X-Ray Microprobe Studies Using Multilayer Focussing Optics

The availability of intense x-rays from synchrotron radiation sources permits the elemental analysis of samples in new ways. An x-ray microprobs using these sources allows the analysis of much smaller samples with greatly improved elemental sensitivity. In addition to the higher x-ray intensity obtained at synchrotron sources, the development of high efficiency x-ray reflectors using multilayer coated optical mirrors permits the achievement of spot sizes of less than 10 μm x 10 μm with enough x-ray intensity to simultaneously measure femtogram quantities of many elements in less than one minute. Since samples to be studied in an x-ray microprobe do not have to be placed in a vacuum, almost any sample can be conveniently analyzed. With an x-ray microprobe it is possible to obtain elemental distributions of elements in one, two or even three dimensions.

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Pixel detectors for diffraction-limited storage rings

Journal of Synchrotron Radiation ◽

10.1107/s1600577514017135 ◽

2014 ◽

Vol 21 (5) ◽

pp. 1006-1010 ◽

Cited By ~ 14

Author(s):

Peter Denes ◽

Bernd Schmitt

Keyword(s):

Synchrotron Radiation ◽

Storage Ring ◽

Dynamic Range ◽

State Of The Art ◽

Storage Rings ◽

X Rays ◽

X Ray ◽

Current State ◽

Pixel Detectors ◽

Radiation Sources

Dramatic advances in synchrotron radiation sources produce ever-brighter beams of X-rays, but those advances can only be used if there is a corresponding improvement in X-ray detectors. With the advent of storage ring sources capable of being diffraction-limited (down to a certain wavelength), advances in detector speed, dynamic range and functionality is required. While many of these improvements in detector capabilities are being pursued now, the orders-of-magnitude increases in brightness of diffraction-limited storage ring sources will require challenging non-incremental advances in detectors. This article summarizes the current state of the art, developments underway worldwide, and challenges that diffraction-limited storage ring sources present for detectors.

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Fast and Wide Dynamic Range X-ray Detectors Enable Novel Science

Acta Crystallographica Section A Foundations and Advances ◽

10.1107/s2053273314093140 ◽

2014 ◽

Vol 70 (a1) ◽

pp. C685-C685

Author(s):

Hugh Philipp ◽

Katherine Shanks ◽

Mark Tate ◽

Joel Weiss ◽

Sol Gruner

Keyword(s):

Synchrotron Radiation ◽

Dynamic Range ◽

X Rays ◽

Wide Dynamic Range ◽

X Ray ◽

Cornell University ◽

Array Detectors ◽

Radiation Sources ◽

Pixel Array ◽

Ray Patterns

New and improved synchrotron radiation sources enable experiments that demand the ability to acquire successive hard (e.g., 10 keV) x-ray images at sub-microsecond rates or to quickly acquire x-ray patterns encompassing intensities that vary by 10^6 or more across single images. We describe two novel integrating Pixel Array Detectors (PADs) developed at Cornell University that accomplish these objectives. The Mixed-Mode PAD (MM-PAD) frames at > 1 KHz and can readily detect signals within a single image ranging from single x-rays to over 107 x-rays/pixel/frame. The Keck-PAD can acquire 8-12 successive images at frame rates approaching 10 MHz with a range of single x-rays up to about 10^4 x-rays/pixel/frame. The operating principles of the MM-PAD and Keck-PAD, respectively, are described. We also describe examples of experiments that have been performed at various synchrotron radiation sources.

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Dynamical coherent illumination for X-ray microscopy at 3rd generation synchrotron radiation sources: First results with X-rays at the Ca-K edge (4 keV)

10.1063/1.1291191 ◽

2000 ◽

Cited By ~ 1

Author(s):

S. Oestreich

Keyword(s):

Synchrotron Radiation ◽

X Rays ◽

X Ray ◽

Radiation Sources ◽

First Results ◽

Coherent Illumination

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X‐ray monochromator system for use with synchrotron radiation sources

Review of Scientific Instruments ◽

10.1063/1.1136631 ◽

1981 ◽

Vol 52 (4) ◽

pp. 509-516 ◽

Cited By ~ 97

Author(s):

J. A. Golovchenko ◽

R. A. Levesque ◽

P. L. Cowan

Keyword(s):

Synchrotron Radiation ◽

X Ray ◽

Radiation Sources

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Use of synchrotron radiation sources for X-ray diffraction topography of polytypic structures

Journal of Applied Crystallography ◽

10.1107/s0021889884011432 ◽

1984 ◽

Vol 17 (4) ◽

pp. 231-237 ◽

Cited By ~ 17

Author(s):

G. R. Fisher ◽

P. Barnes

Keyword(s):

Synchrotron Radiation ◽

X Ray Diffraction ◽

X Ray ◽

Radiation Sources

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Applications of High-Resolution Powder X-Ray Diffraction

Solid State Phenomena ◽

10.4028/www.scientific.net/ssp.130.7 ◽

2007 ◽

Vol 130 ◽

pp. 7-14 ◽

Cited By ~ 4

Author(s):

Andrew N. Fitch

Keyword(s):

High Resolution ◽

Synchrotron Radiation ◽

Powder Diffraction ◽

X Rays ◽

X Ray Diffraction ◽

Crystalline Materials ◽

X Ray ◽

Structural Characterisation ◽

Pdf Analysis

The highly-collimated, intense X-rays produced by a synchrotron radiation source can be harnessed to build high-resolution powder diffraction instruments with a wide variety of applications. The general advantages of using synchrotron radiation for powder diffraction are discussed and illustrated with reference to the structural characterisation of crystalline materials, atomic PDF analysis, in-situ and high-throughput studies where the structure is evolving between successive scans, and the measurement of residual strain in engineering components.

