Cation and Anion Formation in F 1s-Excited SF6-Clusters

2020 ◽  
Vol 234 (7-9) ◽  
pp. 1371-1382 ◽  
Author(s):  
Christian Grunewald ◽  
Roman Flesch ◽  
Eckart Rühl
Keyword(s):  
Mass Spectrometry ◽  
Synchrotron Radiation ◽  
High Efficiency ◽  
Product Formation ◽  
X Rays ◽  
Anion Formation ◽  
Molecular Precursors

AbstractCation and anion formation from molecular SF6 and SF6 clusters is reported in the F 1s-excitation regime (680–720 eV) using tunable synchrotron radiation. Stable products are identified by mass spectrometry, while the tunablility of the soft X-rays source is used to determine mechanistic details on the formation of the detected charged products. Characteristic differences are observed between product formation from the isolated molecule as well as from clusters for both, cations and anions. Specifically, dication formation, such as SF22+, is only observed for molecular precursors, which are formed with high efficiency at the F 1s → t2g-transition. SF6− is efficiently formed from clusters upon F 1s → t1u-transition. Mechanistic details on the formation of stable products are discussed.

scholarly journals X-Ray Microprobe Studies Using Multilayer Focussing Optics

1988 ◽  
Vol 32 ◽  
pp. 149-153
Author(s):  
A.C. Thompson ◽  
J.H. Underwood ◽  
Y. Wu ◽  
R.D. Giauque ◽  
M.L. Rivers ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Elemental Analysis ◽  
High Efficiency ◽  
Three Dimensions ◽  
X Rays ◽  
X Ray ◽  
Radiation Sources ◽  
Elemental Sensitivity ◽  
Optical Mirrors

The availability of intense x-rays from synchrotron radiation sources permits the elemental analysis of samples in new ways. An x-ray microprobs using these sources allows the analysis of much smaller samples with greatly improved elemental sensitivity. In addition to the higher x-ray intensity obtained at synchrotron sources, the development of high efficiency x-ray reflectors using multilayer coated optical mirrors permits the achievement of spot sizes of less than 10 μm x 10 μm with enough x-ray intensity to simultaneously measure femtogram quantities of many elements in less than one minute. Since samples to be studied in an x-ray microprobe do not have to be placed in a vacuum, almost any sample can be conveniently analyzed. With an x-ray microprobe it is possible to obtain elemental distributions of elements in one, two or even three dimensions.

Synchrotron radiation X-rays demonstrate small cerebral vessels in normal mouse and variations under ischemia in rat

2005 ◽  
Vol 25 (1_suppl) ◽  
pp. S558-S558
Author(s):  
Masahiro Tamaki ◽  
Takashi Mizobe ◽  
Keiji Kidoguchi ◽  
Junnji Koyama ◽  
Takeshi Kondoh ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Normal Mouse ◽  
Cerebral Vessels ◽  
X Rays

Absolute measurement of radiant power for synchrotron radiation monochromatized X-rays

2019 ◽  
Vol 4 (1) ◽  
pp. 97-105
Author(s):  
Fan Li ◽  
Yi-Dong Zhao ◽  
Pei-Wei Wang ◽  
Lei Zheng ◽  
Si-Ming Guo ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Absolute Measurement ◽  
X Rays ◽  
Radiant Power

Wet etching of GaAs using synchrotron radiation x rays

2001 ◽  
Vol 89 (5) ◽  
pp. 3033-3040 ◽  
Author(s):  
Qing Ma ◽  
Nicolaie Moldovan ◽  
Derrick C. Mancini ◽  
Richard A. Rosenberg
Keyword(s):  
Synchrotron Radiation ◽  
Wet Etching ◽  
X Rays

scholarly journals Reversible Visualization for Synchrotron Radiation Using Photochromic Dye and Photostimulable Phosphor Composite Film

2014 ◽  
Vol 2014 ◽  
pp. 1-5 ◽  
Author(s):  
Kenji Kinashi ◽  
Kazuya Jimbo ◽  
Takahiro Okabe ◽  
Sono Sasaki ◽  
Hiroyasu Masunaga
Keyword(s):  
Synchrotron Radiation ◽  
Composite Film ◽  
X Rays ◽  
Uv Emission ◽  
Photochromic Dye ◽  
Photostimulable Phosphor

The study reported herein is undertaken to visualize reversibly synchrotron radiation by using a composite film comprised of two components: a photochromic SP with the conversion characteristics of UV-to-visible color and PSP BaFCl:Eu2+particles with the conversion characteristics of X-rays-to-UV emission.

