Electronic Bandgap and Refractive Index Dispersion of Single Crystalline Epitaxial ZnGeN2

1999 ◽  
Vol 607 ◽  
Author(s):  
L.D. Zhu ◽  
P.E. Norris ◽  
L.O. Bouthillette
Keyword(s):  
Refractive Index ◽  
Band Gap ◽  
Room Temperature ◽  
Band Gap Energy ◽  
Organic Chemical ◽  
Refractive Index Dispersion ◽  
Electronic Band ◽  
Single Crystalline ◽  
Gap Energy ◽  
Prism Coupling

AbstractThe electronic band gap of single crystalline ZnGeN2 epitaxial layer grown on sapphire substrate by metal organic chemical vapor deposition has been measured by optical transmission and room temperature photoluminescence. The band gap energy is 2.99eV at room temperature, and the band gap is a direct transition type. The interference oscillations of the transmission spectra together with rutile prism coupling measurements have been used to determine the r fractive index and the dispersion characteristics of the single crystal ZnGeN2 below the band gap energy. The rutile prism coupling measurement displays the wave guide modes of the film at 6 2.8nm wavelength of the He-Ne laser, enabling determination of the film thickness and refractive index precisely at the wavelength. The refractive index of ZnGeN2 crystal is 2.35 at 6328Å wavelength. The measured refractive index dispersion curve can be fitted with the first-order Sellmeier equation n2(λ) = A + λ2/(λ2-B), using fitting parameters A=4.3 1, B=0.076.

Modification of optical properties of PC-PBT/Cr2O3 and PC-PBT/CdS nanocomposites by gamma irradiation

2020 ◽  
Vol 92 (2) ◽  
pp. 20402
Author(s):  
Kaoutar Benthami ◽  
Mai ME. Barakat ◽  
Samir A. Nouh
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Band Gap ◽  
Color Difference ◽  
Band Gap Energy ◽  
Polybutylene Terephthalate ◽  
Γ Irradiation ◽  
Gap Energy ◽  
Vis Spectroscopy ◽  
Oxygen Atoms

Nanocomposite (NCP) films of polycarbonate-polybutylene terephthalate (PC-PBT) blend as a host material to Cr2O3 and CdS nanoparticles (NPs) were fabricated by both thermolysis and casting techniques. Samples from the PC-PBT/Cr2O3 and PC-PBT/CdS NCPs were irradiated using different doses (20–110 kGy) of γ radiation. The induced modifications in the optical properties of the γ irradiated NCPs have been studied as a function of γ dose using UV Vis spectroscopy and CIE color difference method. Optical dielectric loss and Tauc's model were used to estimate the optical band gaps of the NCP films and to identify the types of electronic transition. The value of optical band gap energy of PC-PBT/Cr2O3 NCP was reduced from 3.23 to 3.06 upon γ irradiation up to 110 kGy, while it decreased from 4.26 to 4.14 eV for PC-PBT/CdS NCP, indicating the growth of disordered phase in both NCPs. This was accompanied by a rise in the refractive index for both the PC-PBT/Cr2O3 and PC-PBT/CdS NCP films, leading to an enhancement in their isotropic nature. The Cr2O3 NPs were found to be more effective in changing the band gap energy and refractive index due to the presence of excess oxygen atoms that help with the oxygen atoms of the carbonyl group in increasing the chance of covalent bonds formation between the NPs and the PC-PBT blend. Moreover, the color intensity, ΔE has been computed; results show that both the two synthesized NCPs have a response to color alteration by γ irradiation, but the PC-PBT/Cr2O3 has a more response since the values of ΔE achieved a significant color difference >5 which is an acceptable match in commercial reproduction on printing presses. According to the resulting enhancement in the optical characteristics of the developed NCPs, they can be a suitable candidate as activate materials in optoelectronic devices, or shielding sheets for solar cells.

