High Resolution Electron Microscopy Observations About The Interface Structure In A Ti/TiN Multilayer Material
Keyword(s):
ABSTRACTThe interface structure in a Ti/TiN multilayer material has been investigated by high resolution transmission electron microscopy (HRTEM). It was shown that the α-Ti and β-TiN layers consisted of many cylindrical crystals growing along the close packed directions normal to the surface of a stainless steel. There existed specific orientation relationship at the Ti/TiN interfaces without transition layers: (111)TiN ‖ (001)Ti, [110]TiN ‖ [100]Ti. However there was no such orientation relationship at the Ti/TiN interfaces with TixN (x >1) transition layers.
1990 ◽
Vol 48
(4)
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pp. 242-243
2013 ◽
Vol 456
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pp. 533-536
1993 ◽
Vol 8
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pp. 1019-1027
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