Deposition of tin oxide films by pulsed laser evaporation

1988 ◽  
Vol 3 (6) ◽  
pp. 1180-1186 ◽  
Author(s):  
R. D. Vispute ◽  
V. P. Godbole ◽  
S. M. Chaudhari ◽  
S. M. Kanetkar ◽  
S. B. Ogale
Keyword(s):  
Single Phase ◽  
Energy Gap ◽  
Structural Characteristics ◽  
Pulsed Laser ◽  
Laser Evaporation ◽  
X Ray Diffraction ◽  
Electrical And Optical Properties ◽  
Corning Glass ◽  
Tin Oxide Films ◽  
Deposited Films

Thin films of SnO2−x (0<x<1) were deposited on Corning glass and alumina substrates by employing a pulsed laser evaporation (PLE) technique. The microstructural features of the films were probed with Sn119 conversion electron Mössbaucr spectroscopy (CEMS) whereas the structural characteristics were identified by using low-angle x-ray diffraction measurements. The electrical and optical properties have also been studied. It is shown that films with conductivity of 3 × 102 (ohm·cm)−1 and transmission of 90% can be obtained by appropriate postannealing of the as-deposited films in air and vacuum. The energy gap of this nearly stoichiometric single-phase SnO2 film was found to be 3.5 eV and spectroscopic ellipsometry measurements indicated the refractive index lobe typically between 1.8–1.9 over the wavelength range of 400–800 nm.

Effect of Film Thickness on Some Optical Properties of Sprayed Pyrolysis Cobalt Oxide Thin Films

2011 ◽  
Vol 316-317 ◽  
pp. 23-29
Author(s):  
S.A. Aly
Keyword(s):  
Optical Properties ◽  
Film Thickness ◽  
Cobalt Oxide ◽  
Energy Gap ◽  
Spray Pyrolysis Technique ◽  
Structural Characteristics ◽  
Wave Length ◽  
X Ray Diffraction ◽  
Glass Substrates ◽  
Deposited Films

The optical properties of cobalt oxide samples prepared by spray pyrolysis technique on glass substrates with different film thicknesses have been studied. The structural characteristics of the samples were investigated using X-ray diffraction. The optical properties of the prepared films were studied by transmittance and reflectance measurements, and the integrated transmittance (TVIS, and TNIR) and absorptance (AVIS and ANIR) in VIS and NIR regions was calculated and found to be affected by film thickness. The dependence of absorption coefficient on wave length was also reported. The energy gap was calculated and two energies have been observed at 2.15 and 1.5 eV suggesting that the deposited films are semi-conducting with allowed direct transitions.

The Structure and Electric Field Dependent Dielectric Properties of Annealed Sr1−xBaxTio3 Ferroelectric Thin Films

1995 ◽  
Vol 401 ◽  
Author(s):  
L.A. Knauss ◽  
J.M. Pond ◽  
J.S. Horwitz ◽  
C.H. Mueller ◽  
R.E. Treece ◽  
...  
Keyword(s):  
Thin Films ◽  
Dielectric Properties ◽  
Single Phase ◽  
Pulsed Laser ◽  
Lattice Parameter ◽  
Laser Deposition ◽  
X Ray Diffraction ◽  
X Ray ◽  
Deposited Films ◽  
Post Deposition

AbstractThe effect of a post deposition anneal on the structure and dielectric properties of epitaxial Sr1−x, BaxTiO3 (SBT) thin films with x = 0.35, 0.50 and 0.60 has been measured. The films were grown by pulsed laser deposition on LaAlO3(001) substrates at 750°C in 350 mTorr of oxygen. The asdeposited films were single phase, (001) oriented with 0)-scan widths for the (002) reflection between 0.160 and 0.50'. The dielectric properties of the as-deposited films exhibit a broad temperature dependence and a peak which is as much as 50 K below the peak in bulk SBT. Also, the lattice parameter, as measured by x-ray diffraction, of the as-deposited films was larger than the bulk indicating strain in the films. The as-deposited films were annealed for 8 hours at 900°C in oxygen. The dielectric properties of the annealed films were closer to that of bulk SBT and the lattice parameter was closer to the bulk lattice parameter indicating a reduction of strain. Annealing of as-deposited films also resulted in an increased dielectric tuning without increased dielectric loss.