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Machine Learning Powered by Principal Component Descriptors as the Key for Sorted Structural Fit of XANES

Physical Chemistry Chemical Physics ◽

10.1039/d1cp01794b ◽

2021 ◽

Author(s):

Andrea Martini ◽

Alexander A. Guda ◽

Sergey A. Guda ◽

Aram L. Bugaev ◽

Olga V. Safonova ◽

...

Keyword(s):

Machine Learning ◽

Structural Analysis ◽

Synchrotron Radiation ◽

Free Electron Laser ◽

Principal Component ◽

Analytical Tool ◽

X Ray ◽

Radiation Sources ◽

X Ray Absorption

Modern synchrotron radiation sources and free electron laser made X-ray absorption spectroscopy (XAS) an analytical tool for the structural analysis of materials under in situ or operando conditions. Fourier approach...

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Residual Stress Measurement around the Interface of Copper Bicrystal Deformed by Uniaxial Extension

Advances in Science and Technology ◽

10.4028/www.scientific.net/ast.64.125 ◽

2010 ◽

Vol 64 ◽

pp. 125-134

Author(s):

Hanabusa Takao ◽

Ayumi Shiro ◽

Tatsuya Okada

Keyword(s):

Residual Stress ◽

Synchrotron Radiation ◽

Grain Boundary ◽

Residual Stresses ◽

Uniaxial Extension ◽

Kink Band ◽

X Rays ◽

X Ray ◽

Kink Bands ◽

Crystal Orientations

Residual stresses of a copper bicrystal were measured by X-ray diffraction and synchrotron radiation. A copper bicrystal specimen with a 90-degree tilt boundary was fabricated by the Brigdman technique. After the plastic extension of 30%, kink bands developed in a deformed matrix along the grain boundary. In this study, we focused on the residual stress distribution along the transverse direction of the specimen surface and the residual stresses in deformed matrix and kink band near the grain boundary. Residual stresses were evaluated by the X-ray single crystal measurement method. Stereographic projections were used to determine crystal orientations of deformed regions. It was found that crystal orientations were different between the deformed matrix and the kink band. Residual stresses in the direction along the grain boundary were compressive in the vicinity of the boundary and tensile in the region apart from the boundary. Residual stresses in the kink band were large in compression in compared with those in the deformation matrix. The difference in the results between X-rays and synchrotron radiation suggests that there is a depth variation in the deformation and therefore the residual stress development.

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Synchrotron radiation X-ray tomographic microscopy (SRXTM) of brachiopod shell interiors for taxonomy: Preliminary report

Geoloski anali Balkanskog poluostrva ◽

10.2298/gabp1071109m ◽

2010 ◽

pp. 109-117 ◽

Cited By ~ 6

Author(s):

Neda Motchurova-Dekova ◽

David Harper

Keyword(s):

Synchrotron Radiation ◽

Three Dimensional ◽

X Rays ◽

X Ray ◽

Fine Grained ◽

Internal Structures ◽

Efficient Alternative ◽

Micro Tomography ◽

Light Beams ◽

Non Destructive

Synchrotron radiation X-ray tomographic microscopy (SRXTM) is a non-destructive technique for the investigation and visualization of the internal features of solid opaque objects, which allows reconstruction of a complete three-dimensional image of internal structures by recording of the differences in the effects on the passage of waves of energy reacting with those structures. Contrary to X-rays, produced in a conventional X-ray tube, the intense synchrotron light beams are sharply focused like a laser beam. We report encouraging results from the use of SRXTM for purely taxonomic purposes in brachiopods: an attempt to find a non-destructive and more efficient alternative to serial sectioning and several other methods of dissection together with the non-destructive method of X-ray computerised micro-tomography. Two brachiopod samples were investigated using SRXTM. In ?Rhynchonella? flustracea it was possible to visualise the 3D shape of the crura and dental plates. In Terebratulina imbricata it was possible to reveal the form of the brachidium. It is encouraging that we have obtained such promising results using SRXTM with our very first two fortuitous samples, which had respectively fine-grained limestone and marl as infilling sediment, in contrast to the discouraging results communicated to us by some colleagues who have tested specimens with such infillings using X-ray micro-tomography. In future the holotypes, rare museum specimens or delicate Recent material may be preferentially subjected to this mode of analysis.

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