High Tc Superconductor Films Grown by the Liquid Phase Epitaxial Technique

1989 ◽  
Vol 169 ◽  
Author(s):  
C. S. Yang ◽  
A. S. Yue
Keyword(s):  
Liquid Phase ◽  
Cross Sections ◽  
X Ray Diffraction ◽  
High Tc ◽  
Liquid Phase Epitaxial ◽  
X Ray ◽  
Diffraction Patterns ◽  
High Degree ◽  
Superconductor Films

AbstractHigh Tc superconducting YBa2Cu3O7 films have been prepared by the Liquid Phase Epitaxial (LPE) technique. The x‐ray diffraction patterns displayed a high degree of (00l) preferred orientations with c‐axes perpendicular to the film surfaces. The in‐situ grown YBa2Cu3O7 films showed zero‐resistivity at 76*K. Examination of the film cross sections by SEM revealed a growth mechanism.

In situ coupling of atomic force microscopy and sub-micrometer focused X-ray techniques

2014 ◽  
Vol 1712 ◽  
Author(s):  
Thomas W. Cornelius ◽  
Zhe Ren ◽  
Francesca Mastropietro ◽  
Simon Langlais ◽  
Anton Davydok ◽  
...  
Keyword(s):  
Mechanical Response ◽  
Elemental Distribution ◽  
X Ray Diffraction ◽  
X Ray ◽  
Cu Nanowires ◽  
Force Microscopy ◽  
Indentation Tests ◽  
Scanning Force ◽  
Diffraction Patterns

ABSTRACTA scanning force microscope for in situ nanofocused X-ray studies (SFINX) has been developed which can be installed on diffractometers at synchrotron beamlines allowing for the combination with various techniques such as coherent X-ray diffraction and fluorescence. The capabilities of this device are demonstrated on Cu nanowires and on Au islands grown on sapphire (0001). The sample topography, crystallinity, and elemental distribution of the same area are investigated by recording simultaneously an AFM image, a scanning X-ray diffraction map, and a fluorescence map. Additionally, the mechanical response of Au islands is studied by in situ indentation tests employing the AFM-tip and recording 2D X-ray diffraction patterns during mechanical loading.

Phase Transformations in the Brazing Joint during Transient Liquid Phase Bonding of a γ-TiAl Alloy Studied with In Situ High-Energy X-Ray Diffraction

2018 ◽  
Vol 941 ◽  
pp. 943-948
Author(s):  
Katja Hauschildt ◽  
Andreas Stark ◽  
Hilmar Burmester ◽  
Ursula Tietze ◽  
Norbert Schell ◽  
...  
Keyword(s):  
Liquid Phase ◽  
Materials Science ◽  
Transient Liquid Phase ◽  
High Energy ◽  
Transient Liquid Phase Bonding ◽  
X Ray Diffraction ◽  
Energy Materials ◽  
Joint Region ◽  
X Ray

TiAl alloys are increasingly used as a lightweight material, for example in aero engines, which also leads to the requirement for suitable repair techniques. Transient liquid phase bonding is a promising method for the closure of cracks (in non-critical or non-highly loaded areas). The brazing solder Ti-24Ni was investigated for brazing the alloy Ti-45Al-5Nb-0.2B-0.2C (in at. %). After brazing, the joint exhibits different microstructures and phase compositions. The transient liquid phase bonding process was investigated in the middle of the joint region in situ to acquire time resolved information of the phases, their development, and thus the brazing process. These investigations were performed using high-energy X-ray diffraction at the “High-Energy Materials Science” beamline HEMS, located at the synchrotron radiation facility PETRA III at DESY in Hamburg, Germany. For this, we used an induction furnace, which is briefly described here. During the analysis of the diffraction data with Rietveld refinement, the amount of liquid was refined with Gaussian peaks and thus could be quantified. Furthermore, while brazing four different phases occurred in the middle of the joint region over time. Additionally, the degree of ordering of the βo phase was determined with two ideal stoichiometric phases (completely ordered and disordered). Altogether, the phase composition changed clearly over the first six hours of the brazing process.

