Creep in Polycrystalline Aluminum

Grain Boundary ◽

Triple Point ◽

Tensile Strain ◽

Boundary Migration ◽

Local Strain ◽

Polycrystalline Aluminum ◽

ABSTRACTThis paper presents a study of creep in polycrystalline aluminum. The sample was deformed in a scanning electron microscope and local strain was measured by analyzing micrographs taken during the test. EBSP was used to examine grain curvature and recrystallization The results showed that tensile strain developed during the test. The strain was not constant but varied both spatially and with time. Significant grain boundary migration occurred during the test, and near a triple point a grain with a completely new orientation was formed.

Microstructure-Dependent Local Strain Behavior in Polycrystals through In-Situ Scanning Electron Microscope Tensile Experiments

Metallurgical and Materials Transactions A ◽

10.1007/s11661-009-9938-6 ◽

2009 ◽

Vol 40 (10) ◽

pp. 2363-2368 ◽

Cited By ~ 61

Author(s):

M.A. Tschopp ◽

B.B. Bartha ◽

W.J. Porter ◽

P.T. Murray ◽

S.B. Fairchild

Keyword(s):

Electron Microscope ◽

Local Strain ◽

Strain Behavior ◽

Proceedings of the Royal Society of London Series A - Mathematical and Physical Sciences ◽

The recrystallization process in some polycrystalline metals

10.1098/rspa.1962.0080 ◽

1962 ◽

Vol 267 (1328) ◽

pp. 11-30 ◽

Cited By ~ 279

Keyword(s):

Activation Energy ◽

Electron Microscope ◽

Grain Boundary ◽

Grain Boundaries ◽

Boundary Migration ◽

Recrystallization Process ◽

Boundary Mobility ◽

Grain Boundary Mobility ◽

Polycrystalline Metals

Electron microscope observations on some polycrystalline metals suggest that after small to moderate deformation, recrystallization occurs by the migration of the original grain boundaries. A theory based on this mechanism can account for the known form of the recrystallization kinetics without necessarily introducing any anisotropy of grain boundary mobility. For this mechanism the so-called recrystallization activation energy is identical to the activation energy for grain boundary migration.

Etching channels and grain-boundary grooves on ice surfaces in the scanning electron microscope

Journal of Glaciology ◽

10.3189/172756506781828331 ◽

2006 ◽

Vol 52 (179) ◽

pp. 645-648

Author(s):

Piers R.F. Barnes ◽

Eric W. Wolff ◽

David C. Mallard

Keyword(s):

Electron Microscope ◽

Grain Boundary ◽

Ice Surfaces ◽

Grain Boundary Grooves ◽

Transmission Electron Microscope Observations of Lattice Defects Produced During Diffusion Induced Grain Boundary Migration

MRS Proceedings ◽

10.1557/proc-122-213 ◽

1988 ◽

Vol 122 ◽

Author(s):

Re-Jehn Jahn ◽

A.H. King

Keyword(s):

Electron Microscope ◽

Grain Boundary ◽

Transmission Electron Microscope ◽

Boundary Migration ◽

Lattice Defects ◽

Transmission Electron

Probing local strain fields using electron diffraction in the scanning electron microscope

Electron Microscopy and Analysis 1997 ◽

10.1201/9781003063056-58 ◽

2022 ◽

pp. 221-226

Author(s):

Angus J Wilkinson

Keyword(s):

Electron Microscope ◽

Electron Diffraction ◽

Local Strain ◽

Strain Fields ◽

SEM/EDS observations of impurities in polar ice: artifacts or not?

Journal of Glaciology ◽

10.3189/172756503781830773 ◽

2003 ◽

Vol 49 (165) ◽

pp. 184-190 ◽

Cited By ~ 19

Author(s):

Ian Baker ◽

Daniel Cullen

Keyword(s):

Electron Microscope ◽

Grain Boundary ◽

Grain Boundaries ◽

Specimen Preparation ◽

Polar Ice ◽

Series Of Experiments ◽

AbstractA series of experiments was undertaken to determine the origin of filaments found in grain boundaries and impurity spots found in grain interiors of polar ice during observation in the scanning electron microscope. It is shown that although the filaments are artifacts, they demonstrate the presence of impurities segregated to the grain boundary planes. It is also demonstrated that the impurities observed in the grain interior reside there and were not transported from the grain boundaries during specimen preparation or observation.

In Situ Observations and Measurements of Mechanically Induced Grain Boundary Migration in a Scanning Electron Microscope

Materials Science Forum ◽

10.4028/www.scientific.net/msf.715-716.819 ◽

2012 ◽

Vol 715-716 ◽

pp. 819-824 ◽

Cited By ~ 3

Author(s):

Tatiana Gorkaya ◽

Thomas Burlet ◽

Dmitri A. Molodov ◽

Günter Gottstein

Keyword(s):

Shear Stress ◽

Grain Boundary ◽

Elevated Temperatures ◽

Boundary Migration ◽

Orientation Contrast ◽

In Situ Observations ◽

Set Up ◽

A novel set-up developed to continuously observe and measure stress driven grain boundary migration is presented. A commercially available tensile/compression SEM unit was utilized for in-situ observations of mechanically loaded samples at elevated temperatures up to 850°C by recording orientation contrast images of bicrystal surfaces. Two sample holders for application of a shear stress to the boundary in bicrystals of different geometry were designed and fabricated. The results of first measurements are presented.