Beam-Recrystallized Device-Worthy Films of Si on SiO2 via Control of the Grain Boundary Location
Keyword(s):
ABSTRACTDevice-worthy films of silicon on SiO2 have been produced using laser annealing and antireflection stripes. If no seeding is used, grain boundaries will be localized beneath the stripes; with seeding, large-area single crystals can be grown, of uniform <100> orientation. N-channel transistors show a mobility of 620 cm2/V.s and present leakage currents which can be reduced, however, down to a few pA/um when the substrate (back gate) is negatively biased to − 5 V. Ring oscillators have also been made, which oscillate with a delay per stage of 1 nsec.
2012 ◽
Vol 715-716
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pp. 191-196
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2015 ◽
Vol 60
(1)
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pp. 371-375
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2004 ◽
Vol 467-470
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pp. 763-770
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2011 ◽
Vol 702-703
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pp. 639-642
2018 ◽