Colossal Magnetoresistance in Thick La0.7Ca0.3MnO3 Films

1995 ◽  
Vol 384 ◽  
Author(s):  
Randolph E. Treece ◽  
P. Dorsey ◽  
M. Rubinstein ◽  
J. M. Byers ◽  
J. S. Horwitz ◽  
...  
Keyword(s):  
Colossal Magnetoresistance ◽  
Single Phase ◽  
Laser Deposition ◽  
Orthorhombic Structure ◽  
X Ray Diffraction ◽  
Post Deposition Annealing ◽  
X Ray ◽  
Mr Effect ◽  
Deposited Films ◽  
Post Deposition

ABSTRACTThick films (0.6 and 2.0 μm) of the colossal magnetoresistance (CMR) material, La0.7Ca0.3MnO3 (LCMO), have been grown by pulsed laser deposition (PLD). The films were grown from single-phase LCMO targets in 100 mTorr 02 pressures and the material deposited on (100) LaAlO3 substrates at deposition temperatures of 800°C. The deposited films were characterized by X-ray diffraction (XRD), magnetic field-dependent resistivity, and Rutherford backscattering spectroscopy (RBS). The LCMO films were shown by XRD to adopt an orthorhombic structure. Brief post-deposition annealing led to ~50,000% and ~12,000% MR effect in the 0.6 μm and 2.0 μm films, respectively.

Study of Raman Spectrum of Fe Doped CeO2 Thin Films Grown by Pulsed Laser Deposition

2010 ◽  
Vol 123-125 ◽  
pp. 375-378 ◽  
Author(s):  
Ram Prakash ◽  
Shalendra Kumar ◽  
Chan Gyu Lee ◽  
S.K. Sharma ◽  
Marcelo Knobel ◽  
...  
Keyword(s):  
Thin Films ◽  
Pulsed Laser Deposition ◽  
Single Phase ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Fe Doping ◽  
Full Width ◽  
Deposition Technique ◽  
X Ray Diffraction ◽  
X Ray

Ce1-xFexO2 (x=0, 0.01, 0.03 and 0.0 5) thin films were grown by pulsed laser deposition technique on Si and LaAlO3 (LAO) substrates. These films were deposited in vacuum and 200 mTorr oxygen partial pressure for both the substrates. These films were characterized by x-ray diffraction XRD and Raman spectroscopy measurements. XRD results reveal that these films are single phase. Raman results show F2g mode at ~466 cm-1 and defect peak at 489 cm-1 for film that deposited on LAO substrates, full width at half maximum (FWHM) is increasing with Fe doping for films deposited on both the substrates.

Structural and Optical Properties of BiFeO3 via Polymer-Assisted Hydrothermal Synthesis under Different Weight of Chitosan

2021 ◽  
Vol 317 ◽  
pp. 53-59
Author(s):  
Muhammad Safwan Sazali ◽  
Muhamad Kamil Yaakob ◽  
Mohamad Hafiz Mamat ◽  
Oskar Hasdinor Hassan ◽  
Muhd Zu Azhan Yahya
Keyword(s):  
Optical Properties ◽  
Single Phase ◽  
Energy Gap ◽  
Bismuth Ferrite ◽  
Secondary Phase ◽  
Synthesis Process ◽  
Rhombohedral Structure ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
Diffraction Angle

In this work, single phase Bismuth Ferrite, BiFeO3 was successfully synthesized by using hydrothermal method assisted with different weight (0.24 g, 0.36 g and 0.48 g) of Chitosan. Potassium hydroxide (KOH) were used as a mineralizer during the synthesis process for the precipitation. The samples were characterized for different properties such as structural and optical properties, and were then compared with previous works. The X-ray diffraction data for all the samples showed that the samples had a single phase belonging to R3c space group with perovskite rhombohedral structure at diffraction angle 32.0° to 32.5° even though the slight presence of secondary phase at diffraction angle 28° was detected. Scanning electron microscope revealed a decrement in particle size as the weight of Chitosan increased indicating effective used of Chitosan in controlling the agglomeration of the particles. All samples BiFeO3 assisted with and without Chitosan showed significant enhancement in energy gap where the obtained results showed a small energy gap values ranging from ~1.22 eV to ~1.88 eV determined from UV-vis absorbance characterization. Therefore, by the addition of Chitosan, the properties of BiFeO3 such as structural and optical have changed as well as preventing from the particle to agglomerate.

Structural and Morphological of Pulsed Laser Deposited Magnesium Phthalocyanine (MgPc) Thin Film

2020 ◽  
Vol 29 ◽  
pp. 15-21
Author(s):  
Noor M. Ibrahim ◽  
Eman K. Hassan
Keyword(s):  
Thin Film ◽  
Surface Morphology ◽  
Structural Characteristics ◽  
Pulsed Laser ◽  
Laser Pulses ◽  
X Ray Diffraction ◽  
Characteristic Peak ◽  
Monoclinic Form ◽  
Optimum Parameters ◽  
Diffraction Peaks