Development of an in situ synchrotron X-ray total scattering setup under pressurized hydrogen gas

2018 ◽  
Vol 51 (3) ◽  
pp. 796-801 ◽  
Author(s):  
Kouji Sakaki ◽  
Hyunjeong Kim ◽  
Akihiko Machida ◽  
Tetsu Watanuki ◽  
Yoshinori Katayama ◽  
...  
Keyword(s):  
Pair Distribution Function ◽  
Hydrogen Gas ◽  
Ex Situ ◽  
Sample Holder ◽  
Hydrogen Storage Materials ◽  
X Ray Diffraction ◽  
Total Scattering ◽  
X Ray ◽  
Diffraction Patterns

This article describes the development of an in situ gas-loading sample holder for synchrotron X-ray total scattering experiments, particularly for hydrogen storage materials, designed to collect diffraction and pair distribution function (PDF) data under pressurized hydrogen gas. A polyimide capillary with a diameter and thickness of 1.4 and 0.06 mm, respectively, connected with commercially available Swagelok fittings was used as an in situ sample holder. Leakage tests confirmed that this sample holder allows 3 MPa of hydrogen gas pressure and 393 K to be achieved without leakage. Using the developed in situ sample holder, significant background and Bragg peaks from the sample holder were not observed in the X-ray diffraction patterns and their signal-to-noise ratios were sufficiently good. The PDF patterns showed sharp peaks in the r range up to 100 Å. The results of Rietveld and PDF refinements of Ni are consistent with those obtained using a polyimide capillary (1.0 mm diameter and 0.04 mm thickness) that has been used for ex situ experiments. In addition, in situ synchrotron X-ray total scattering experiments under pressurized hydrogen gas up to 1 MPa were successfully demonstrated for LaNi4.6Cu.

scholarly journals A Flow-Through Reaction Cell for Studying Minerals Leaching by In-Situ Synchrotron Powder X-ray Diffraction

Minerals ◽  
2020 ◽  
Vol 10 (11) ◽  
pp. 990
Author(s):  
Fatemeh Nikkhou ◽  
Fang Xia ◽  
Xizhi Yao ◽  
Idowu A. Adegoke ◽  
Qinfen Gu ◽  
...  
Keyword(s):  
Flow Rate ◽  
Pressure Leaching ◽  
X Ray Diffraction ◽  
Reaction Cell ◽  
Time Resolved ◽  
X Ray ◽  
Ore Minerals ◽  
Flow Through ◽  
Diffraction Patterns

A flow-through reaction cell has been developed for studying minerals leaching by in-situ time-resolved powder X-ray diffraction, allowing for a better understanding of the leaching mechanisms and kinetics. The cell has the capability of independent control of temperature (up to 95 °C) and flow rate (>0.5 mL min−1) for atmospheric pressure leaching. It was successfully tested at the powder diffraction beamline at the Australian Synchrotron. Galena powder was leached in a citrate solution under flow-through condition at a flow rate of 0.5 mL min−1, while diffraction patterns were collected during the entire leaching process, showing rapid galena dissolution without the formation of secondary mineral phases. The flow-through cell can be used to study leaching processes of other ore minerals.

scholarly journals In-situhigh-pressure powder X-ray diffraction study of α-zirconium phosphate

2014 ◽  
Vol 70 (3) ◽  
pp. 510-516
Author(s):  
Jennifer E. Readman ◽  
Alistair Lennie ◽  
Joseph A. Hriljac
Keyword(s):  
High Pressure ◽  
Synchrotron Radiation ◽  
Zirconium Phosphate ◽  
Water Molecules ◽  
X Ray Diffraction ◽  
X Ray ◽  
Additional Water ◽  
Diffraction Patterns ◽  
Layered Phosphate

The high-pressure structural chemistry of α-zirconium phosphate, α-Zr(HPO4)2·H2O, was studied usingin-situhigh-pressure diffraction and synchrotron radiation. The layered phosphate was studied under both hydrostatic and non-hydrostatic conditions and Rietveld refinement carried out on the resulting diffraction patterns. It was found that under hydrostatic conditions no uptake of additional water molecules from the pressure-transmitting medium occurred, contrary to what had previously been observed with some zeolite materials and a layered titanium phosphate. Under hydrostatic conditions the sample remained crystalline up to 10 GPa, but under non-hydrostatic conditions the sample amorphized between 7.3 and 9.5 GPa. The calculated bulk modulus,K0= 15.2 GPa, showed the material to be very compressible with the weak linkages in the structure of the type Zr—O—P.

Application of Gel Technology in Preparation of High-Tc Perovskite Superconductors

1987 ◽  
Vol 99 ◽  
Author(s):  
R. S. Liu ◽  
G. C. Lin ◽  
H. M. Sung ◽  
Y. C. Chen ◽  
O. C. C. Lin
Keyword(s):  
Magnetic Properties ◽  
Magnetic Susceptibility ◽  
Diffraction Analysis ◽  
Dicarboxylic Acids ◽  
X Ray Diffraction ◽  
Chemical Homogeneity ◽  
High Tc ◽  
X Ray ◽  
Electrical And Magnetic Properties ◽  
High Degree

ABSTRACTLa-Ba-Cu-O and Y-Ba-Cu-O superconducting systems have been successfully prepared by gel techniques with high degree of chemical homogeneity. The precursor gel was synthesized from mixture of the corresponding metallic nitrates and di-carboxylic acids. The sintered oxides prepared from the different dicarboxylic acids were all Tc = 90K perovskite superconductors. However differences in electrical and magnetic properties were also observed. Effects due to the different acids elucidated by magnetic susceptibility measurements and X-ray diffraction analysis will be discussed.

