Effect of Ta on the Structure and Dynamics of γ/α2 Interfaces in Tial

1990 ◽  
Vol 213 ◽  
Author(s):  
S. R. Singh ◽  
J. M. Howe
Keyword(s):  
Partial Dislocation ◽  
Growth Mechanisms ◽  
Tial Alloys ◽  
Shockley Partial ◽  
Structure And Dynamics ◽  
Partial Dislocations ◽  
Α2 Phase ◽  
Atomically Flat ◽  
Ledge Mechanism ◽  
Image Simulations

ABSTRACTThe structure of γ/α interfaces in binary and Ta-containing TiAl alloys were analyzed by HRTEM and image simulations. Growth of α2 was found to be due to a ledge mechanism, consisting of Shockley partial dislocations on alternate (111)γ planes. The interface is atomically flat between the ledges and addition of Ta was found to transform arrays of growth ledges in the binary alloy into islands on the plate faces in the Ta-containing alloy. These islands of α2 on the γ/α2 interfaces were 4–7nm wide and increased in size with decreasing ageing temperature. The height of the ledges and islands were always a multiple of the c-parameter (0.46nm) of the α2 phase. The islands were bounded by 90°(edge) and 30° screw) Shockley partial dislocations. The 30° partial dislocation cores were localized whereas the 90° partial dislocation cores appeared to be highly delocalized due to presence of a high density of kinks, which in one case was found to be about 0.65nm−1.These results are interpreted in terms of the growth mechanisms and morphology of the α2 phase.

Deformation-induced α2 ↔ γ phase transformation in a Ti–48Al–2Cr alloy

2000 ◽  
Vol 15 (10) ◽  
pp. 2145-2150 ◽  
Author(s):  
J. X. Zhang ◽  
H. Q. Ye
Keyword(s):  
Electron Microscopy ◽  
Phase Transformation ◽  
Lattice Misfit ◽  
Hrem Image ◽  
Shockley Partial ◽  
Partial Dislocations ◽  
Transmission Electron ◽  
Ledge Mechanism ◽  
Related Process ◽  
Image Simulations

The structure of γ–α2 interfaces in deformed Ti–48Al–2Cr alloy was analyzed by high-resolution transmission electron microscopy (HREM) and image simulations. Growth of γ–TiAl plate in α2–Ti3Al phase was found to be a result of a ledge mechanism consisting of Shockley partial dislocations on alternate (0001)α2 planes. The height of the ledges was always a multiple of two (0001)α2 planes. The γ → α2 phase transformation was also an interface-related process. Large ledges of six close packed planes (111)γ high were often observed at the γ–α2 interface. Every large ledge consisted of six Shockley partial dislocations that originated from the γ–a2 interfacial lattice misfit. The movement of these partial dislocations accomplished the transformation of γ → α2 phase. Comparing the experimental and simulated HREM image, it was found that atomic reordering appears during the deformation-induced γ↔α2 transformation.

Observation of dislocation reactions in CDTE at lattice resolution

1983 ◽  
Vol 41 ◽  
pp. 112-113
Author(s):  
T. Yamashita ◽  
R. Sinclair
Keyword(s):  
Partial Dislocation ◽  
Video Recording ◽  
Dislocation Motion ◽  
Video Tape ◽  
Exposure Rate ◽  
Shockley Partial Dislocation ◽  
Shockley Partial ◽  
Partial Dislocations ◽  
Lattice Resolution ◽  
Obvious Extension

Recently, lattice resolution video-recording of dislocation motion in CdTe has been reported by Sinclair et al, using the Cambridge 500 keV microscope equipped with a TV camera. Phenomena such as the motion of Shockley partial dislocations and climb of Frank dislocations were recorded onto a video tape which has an exposure rate of 50 half-frames per second. An obvious extension of this work is to study the dislocation reactions. An example of such a reaction which was detected in CdTe is shown in Fig. 1. The micrographs were taken several seconds apart in a JEOL 200CX microscope, and they show dissociation of a Frank dislocation into a Shockley partial dislocation and a Lomer dislocation (ie., a sessile lock).

