X-Ray Phase Analysis Of Nitrided Layers Of X2CrNiMo17-12-2 Austenitic Steel

Abstract This work presents the results of diffraction analyses carried out using X-ray phase analyses (XRD and GIXRD) of nitrided layers of X2CrNiMo17-12-2 austenitic steel. Plasma nitriding process was c arried out in the temperature range of 325 ÷ 400 °C and time of 2 ÷ 4 h. Hydrogen-nitrogen plasma was used as reactive atmosphere (H2 75% + N2 25%) with pressure of 150 Pa. On the basis of the X-ray analyses it was stated that the obtained nitrided layers consisted of a subsurface layer of chromium nitrides and a zone of nitrogen saturated austenite.

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Synthesis and properties of double gadolinium tellurites

Bulletin of the Karaganda University Chemistry series ◽

10.31489/2021ch3/67-73 ◽

2021 ◽

Vol 103 (3) ◽

pp. 67-73

Author(s):

A.A. Toibek ◽

◽

K.T. Rustembekov ◽

D.A. Kaikenov ◽

M. Stoev ◽

...

Keyword(s):

Phase Analysis ◽

Solid Phase ◽

Heat Capacities ◽

Ceramic Technology ◽

Phase Method ◽

X Ray Diffraction ◽

X Ray ◽

Cell Parameters ◽

Temperature Range ◽

Diffraction Patterns

For the first time, double gadolinium tellurites of the composition GdMIITeO4.5 (MII — Sr, Ba) were synthesized by the solid-phase method. The solid-phase synthesis of samples was carried out from decrepitated gadolinium (III) and tellurium (IV) oxides, strontium, and barium carbonates according to the standard ceramic technology. The synthesis was carried out in the temperature range of 800-1100 °C. The samples obtained were confirmed by X-ray phase analysis. X-ray phase analysis was carried out on an Empyrean instrument in the XRDML Pananalitical format. The intensity of the diffraction maxima was estimated on a 100-point scale. X-ray diffraction patterns indexing of the powder of gadolinium tellurites — alkaline earth metals studied were carried out by the homology method. The reliability and correctness of the results of indexing the X-ray diffraction patterns are confirmed by the good agreement between the experimental and calculated values of the interplanar distances (d) and the agreement between the values of the X-ray and pycnometric densities. It was found that compounds GdSrTeO4.5 and GdBaTeO4.5 crystallize in the monoclinic system and have the unit cell parameters, namely GdSrTeO4.5 — a = 12.7610, b = 10.4289, c = 8.6235 Å, V° = 1141.83 Å3, β = 95.77°, Z = 5, ρrent. = 3.22, ρpikn. = (3.10±0.09) g/cm3; GdBaTeO4.5 — a = 15.7272, b = 15.8351, c = 7.1393 Å, V° = 1769.72 Å3, β = 95.53°, Z = 8, ρrent = 3.71, ρpick = (3.61±0.10) g/cm3. Using the Landiya method, the standard heat capacities of the compounds were estimated from the calculated values of the standard entropies, and the temperature dependences of the heat capacities of the gadolinium tellurites synthesized were determined in the temperature range of 298–850 K.

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Surface Hardening of Aluminium-Copper Alloy 2011 by RF Plasma Nitriding Process

Key Engineering Materials ◽

10.4028/www.scientific.net/kem.462-463.1097 ◽

2011 ◽

Vol 462-463 ◽

pp. 1097-1102 ◽

Cited By ~ 1

Author(s):

Jiraporn Pongsopa ◽

Pattama Visuttpitukul ◽

Boonchoat Paosawatyanyong

Keyword(s):

Copper Alloy ◽

Plasma Nitriding ◽

Incident Angle ◽

Plasma Reactor ◽

Surface Hardness ◽

Nitriding Process ◽

Rf Plasma ◽

X Ray ◽

Inductively Coupled ◽

Aluminium Copper

In this work, an inductively-coupled rf plasma reactor was utilized in the nitriding process for surface hardness improvement of aluminium-copper alloy 2011. Substrate bias at 400V was used in the pre-sputtering step to eliminate the aluminium oxide on the samples. Plasma nitriding was carried out in a N2-H2 admixture at total pressure of 1 torr. The process length was varied from 9 to 36 hours while the input rf power and substrate temperature were varied from 100 to 300 W and kept at 400 oC, respectively. A negative bias voltage up to 400 V was used in the nitriding process. Glancing incident-angle x-ray diffraction (GIXRD) results showed the hexagonal crystal structure of AlN on samples. The roughness increased slightly when the voltage increase up to 400V and was investigated by Scanning Electron Micrograph (SEM). Electron Probe Microscopy Analysis (EPMA) and Energy Dispersive X-ray Analysis (EDX) were used to detect the N atoms in specimens. Significant increases of surface hardness are observed after plasma nitriding.

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Application of the Method of Coprecipitation of Salts to Obtain Zinc Orthostannate

MATEC Web of Conferences ◽

10.1051/matecconf/202134602012 ◽

2021 ◽

Vol 346 ◽

pp. 02012

Author(s):

Dmitry A. Antonov ◽

Valery V. Anisimov ◽

Mikhail A. Tarasenko

Keyword(s):

Phase Composition ◽

Phase Analysis ◽

Chemical Reactions ◽

Temperature Treatment ◽

Initial Composition ◽

X Ray ◽

Temperature Range ◽

Highly Dispersed ◽

Co Precipitation

The effect of the temperature treatment of compounds obtained by the method of co-precipitation of zinc and tin (IV) salts on the synthesis of highly dispersed zinc orthostannate in the temperature range 800 – 1300 °C was studied. The effect of the nonstoichiometric ratio of the components in the initial composition on the phase composition of the resulting zinc orthostannate was considered. The phase composition of the obtained powders is presented according to the data of X-ray phase analysis. Demonstrated chemical reactions occurring during the experiment.

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X-ray quantitative analysis of the phases developed upon air annealing of ZnSe, CdSe, and CdS semiconductors

Powder Diffraction ◽

10.1154/1.1487862 ◽

2002 ◽

Vol 17 (3) ◽

pp. 191-195 ◽

Cited By ~ 12

Author(s):

Z. K. Heiba

Keyword(s):

Quantitative Analysis ◽

Phase Analysis ◽

Quantitative Phase Analysis ◽

Thermally Grown Oxides ◽

X Ray ◽

Quantitative Phase ◽

Qualitative And Quantitative ◽

Temperature Range ◽

Thermally Grown

The phases developed upon annealing of ZnSe, CdSe, and CdS semiconductors in air are investigated applying X-ray qualitative and quantitative phase analysis. The compositions of the thermally grown oxides over the 373–773 K temperature range are found to be ZnO and ZnSeO3 for ZnSe, CdSeO3 for CdSe and CdSO4 and Cd3O2SO4 for CdS. The percentage phase abundance of each phase is determined at each temperature applying a standardless method. At all temperatures, the oxides are predominantly ZnO with about 10% ZnSeO3 at 773 K in case of ZnSe and CdSO4 with about 9% Cd3O2SO4 at 773 K in case of CdS. The rate of oxidation with temperature is found to be nonlinear for the three chalcogenides. CdS is found to be more resistible for oxidation than CdSe and ZnSe.

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