Magnesium Phthalocyanine (MgPc) was deposited on a glass substrate by pulsed laser deposition (PLD) using Q-Switching Nd: YAG laser with wavelength 1064(nm), (6Hz) Repetition rate, in addition to different laser energies (200,300,400 and 500 mJ) at room temperature under vacuum condition with (10-3torr). All films were annealed at (298K) for 1hour to attain crystallinity. X-ray diffraction of MgPc powder indicated the fact that MgPc crystallizes in polycrystalline with a monoclinic structure While comparing the MgPc of films, it’s found the intensity of characteristic peak is high as the number and energy of laser pulses increase and the crystallize is monoclinic form is observed in β-form. Miller indices, hkl, values for every one of the diffraction peaks in the spectrum of the XRD have been computed. The characteristic peak of Phthalocyanine (MgPc) is found at 2θ value 6.9137o with the hkl value of {100} for both MgPc powder and deposited thin film. The surface morphology of the films showed more uniform sized grains. EDX and FESEM analysis has shown that there has been an enhancement in the crystallinity and surface morphology as a result of the increase of laser energies and for finding the optimum parameters for which film provides more efficient structural characteristics.

Thermal and pulsed laser evaporation of single phase AsxP1−xalloys

1983 ◽  
Vol 42 (11) ◽  
pp. 952-954 ◽  
Author(s):  
G. P. Schwartz ◽  
V. E. Bondybey ◽  
J. H. English ◽  
G. J. Gualtieri
Keyword(s):  
Single Phase ◽  
Pulsed Laser ◽  
Laser Evaporation

Preparation of ZnAl2O4 Spinel Directly from Zinc Aluminum Layered Double Hydroxide Precursor

2012 ◽  
Vol 567 ◽  
pp. 127-130
Author(s):  
Jian Ye Song ◽  
Ming Zhe Leng ◽  
Xing Qi Fu ◽  
Jian Qiang Liu
Keyword(s):  
Layered Double Hydroxide ◽  
Single Phase ◽  
Structural Characteristics ◽  
Atomic Level ◽  
X Ray Diffraction ◽  
Simple Route ◽  
X Ray ◽  
Znal2o4 Spinel ◽  
Double Hydroxide ◽  
Scanning Electron

Single-phase ZnAl2O4 spinel has been prepared by a novel simple route using layered double hydroxide as a precursor. ZnAl2O4 spinel is directly obtained by calcination of zinc aluminum layered double hydroxide (Zn/Al molar radio is 0.5) without further chemical treatment. The key feature of this method is that it affords uniform distribution of all metal cations on an atomic level in the precursor. The structural characteristics of the as-synthesized precursor and the resulted calcined products are obtained by X-ray diffraction and scanning electron microscope.

Optical Characteristics of Tungsten Oxide Thin Films Prepared by Sputtering Technique

2010 ◽  
Vol 295-296 ◽  
pp. 11-17
Author(s):  
S.A. Aly
Keyword(s):  
Optical Properties ◽  
Tungsten Oxide ◽  
Energy Gap ◽  
Structural Characteristics ◽  
X Ray Diffraction ◽  
Remarkable Change ◽  
X Ray ◽  
Glass Substrates ◽  
Tungsten Oxide Thin Films ◽  
Reflectance Measurements

The optical properties of tungsten oxide (WO3) films prepared by DC sputtering on unheated glass substrates with different film thicknesses have been studied. The structural characteristics of the samples were investigated using X-ray diffraction. The optical properties of the prepared films were studied by transmittance and reflectance measurements, and the integrated transmittance (TUV, TVIS, and TNIR) and absorption (AUV, AVIS, and ANIR) in UV, VIS and NIR regions. The integrated UV absorption and transmittance are varied with the film thicknesses, also, no remarkable change in VIS and NIR regions was observed. The dependence of refractive index as well as extinction coefficient on wavelength was also reported. The energy gap was calculated and is located around 3.25 eV.

Effects of Annealing on Pulsed Laser Deposited TiO2 Thin Films

2013 ◽  
Vol 446-447 ◽  
pp. 306-311 ◽  
Author(s):  
Sudhanshu Dwivedi ◽  
Somnath Biswas
Keyword(s):  
Thin Films ◽  
Pulsed Laser ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Si Substrates ◽  
Morphological Studies ◽  
Atomic Force ◽  
Deposited Films ◽  
Type Crystal

Mixed phase TiO2 thin films of rutile and anatase type crystal orientations were deposited on Si substrates by pulsed laser deposition (PLD) technique. When annealed at 800°C at 1 mbar oxygen pressure for 3 h, the deposited films transform into a single phase of rutile type. Structural and morphological studies of the as-deposited and annealed films were performed with X-ray diffraction (XRD), Fourier transform infra-red spectroscopy (FTIR), Raman spectroscopy, and atomic force microscopy (AFM). Photoluminescence (PL) spectroscopy was used for optical characterization of the annealed thin films.

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