High Performance Photoluminescence Spectroscopy using Fourier Transform Interferometry
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AbstractWe present recent results on the applications of Fourier transform techniques to photoluminescence spectroscopy as it relates to both basic and characterization-related semiconductor research. The emphasis here is on demonstrating the advantages of these methods in situations requiring very high spectral resolution and/or very high sensitivity. We also provide an example of the utility of interferometry in performing photoluminescence excitation spectroscopy in spectral regions where broadly tunable laser sources are not readily available.
2014 ◽
Vol 7
(3)
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pp. 2301-2337
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2014 ◽
Vol 7
(10)
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pp. 3565-3577
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1990 ◽
Vol 115
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pp. 94-109
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2020 ◽
1984 ◽
Vol 79
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pp. 497-497
2000 ◽
Vol 175
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pp. 174-177
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