Statistical measures of spottiness in diffraction rings

2013 ◽  
Vol 47 (1) ◽  
pp. 166-172 ◽  
Author(s):  
Bridget Ingham
Keyword(s):  
Carbon Dioxide ◽  
Size Distribution ◽  
Intensity Variation ◽  
Incident Beam ◽  
Mean Square ◽  
X Ray Diffraction ◽  
X Ray ◽  
Statistical Measures ◽  
Diffraction Patterns

Spotty diffraction rings arise when the size distribution of crystallites illuminated by the incident beam includes crystallites that are large compared with the size of the beam. In this article, several statistical measures are used in conjunction to quantify spottiness and relate it to a crystallite size distribution: the number of peaks, the normalized root mean square intensity variation and the fractal dimension. These are demonstrated by way of example using synchrotron X-ray diffraction patterns collected duringin situcorrosion of mild steel in carbon dioxide-saturated aqueous brine.

In Situ X-Ray Diffraction Study of Thermal Stability of Cu and Cu-Zr Samples Processed by ECAP

2013 ◽  
Vol 753 ◽  
pp. 279-284 ◽  
Author(s):  
Radomír Kužel ◽  
Zdeněk Matěj ◽  
Miloš Janeček
Keyword(s):  
In Situ Measurements ◽  
X Ray Diffraction ◽  
X Ray ◽  
Abnormal Growth ◽  
Angular Pressing ◽  
Dislocation Densities ◽  
Diffraction Patterns ◽  
Number Of Passes ◽  
Thermal Stability Of

X-ray diffraction (XRD) studies of ECAP (equal-channel angular pressing) materials were performed after annealing and by in-situ measurements in XRD high-temperature chamber for samples prepared by different number of passes and number of revolutions, respectively. Main attention was given to Cu and Cu-Zr samples. Significant dependence on number of passes was found for ECAP samples. In-situ measurements were focused not only on temperature dependence but also on time evolution of the diffraction line profiles. Evaluation in terms of dislocation densities, correlation and crystallite size and its distribution was performed by our own software MSTRUCT developed for total powder diffraction pattern fitting. Abnormal growth of some grains with annealing is well-known for copper and leads to the creation of bimodal microstructure. Therefore a special care must be given to the evaluation and a model of two Cu components (larger and smaller crystallites) was fitted to the data if an indication of some crystallite growth appears either in the XRD line profile shape or in two-dimensional diffraction patterns.

scholarly journals Aspect ratio of liquid phase epitaxial SiGe∕Si(001) islands as probed by high resolution x-ray diffraction

2004 ◽  
Vol 96 (3) ◽  
pp. 1447-1450 ◽  
Author(s):  
M. Hanke ◽  
M. Schmidbauer ◽  
D. Grigoriev ◽  
R. Köhler
Keyword(s):  
Liquid Phase ◽  
High Resolution ◽  
Aspect Ratio ◽  
X Ray Diffraction ◽  
Liquid Phase Epitaxial ◽  
X Ray

Mask-Induced Strain in Gaas Layers Grown by Liquid Phase Epitaxial Lateral Overgrowth

1999 ◽  
Vol 570 ◽  
Author(s):  
Z.R. Zytkiewicz ◽  
J. Domagala ◽  
D. Dobosz
Keyword(s):  
Liquid Phase ◽  
Epitaxial Lateral Overgrowth ◽  
X Ray Diffraction ◽  
Liquid Phase Epitaxial ◽  
X Ray ◽  
Vertical Strain ◽  
Lateral Overgrowth ◽  
Gaas Substrates ◽  
Show Evidence ◽  
Vertical Growth Rate

ABSTRACTX-ray diffraction has been used to study the mask-induced strain in GaAs layers grown by the liquid phase epitaxial lateral overgrowth (ELO) on (100) GaAs substrates. SiO2 mask has been investigated to produce seeding areas for the ELO growth. It has been found that SiO2 attracts the ELO layers, which leads to their pronounced bending towards the oxide film and to the appearance of vertical strain in laterally grown parts of ELO. When SiO2 is removed by selective etching this strain disappears. We show evidence that the bending of ELO layers is reduced when the density of substrate dislocations is increased. This is explained as being due to enhancement of the initial vertical growth rate by dislocations supplying steps on the upper surface of ELO.

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