Exafs Studies of Cobalt Silicide Formation Produced by High Dose Ion Implantation

1988 ◽  
Vol 143 ◽  
Author(s):  
Z. Tan ◽  
J. I. Budnick ◽  
F. Sanchez ◽  
G. Tourillon ◽  
F. Namavar ◽  
...  
Keyword(s):  
Fine Structure ◽  
Ion Implantation ◽  
Single Phase ◽  
High Dose ◽  
Cobalt Silicide ◽  
Silicide Formation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Ordered Phases ◽  
X Ray Absorption

AbstractThe early stages of cobalt silicide formation in high dose (1.0 to 8.0× 1017Co/cm2) cobalt implanted Si(100) are studied by extended X-ray absorption fine structure (EXAFS), X-ray diffraction (XRD) and Rutherford backscattering spectroscopy (RBS). Locally ordered silicide that is not detectable in XRD has been observed with EXAFS in the as-implanted samples. Long-range ordered phases are observed in the 3 × 1017Co/cm2 samples. After thermal annealing at 700–750°C, single phase CoSi2 with (400) orientation is formed in all implants.

Silicide Formation in High-Dose Fe-Implanted Silicon

1991 ◽  
Vol 235 ◽  
Author(s):  
Z. Tan ◽  
F. Namavar ◽  
S. M. Heald ◽  
J. I. Budnick ◽  
F. H. Sanchez
Keyword(s):  
Fine Structure ◽  
Single Phase ◽  
Rutherford Backscattering Spectrometry ◽  
High Dose ◽  
Silicide Formation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Implantation Damage ◽  
X Ray Absorption ◽  
Post Implantation

ABSTRACTWe have studied the silicide formation in Fe-implanted Si(100), with 1×1017-1×1018 Fe/cm2, using extended x-ray-absorption fine structure (EXAFS), x-ray diffraction and Rutherford backscattering spectrometry (RBS) methods. In the samples as-implanted at 350 °C, no silicide was observed at doses below 3×1017 Fe/cm2. At 5×1017 Fe/cm2, both α-FeSi2 and (β-FeSi2 form but α-FeSi2 appears to be the majority phase. As the dose increases to 7×1017 and above, ordered FeSi forms, but implantation damage is severe and a large number of Fe atoms are in very disordered environments. In addition to FeSi, Fe5Si3 was also observed in the 1×1018 Fe/cm2 sample. Upon post-implantation annealing at 700 °C or 900 °C, single phase P-FeSi2 was obtained independent of the dosage.

Structural Study of Cu-Deficient Cu$_{2(1-x)}$ZnSnSe$_{4}$ Solar Cell Materials by X-ray Diffraction and X-ray Absorption Fine Structure

2012 ◽  
Vol 51 ◽  
pp. 10NC28 ◽  
Author(s):  
Feng Gao ◽  
Seiji Yamazoe ◽  
Tsuyoshi Maeda ◽  
Takahiro Wada
Keyword(s):  
Fine Structure ◽  
Solar Cell ◽  
Structural Study ◽  
X Ray Diffraction ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

X-ray diffraction, extended x-ray absorption fine structure and Raman spectroscopy studies of WO3 powders and (1−x)WO3−y⋅xReO2 mixtures

1998 ◽  
Vol 84 (10) ◽  
pp. 5515-5524 ◽  
Author(s):  
A. Kuzmin ◽  
J. Purans ◽  
E. Cazzanelli ◽  
C. Vinegoni ◽  
G. Mariotto
Keyword(s):  
Raman Spectroscopy ◽  
Fine Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Absorption Fine ◽  
Spectroscopy Studies ◽  
X Ray Absorption

Differentiation of biological hydroxyapatite compounds by infrared spectroscopy, x-ray diffraction and extended x-ray absorption fine structure

2001 ◽  
Vol 90 (12) ◽  
pp. 6440-6446 ◽  
Author(s):  
E. Chassot ◽  
H. Oudadesse ◽  
J. Irigaray ◽  
E. Curis ◽  
S. Bénazeth ◽  
...  
Keyword(s):  
Fine Structure ◽  
Infrared Spectroscopy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

A furnace to 1200 K for in situ heating x-ray diffraction, small angle x-ray scattering, and x-ray absorption fine structure experiments

2008 ◽  
Vol 79 (12) ◽  
pp. 126101 ◽  
Author(s):  
Quan Cai ◽  
Qiang Wang ◽  
Wei Wang ◽  
Guang Mo ◽  
Kunhao Zhang ◽  
...  
Keyword(s):  
Fine Structure ◽  
Small Angle ◽  
X Ray Diffraction ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Scattering ◽  
In Situ Heating ◽  
X Ray Absorption ◽  
Ray Scattering

EFFECT OF HEAT TREATMENT ON MICROSTRUCTURE AND MAGNETOSTRICTIVE PROPERTY OF MELT-SPUN Fe85Ga15 RIBBONS

2013 ◽  
Vol 27 (30) ◽  
pp. 1350174 ◽  
Author(s):  
HAO LIU ◽  
HAIOU WANG ◽  
MENGXIONG CAO ◽  
WEISHI TAN ◽  
YANGGUANG SHI ◽  
...  
Keyword(s):  
Heat Treatment ◽  
Fine Structure ◽  
High Resolution ◽  
Nearest Neighbor ◽  
Annealed Sample ◽  
X Ray Diffraction ◽  
X Ray ◽  
Absorption Fine ◽  
Melt Spun ◽  
X Ray Absorption

In order to study the microstructure of Fe – Ga alloy, Fe 85 Ga 15 ribbons prepared with different wheel velocity were studied by high resolution X-ray diffraction (HRXRD) and extend X-ray absorption fine structure (EXAFS). HRXRD patterns showed that only disordered A 2 phase was observed in as-cast Fe 85 Ga 15 alloy. A modified- DO 3 phase was detected in all of the melt spun samples. The HRXRD associated with EXAFS results indicated that Ga atoms were located as second-nearest neighbor along [100] orientation. A little DO 3 phase was found in ribbons annealed at 1000°C under 0.06 MPa Ar atmosphere. The result of magnetostriction measurement revealed that in the ribbon prepared with higher wheel velocity, more modified- DO 3 phase will enhance the magnetostriction. DO 3 phase in the annealed sample will deteriorate the magnetostrictive properties of Fe – Ga ribbons.

SITE MULTIPLICITY OF RARE EARTH IONS IN III-NITRIDES

2004 ◽  
Vol 831 ◽  
Author(s):  
K.P. O'Donnell ◽  
V. Katchkanov ◽  
K. Wang ◽  
R.W. Martin ◽  
P.R. Edwards ◽  
...  
Keyword(s):  
Fine Structure ◽  
Rare Earth ◽  
Ion Implantation ◽  
Electron Emission ◽  
Optical Spectra ◽  
Rare Earth Ions ◽  
Lattice Location ◽  
X Ray ◽  
Low Concentrations ◽  
X Ray Absorption

ABSTRACTThis presentation reviews recent lattice location studies of rare earth (RE) ions in GaN by electron emission channelling (EC) and X-ray absorption fine structure (XAFS) techniques. These studies agree that RE ions at low concentrations (whether they are incorporated during growth or introduced later by ion implantation) predominantly occupy Ga substitutional sites, as expected from considerations of charge equivalence. We combine this result with some examples of the well-documented richness of optical spectra of GaN:RE3+ to suggest that the luminescence of these materials may be ascribed to a family of rather similar sites, all of which feature the REGa defect.

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