Synchrotron Topography Studies of Growth and Deformation-Induced Dislocations in 4H-SiC

2012 ◽  
Vol 1433 ◽  
Author(s):  
M. Dudley ◽  
H. Wang ◽  
F. Wu ◽  
S. Byrappa ◽  
S. Shun ◽  
...  
Keyword(s):  
Crystal Growth ◽  
Single Crystals ◽  
Basal Plane ◽  
Partial Dislocation ◽  
Reversible Process ◽  
Burgers Vector ◽  
Shockley Partial ◽  
Partial Dislocations ◽  
Equilibrium Concentrations ◽  
Dislocation Multiplication

ABSTRACTSynchrotron topography studies are presented of the behavior of growth dislocations and deformation-induced dislocations in 4H-SiC single crystals. The growth dislocations include those in threading orientation with line directions approximately along c with Burgers vectors of a, c, and na+mc (where n and m are integers) while the deformation-induced dislocations include those with line directions confined to the basal plane with Burgers vectors of a and Shockley partial dislocations with Burgers vectors of 1/3<1-100> as well as those with line directions in the {1-100} prismatic planes with Burgers vectors of a. Processes leading to the nucleation of the growth dislocations are discussed as well as their deflection onto the basal plane during crystal growth in a reversible process. This latter process can lead to the conversion of segments of the deflected growth dislocations into deformation induced dislocations. In some cases this can lead to dislocation multiplication via the Hopping Frank-Read source mechanism and in others to the motion of single Shockley partial dislocations leading to Shockley stacking fault expansion. Studies are also presented of interactions between threading growth dislocations with c-component of Burger’s vector facilitated by climb processes which are mediated by interactions with non-equilibrium concentrations of vacancies. This can lead to reactions whereby complete or partial dislocation Burgers vector annihilation occurs.

Creation of Dislocations in a Shall Copper Single Crystal

1992 ◽  
Vol 278 ◽  
Author(s):  
Masao Doyama
Keyword(s):  
Single Crystal ◽  
Yield Stress ◽  
Partial Dislocation ◽  
Stacking Fault ◽  
Copper Single Crystal ◽  
Shockley Partial ◽  
Partial Dislocations ◽  
Edge Dislocations

AbstractEdge dislocations were created on a surface of a small copper single crystal. Very sharp yield stress was observed when a partial dislocation was created. Edge dislocations in copper were split into Heidenreich–Shockley partial dislocations connected with the stacking fault.

Interaction between Recombination Enhanced Dislocation Glide Process Activated Basal Stacking Faults and Threading Dislocations in 4H-Silicon Carbide Epitaxial Layers

2007 ◽  
Vol 994 ◽  
Author(s):  
Yi Chen ◽  
Michael Dudley ◽  
Kendrick X Liu ◽  
Robert E Stahlbush
Keyword(s):  
Silicon Carbide ◽  
Partial Dislocation ◽  
Displacement Vector ◽  
Stacking Faults ◽  
Epitaxial Layers ◽  
Threading Dislocations ◽  
Screw Dislocations ◽  
Dislocation Glide ◽  
Shockley Partial ◽  
Partial Dislocations

AbstractElectron-hole recombination enhanced glide of Shockley partial dislocations bounding expanding stacking faults and their interactions with threading dislocations in 4H silicon carbide epitaxial layers have been studied using synchrotron white beam X-ray topography and in situ electroluminescence. The mobile silicon-core Shockley partial dislocations bounding the stacking faults are able to cut through threading edge dislocations leaving no trailing dislocation segments in their wake. However, when the Shockley partial dislocations interact with threading screw dislocations, trailing 30o partial dislocation dipoles are initially deposited in their wake due to the pinning effect of the threading screw dislocations. These dipoles spontaneously snap into their screw orientation, regardless the normally immobile carbon-core Shockley partial dislocation components in the dipoles. They subsequently cross slip and annihilate, leaving a prismatic stacking fault in (2-1-10) plane with the displacement vector 1/3[01-10].

