scholarly journals Principle and Application of Energy Dispersive Micro X-ray Fluorescence Analyzer

2019 ◽  
Vol 26 (1) ◽  
pp. 34-40
Author(s):  
Atsushi Bando

2006 ◽  
Vol 44 (6) ◽  
pp. 16-23 ◽  
Author(s):  
H. Kanada ◽  
Y. Ishikawa ◽  
T. Uomoto


1978 ◽  
Vol 22 ◽  
pp. 395-400
Author(s):  
Bradner D. Wheeler ◽  
Nancy Jacobus

Recent developments in analytical techniques and software have allowed the accurate quantitative determinations of both the major and minor elements in stainless steels by energy dispersive x-ray fluorescence. The successful analysis of 300 and 400 series stainless steel is reported utilizing this technique. The analysis of this type of material represents one of the most severe tests of the method due to numerous peak overlaps and interelement effects such as absorption and enhancement.Sixteen standards of ASTM 300 series and ten 400 series were prepared by polishing on a 220 grit aluminum oxide belt and subsequently washing the surface in absolute methanol. Analyses were performed with an EG&G ORTEC 6110 Tube Excited Fluorescence Analyzer utilizing a dual anode (Rh/W) x-ray tube. Peak deconvolutions and interelement corrections were made with a 16K PDP-11/05 computer utilizing the program FLINT (1). Utilization of spectral deconvolutions and interelement corrections yields a relative accuracy of approximately IX of the concentrations of the major elements.





1975 ◽  
Vol 19 ◽  
pp. 367-380 ◽  
Author(s):  
F. Arinc ◽  
R. P. Gardner ◽  
L. Wielopolski ◽  
A. R. Stiles

The least-squares method with complete component library spectra is applied to the quantitative analysis of X-ray fluorescence spectral intensities. An approach is outlined for application to the general case of thick homogeneous samples at high counting rates, A simplified approach can be taken with the more specific case represented, by atmospheric particulates collected on filters. The details and sample results of this approach for this specific case are given for an energy dispersive X-ray fluorescence analyzer. The results indicate that the least-squares method as developed and applied here is valid and should prove generally useful to X-ray analysts.



2005 ◽  
Author(s):  
G. I. Borisov ◽  
R. I. Kondratenko ◽  
V. A. Mikhin ◽  
B. V. Odinov ◽  
A. V. Pukhov


Author(s):  
J.M. Titchmarsh

The advances in recent years in the microanalytical capabilities of conventional TEM's fitted with probe forming lenses allow much more detailed investigations to be made of the microstructures of complex alloys, such as ferritic steels, than have been possible previously. In particular, the identification of individual precipitate particles with dimensions of a few tens of nanometers in alloys containing high densities of several chemically and crystallographically different precipitate types is feasible. The aim of the investigation described in this paper was to establish a method which allowed individual particle identification to be made in a few seconds so that large numbers of particles could be examined in a few hours.A Philips EM400 microscope, fitted with the scanning transmission (STEM) objective lens pole-pieces and an EDAX energy dispersive X-ray analyser, was used at 120 kV with a thermal W hairpin filament. The precipitates examined were extracted using a standard C replica technique from specimens of a 2¼Cr-lMo ferritic steel in a quenched and tempered condition.



Author(s):  
J. Bentley ◽  
E. A. Kenik

Instruments combining a 100 kV transmission electron microscope (TEM) with scanning transmission (STEM), secondary electron (SEM) and x-ray energy dispersive spectrometer (EDS) attachments to give analytical capabilities are becoming increasingly available and useful. Some typical applications in the field of materials science which make use of the small probe size and thin specimen geometry are the chemical analysis of small precipitates contained within a thin foil and the measurement of chemical concentration profiles near microstructural features such as grain boundaries, point defect clusters, dislocations, or precipitates. Quantitative x-ray analysis of bulk samples using EDS on a conventional SEM is reasonably well established, but much less work has been performed on thin metal foils using the higher accelerating voltages available in TEM based instruments.



Author(s):  
Allen Angel ◽  
Kathryn A. Jakes

Fabrics recovered from archaeological sites often are so badly degraded that fiber identification based on physical morphology is difficult. Although diagenetic changes may be viewed as destructive to factors necessary for the discernment of fiber information, changes occurring during any stage of a fiber's lifetime leave a record within the fiber's chemical and physical structure. These alterations may offer valuable clues to understanding the conditions of the fiber's growth, fiber preparation and fabric processing technology and conditions of burial or long term storage (1).Energy dispersive spectrometry has been reported to be suitable for determination of mordant treatment on historic fibers (2,3) and has been used to characterize metal wrapping of combination yarns (4,5). In this study, a technique is developed which provides fractured cross sections of fibers for x-ray analysis and elemental mapping. In addition, backscattered electron imaging (BSI) and energy dispersive x-ray microanalysis (EDS) are utilized to correlate elements to their distribution in fibers.



Author(s):  
Marc H. Peeters ◽  
Max T. Otten

Over the past decades, the combination of energy-dispersive analysis of X-rays and scanning electron microscopy has proved to be a powerful tool for fast and reliable elemental characterization of a large variety of specimens. The technique has evolved rapidly from a purely qualitative characterization method to a reliable quantitative way of analysis. In the last 5 years, an increasing need for automation is observed, whereby energy-dispersive analysers control the beam and stage movement of the scanning electron microscope in order to collect digital X-ray images and perform unattended point analysis over multiple locations.The Philips High-speed Analysis of X-rays system (PHAX-Scan) makes use of the high performance dual-processor structure of the EDAX PV9900 analyser and the databus structure of the Philips series 500 scanning electron microscope to provide a highly automated, user-friendly and extremely fast microanalysis system. The software that runs on the hardware described above was specifically designed to provide the ultimate attainable speed on the system.



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