The Optical Performance of Holmium Oxide Doped Tellurite Glass for Potential Optical Fiber

2021 ◽  
Vol 317 ◽  
pp. 95-99
Author(s):  
Muhammad Noorazlan Abd Azis ◽  
Halimah Mohamed Kamari ◽  
Suriani Abu Bakar ◽  
Azlina Yahya ◽  
Umar Saad Aliyu
Keyword(s):  
Refractive Index ◽  
Band Gap ◽  
Tellurite Glass ◽  
Optical Band Gap ◽  
Band Gap Energy ◽  
X Ray Diffraction ◽  
Xrd Pattern ◽  
Gap Energy ◽  
Xrd Method ◽  
Nonlinear Pattern

Borotellurite glass had been widely applied in the field of optical communications and devices. In this work, holmium oxides doped borotellurite glass had been successfully fabricated via conventional melt-quenched technique. The structural properties of holmium doped tellurite glass were found using x-ray diffraction (XRD) method. The nonexistence of sharp peaks in XRD pattern shows that the inclusion of holmium tellurite glass leads to the formation long range of disorderness. The optical properties of the glass system such as refractive index and optical band gap energy are investigated using UV-Vis spectrophotometer. The value of refractive index is found in nonlinear trend along with holmium oxides concentration. It is found that the refractive index is more than 2 at 0.01, 0.03 and 0.04 of holmium concentrations. The optical band gap energy was found in similar trend with refractive index which is in nonlinear pattern.

scholarly journals Effect of thickness on the optical properties of Gaas thin films

2013 ◽  
Vol 37 (1) ◽  
pp. 83-91 ◽  
Author(s):  
Chitra Das ◽  
Jahanara Begum ◽  
Tahmina Begum ◽  
Shamima Choudhury
Keyword(s):  
Thin Films ◽  
Dielectric Constant ◽  
Refractive Index ◽  
Band Gap ◽  
Optical Band Gap ◽  
Visible Region ◽  
Solar Spectrum ◽  
Band Gap Energy ◽  
Optical Parameters ◽  
Gap Energy

Effect of thickness on the optical and electrical properties of gallium arsenide (GaAs) thin films were studied. The films of different thicknesses were prepared by vacuum evaporation method (~10-4 Pa) on glass substrates at a substrate temperature of 323 K. The film thickness was measured in situ by a frequency shift of quartz crystal. The thicknesses were 250, 300 and 500 nm. Absorption spectrum of this thin film had been recorded using UV-VIS-NIR spectrophotometer in the photon wavelength range of 300 - 2500 nm. The values of some important optical parameters of the studied films (absorption coefficient, optical band gap energy and refractive index; extinction co-efficient and real and imaginary parts of dielectric constant) were determined using these spectra. Transmittance peak was observed in the visible region of the solar spectrum. Here transmittance showed better result when thicknesses were being increased. The optical band gap energy was decreased by the increase of thickness. The refractive index increased by increasing thickness while extinction co-efficient and real and imaginary part of dielectric constant decreased. DOI: http://dx.doi.org/10.3329/jbas.v37i1.15684 Journal of Bangladesh Academy of Sciences, Vol. 37, No. 1, 83-91, 2013

Effects of Nitrogen Doping on Optical Properties of Tungsten Oxide Thin Films

2012 ◽  
Vol 616-618 ◽  
pp. 1773-1777
Author(s):  
Xi Lian Sun ◽  
Hong Tao Cao
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Optical Properties ◽  
Band Gap ◽  
Tungsten Oxide ◽  
Nitrogen Doping ◽  
Optical Band Gap ◽  
Band Gap Energy ◽  
Gap Energy ◽  
Tungsten Oxide Thin Films

In depositing nitrogen doped tungsten oxide thin films by using reactive dc pulsed magnetron sputtering process, nitrous oxide gas (N2O) was employed instead of nitrogen (N2) as the nitrogen dopant source. The nitrogen doping effect on the structural and optical properties of WO3 thin films was investigated by X-ray diffraction, transmission electron microscopy and UV-Vis spectroscopy. The thickness, refractive index and optical band gap energy of these films have been determined by analyzing the SE spectra using parameterized dispersion model. Morphological images reveal that the films are characterized by a hybrid structure comprising nanoparticles embeded in amorphous matrix and open channels between the agglomerated nanoparticles. Increasing nitrogen doping concentration is found to decrease the optical band gap energy and the refractive index. The reduced band gaps are associated with the N 2p orbital in the N-doped tungsten oxide films.

