scholarly journals Features of the production of high-quality carbon cast steel in induction crucible furnaces of small capacity

2020 ◽  
Vol 95 (3) ◽  
pp. 76-84
Author(s):  
G.A. Byalik ◽  
◽  
V.I. Gontarenko ◽  
E.A. Bazhmina ◽  
◽  
...  
2017 ◽  
Vol 1 (2) ◽  
pp. 126
Author(s):  
Mukayat Al-Amin ◽  
Siti Maro’ah

The problems and obstacles faced by Abon Bandeng business group "Barokah" and Kecap "Kurma" are: 1. The making process is still using traditional tools and in very little capacity, so that the products are produced less than the maximum and in small capacity. So when there is a rather large order they can not afford to fill the order in due to lack of equipment that is not adequate for more production capacity. 2. Marketing management that still rely on orders and exhibitions of food products, this results in less sustainable production, rather than resulting in profits that can not be maximal / uncertain. Therefore, based on the need for solutive and strategic steps to overcome the problem of business groups to be more productive and highly competitive, these steps antaralain: 1. The need to modernize the equipment so as to produce products that berkuwalitas and competitive can do more production. 2. The need to improve the quality of group resources in terms of marketing of production, this quality improvement can be done by doing marketing training / marketing of production. So that the already sustainable production can be marketed optimally. This devotion aims to 1) This Business Group can produce maximally both in terms of production capacity and in terms of high quality of competitive production. 2) Increasing the quality of human resources of the group members in terms of marketing of the products so that the production can be sold / marketed maximally. The method used in this service is the approach done by using FGD (Focus Group Discussion) method combined with participatory research method that is by studying, finding and rediscovering business problem that happened in the Development of Mother House Business Group Date.


2019 ◽  
Vol 11 (1) ◽  
pp. 114-125 ◽  
Author(s):  
Zhenxing Qian ◽  
Zichi Wang ◽  
Xinpeng Zhang ◽  
Guorui Feng

This article describes how to overcome the shortage of steganalysis for small capacity-based embedding. A slight modification method is proposed to break steganography. For a given image, traditional steganalysis methods are first used to achieve a preliminary result. For the “clear” image judged by steganalysis, it is still suspicious because of the incompleteness of steganalysis for small capacity. Thus, slight modifications are made to break the possibility of covert communication. The modifications are made on the locations with minimal distortion to guarantee high quality of the modified image. To this end, a proposed distortion minimization based algorithm using slight modification. Experimental results show that the error rate of secret data extraction is around 50% after implementation, which indicates that the covert communication of steganography is destroyed completely.


2013 ◽  
Vol 800 ◽  
pp. 321-324
Author(s):  
Li Xiao Jia ◽  
Qi Cui

The effect of technical factors on the quality of surface composite layer is studied by conventional cast-penetrating process. The result indicates that the high-quality surface composite layer is prone to get when pouring temperature is suitable and the suitable pouring temperature is 1650°C for little cast steel. Appropriate thickness of coating layer is benefit to get surface composite layer with high quality and the quality of sample with 5mm coating layer is better than other samples in test. Surface composite layer with high quality is easy to obtain when coating layer is located in the side of foundry mould.


2006 ◽  
Author(s):  
Yoshihiko Nomura ◽  
Michinobu Murakami ◽  
Ryota Sakamoto ◽  
Tokuhiro Sugiura ◽  
Hirokazu Matsui ◽  
...  

1966 ◽  
Vol 24 ◽  
pp. 51-52
Author(s):  
E. K. Kharadze ◽  
R. A. Bartaya

The unique 70-cm meniscus-type telescope of the Abastumani Astrophysical Observatory supplied with two objective prisms and the seeing conditions characteristic at Mount Kanobili (Abastumani) permit us to obtain stellar spectra of a high quality. No additional design to improve the “climate” immediately around the telescope itself is being applied. The dispersions and photographic magnitude limits are 160 and 660Å/mm, and 12–13, respectively. The short-wave end of spectra reaches 3500–3400Å.