Applications of High-Resolution Powder X-Ray Diffraction

2007 ◽  
Vol 130 ◽  
pp. 7-14 ◽  
Author(s):  
Andrew N. Fitch
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Powder Diffraction ◽  
X Rays ◽  
X Ray Diffraction ◽  
Crystalline Materials ◽  
X Ray ◽  
Structural Characterisation ◽  
Pdf Analysis

The highly-collimated, intense X-rays produced by a synchrotron radiation source can be harnessed to build high-resolution powder diffraction instruments with a wide variety of applications. The general advantages of using synchrotron radiation for powder diffraction are discussed and illustrated with reference to the structural characterisation of crystalline materials, atomic PDF analysis, in-situ and high-throughput studies where the structure is evolving between successive scans, and the measurement of residual strain in engineering components.

scholarly journals The Use of Synchrotron Radiation in the Energy Calibration of Astronomical Apparatus

1972 ◽  
Vol 14 ◽  
pp. 642-646
Author(s):  
G. A. Gurzadyan ◽  
J. B. Ohanesyan
Keyword(s):  
Thin Films ◽  
Synchrotron Radiation ◽  
Electron Energy ◽  
Electron Accelerator ◽  
Energy Calibration ◽  
Ideal Solution ◽  
X Rays ◽  
Special Equipment ◽  
Physics Institute ◽  
Wide Range

The problem of energy calibration of astrophysical apparatus is essential for every or almost every space experiment. The utilization of synchrotron radiation from an electronic accelerator should perhaps be taken as an ideal solution of this problem, if of course, such a possibility is available.Special equipment for the extraction of synchrotron radiation has been devised at the circular electron accelerator with a maximum electron energy of 6 GeV, in the Physics Institute of Erevan (Gurzadyan and Ohanesyan, 1972). The equipment is designed primarily for the energy calibration of astronomical apparatus operating in a vacuum and hard ultraviolet and X rays. However, the equipment can also be applied to a wide range of experiments relating to the physics of solids, crystallography, physics of thin films, X rays, etc.

Determination of Residual Stress Distribution in Severe Surface Deformed Steel by Shot Peening

2008 ◽  
Vol 571-572 ◽  
pp. 15-20 ◽  
Author(s):  
Yoshiaki Akiniwa ◽  
Hidehiko Kimura
Keyword(s):  
Carbon Steel ◽  
Synchrotron Radiation ◽  
Stress Distribution ◽  
Optimization Technique ◽  
High Energy ◽  
Medium Carbon Steel ◽  
X Rays ◽  
Near Surface ◽  
Medium Carbon ◽  
Order Polynomial

The compressive stress distribution below the specimen surface of a nanocrystalline medium carbon steel was investigated nondestructively by using high-energy X-rays from a synchrotron radiation source, SPring-8 (Super Photon ring-8 GeV) in the Japan Synchrotron Radiation Research Institute. A medium carbon steel plate was shot-peened with fine cast iron particles of the size of 50 μm. By using the monochromatic X-ray beam with three energy levels of 10, 30 and 72 keV, the stress values at the arbitrary depth were measured by the constant penetration depth method. The stress was calculated from the slope of the sin2ψ diagram. Measured stress corresponds to the weighted average associated with the attenuation of the X-rays in the material. The real stress distribution was estimated by using the optimization technique. The stress distribution was assumed by the third order polynomial in the near surface layer and the second order polynomial. The coefficients of the polynomials were determined by the conjugate gradient iteration. The predicted stress distribution agreed well with that measured by the conventional surface removal method.

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