Optical Properties of PZT, PLZT, and PNZT Thin Films

1991 ◽  
Vol 243 ◽  
Author(s):  
Chien H. Peng ◽  
Jhing-Fang Chang ◽  
Seshu B. Desu
Keyword(s):  
Thin Films ◽  
Refractive Index ◽  
Optical Properties ◽  
Band Gap ◽  
Band Gap Energy ◽  
Gap Energy ◽  
Pzt Films ◽  
Direct Band ◽  
Band Transition ◽  
La Doped

AbstractOptical properties were investigated for undoped, La-doped, and Nd-doped Pb(ZrxTi1-x)O3 thin films deposited on sapphire substrates by metalorganic decomposition (MOD) process. Refractive index and extinction coefficient of these films were calculated from transmission spectra in the wavelength range of 300 to 2000 nm. The packing densities of these films were calculated from the refractive index data by using the effective medium approximation. Band gap energies of these films were also reported under the assumption of direct band-to-band transition. The refractive index and band gap energy of PZT films showed a linear dependence on Zr/Ti ratio. The refractive index decreased, while the band gap energy increased with increasing zirconium content. It was also found that both La-doped and Nd-doped PZT films had higher refractive indices than those of undoped PZT films with the same Zr/Ti ratio (50/50).

scholarly journals A COMPARATIVE ANALYSIS OF EFFECT OF TEMPERATURE ON BAND-GAP ENERGY OF GALLIUM NITRIDE AND ITS STABILITY BEYOND ROOM TEMPERATURE USING BOSE–EINSTEIN MODEL AND VARSHNI’S MODEL

2017 ◽  
Vol 18 (2) ◽  
pp. 151-157 ◽  
Author(s):  
Md. Abdullah Al Humayun ◽  
AHM Zahirul Alam ◽  
Sheroz Khan ◽  
MohamedFareq AbdulMalek ◽  
Mohd Abdur Rashid
Keyword(s):  
Comparative Analysis ◽  
Temperature Dependence ◽  
Band Gap ◽  
Room Temperature ◽  
Band Gap Energy ◽  
Semiconductor Materials ◽  
Gap Energy ◽  
Einstein Model ◽  
S Model ◽  
Energy Dependent

High temperature stability of band-gap energy of active layer material of a semiconductor device is one of the major challenges in the field of semiconductor optoelectronic device design. It is essential to ensure the stability in different band-gap energy dependent characteristics of the semiconductor material used to fabricate these devices either directly or indirectly. Different models have been widely used to analyze the band-gap energy dependent characteristics at different temperatures. The most commonly used methods to analyze the temperature dependence of band-gap energy of semiconductor materials are: Passler model, Bose–Einstein model and Varshni’s model. This paper is going to report the limitation of the Bose–Einstein model through a comparative analysis between Bose–Einstein model and Varshni’s model. The numerical analysis is carried out considering GaN as it is one of the most widely used semiconductor materials all over the world. From the numerical results it is ascertained that below the temperature of 95o K both the models show almost same characteristics. However beyond 95o K Varshni’s model shows weaker temperature dependence than that of Bose–Einstein model. Varshni’s model shows that the band-gap energy of GaN at 300o K is found to be 3.43eV, which establishes a good agreement with the theoretically calculated band-gap energy of GaN for operating at room temperature.

scholarly journals Single-crystalline InN films with an absorption edge between 0.7 and 2 eV grown using different techniques and evidence of the actual band gap energy

2003 ◽  
Vol 83 (23) ◽  
pp. 4788-4790 ◽  
Author(s):  
Ashraful Ghani Bhuiyan ◽  
Kenichi Sugita ◽  
Ken Kasashima ◽  
Akihiro Hashimoto ◽  
Akio Yamamoto ◽  
...  
Keyword(s):  
Band Gap ◽  
Absorption Edge ◽  
Band Gap Energy ◽  
Single Crystalline ◽  
Gap Energy
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