Author(s):  
R. L. Lyles ◽  
S. J. Rothman ◽  
W. Jäger

Standard techniques of electropolishing silver and silver alloys for electron microscopy in most instances have relied on various CN recipes. These methods have been characteristically unsatisfactory due to difficulties in obtaining large electron transparent areas, reproducible results, adequate solution lifetimes, and contamination free sample surfaces. In addition, there are the inherent health hazards associated with the use of CN solutions. Various attempts to develop noncyanic methods of electropolishing specimens for electron microscopy have not been successful in that the specimen quality problems encountered with the CN solutions have also existed in the previously proposed non-cyanic methods.The technique we describe allows us to jet polish high quality silver and silver alloy microscope specimens with consistant reproducibility and without the use of CN salts.The solution is similar to that suggested by Myschoyaev et al. It consists, in order of mixing, 115ml glacial actic acid (CH3CO2H, specific wt 1.04 g/ml), 43ml sulphuric acid (H2SO4, specific wt. g/ml), 350 ml anhydrous methyl alcohol, and 77 g thiourea (NH2CSNH2).


Author(s):  
A. V. Crewe ◽  
J. Wall ◽  
L. M. Welter

A scanning microscope using a field emission source has been described elsewhere. This microscope has now been improved by replacing the single magnetic lens with a high quality lens of the type described by Ruska. This lens has a focal length of 1 mm and a spherical aberration coefficient of 0.5 mm. The final spot size, and therefore the microscope resolution, is limited by the aberration of this lens to about 6 Å.The lens has been constructed very carefully, maintaining a tolerance of + 1 μ on all critical surfaces. The gun is prealigned on the lens to form a compact unit. The only mechanical adjustments are those which control the specimen and the tip positions. The microscope can be used in two modes. With the lens off and the gun focused on the specimen, the resolution is 250 Å over an undistorted field of view of 2 mm. With the lens on,the resolution is 20 Å or better over a field of view of 40 microns. The magnification can be accurately varied by attenuating the raster current.


Author(s):  
L. Mulestagno ◽  
J.C. Holzer ◽  
P. Fraundorf

Due to the wealth of information, both analytical and structural that can be obtained from it TEM always has been a favorite tool for the analysis of process-induced defects in semiconductor wafers. The only major disadvantage has always been, that the volume under study in the TEM is relatively small, making it difficult to locate low density defects, and sample preparation is a somewhat lengthy procedure. This problem has been somewhat alleviated by the availability of efficient low angle milling.Using a PIPS® variable angle ion -mill, manufactured by Gatan, we have been consistently obtaining planar specimens with a high quality thin area in excess of 5 × 104 μm2 in about half an hour (milling time), which has made it possible to locate defects at lower densities, or, for defects of relatively high density, obtain information which is statistically more significant (table 1).


Author(s):  
C. O. Jung ◽  
S. J. Krause ◽  
S.R. Wilson

Silicon-on-insulator (SOI) structures have excellent potential for future use in radiation hardened and high speed integrated circuits. For device fabrication in SOI material a high quality superficial Si layer above a buried oxide layer is required. Recently, Celler et al. reported that post-implantation annealing of oxygen implanted SOI at very high temperatures would eliminate virtually all defects and precipiates in the superficial Si layer. In this work we are reporting on the effect of three different post implantation annealing cycles on the structure of oxygen implanted SOI samples which were implanted under the same conditions.


Author(s):  
Judith M. Brock ◽  
Max T. Otten ◽  
Marc. J.C. de Jong

A Field Emission Gun (FEG) on a TEM/STEM instrument provides a major improvement in performance relative to one equipped with a LaB6 emitter. The improvement is particularly notable for small-probe techniques: EDX and EELS microanalysis, convergent beam diffraction and scanning. The high brightness of the FEG (108 to 109 A/cm2srad), compared with that of LaB6 (∼106), makes it possible to achieve high probe currents (∼1 nA) in probes of about 1 nm, whilst the currents for similar probes with LaB6 are about 100 to 500x lower. Accordingly the small, high-intensity FEG probes make it possible, e.g., to analyse precipitates and monolayer amounts of segregation on grain boundaries in metals or ceramics (Fig. 1); obtain high-quality convergent beam patterns from heavily dislocated materials; reliably detect 1 nm immuno-gold labels in biological specimens; and perform EDX mapping at nm-scale resolution even in difficult specimens like biological tissue.The high brightness and small energy spread of the FEG also bring an advantage in high-resolution imaging by significantly improving both spatial and temporal coherence.


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