Transformation–dislocation dipoles in Laves phases: A high-resolution transmission electron microscopy analysis

2010 ◽  
Vol 25 (10) ◽  
pp. 1983-1991 ◽  
Author(s):  
J. Aufrecht ◽  
A. Leineweber ◽  
V. Duppel ◽  
E.J. Mittemeijer
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Partial Dislocation ◽  
Laves Phases ◽  
Dislocation Configuration ◽  
Shockley Partial Dislocation ◽  
Shockley Partial ◽  
Partial Dislocations ◽  
Transmission Electron

Images of synchro-Shockley partial dislocation arrangements in the Laves phases NbCr2 and HfCr2 have been obtained by high-resolution transmission electron microscopy. The analysis of the stacking sequences around these arrangements revealed the role of the constituting partial dislocations in enabling the polytypic C14 → C36/6H phase transformation in both alloys. The synchro-Shockley partial dislocations occur in and move through the crystals mainly as dipoles of partials of opposite signs, leading to—as compared to isolated partials—strain fields of lesser extent. In NbCr2 a single, probably quenched synchro-Shockley partial dislocation dipole, consisting of two partials with Burgers vectors of opposite sign, was identified. The ordered passage of a series of this type of line defects brings about the C14 → C36 transformation. In HfCr2 a complex synchro-Shockley partial dislocation configuration was revealed. It can be regarded as an “antiphase boundary” between two C36 domains. It is likely that this defect structure had formed by impingement of two domains of C36 growing perpendicular to the stacking direction by glide of synchro-Shockley partial dislocation dipoles.

scholarly journals Shrinking stacking fault through glide of the Shockley partial dislocation in hard-sphere crystal under gravity

2007 ◽  
Vol 105 (10) ◽  
pp. 1377-1383 ◽  
Author(s):  
Atsushi Mori ◽  
Yoshihisa Suzuki ◽  
Shin-Ichiro Yanagiya ◽  
Tsutomu Sawada ◽  
Kensaku Ito
Keyword(s):  
Hard Sphere ◽  
Partial Dislocation ◽  
Stacking Fault ◽  
Shockley Partial Dislocation ◽  
Shockley Partial

Deformation Twins Formed in Nanocrystalline Materials

2006 ◽  
Vol 503-504 ◽  
pp. 125-132 ◽  
Author(s):  
Yuntian T. Zhu
Keyword(s):  
Grain Boundaries ◽  
Nanocrystalline Materials ◽  
Partial Dislocation ◽  
Room Temperature ◽  
High Pressure Torsion ◽  
Nucleation And Growth ◽  
Analytical Models ◽  
Partial Dislocations ◽  
Deformation Twins ◽  
Low Strain Rate

Deformation twins have been oberved in nanocrystalline (NC) Al synthsized by cryogenic ball-milling and in NC Cu processed by high-pressure torsion under room temperature and at a very low strain rate. They were found formed by partial dislocations emitted from grain boundaries. This paper first reviews experimental evidences on deformation twinning and partial dislocation emissions from grain boundaries, and then discusses recent analytical models on the nucleation and growth of deformation twins. These models are compared with experimental results to establish their validity and limitations.

Shockley Partial Dislocation-Induced Self-Rectified 1D Hydrogen Evolution Photocatalyst

2019 ◽  
Vol 11 (22) ◽  
pp. 20521-20527 ◽  
Author(s):  
Zhonghui Han ◽  
Weizhao Hong ◽  
Weinan Xing ◽  
Yidong Hu ◽  
Yansong Zhou ◽  
...  
Keyword(s):  
Hydrogen Evolution ◽  
Partial Dislocation ◽  
Shockley Partial Dislocation ◽  
Shockley Partial
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