analyze the action principle of Nano-SiO2 microscopically, the microscopic characteristics of concrete can be significantly improved through interfacial and filling effect effects so that the performance of concrete can be accordingly improved.

Observability of Very Thick Specimen by Using Transmission Scanning Electron Microscope

1971 ◽  
Vol 29 ◽  
pp. 26-27
Author(s):  
K. Shibatomi ◽  
T. Yamanoto ◽  
H. Koike
Keyword(s):  
Electron Microscope ◽  
Image Quality ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Image Contrast ◽  
Objective Lens ◽  
Thick Specimen ◽  
Transmission Electron ◽  
Scanning Electron

In the observation of a thick specimen by means of a transmission electron microscope, the intensity of electrons passing through the objective lens aperture is greatly reduced. So that the image is almost invisible. In addition to this fact, it have been reported that a chromatic aberration causes the deterioration of the image contrast rather than that of the resolution. The scanning electron microscope is, however, capable of electrically amplifying the signal of the decreasing intensity, and also free from a chromatic aberration so that the deterioration of the image contrast due to the aberration can be prevented. The electrical improvement of the image quality can be carried out by using the fascionating features of the SEM, that is, the amplification of a weak in-put signal forming the image and the descriminating action of the heigh level signal of the background. This paper reports some of the experimental results about the thickness dependence of the observability and quality of the image in the case of the transmission SEM.

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