High-k ZrO2 Gate Dielectric on Strained-Si
Keyword(s):
High K
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ABSTRACTThe growth and structural characterization of UHV-compatible LPCVD grown strained-Si layer on linearly graded relaxed SiGe layer and the electrical properties of the high-k ultrathin ZrO2 films deposited on strained-Si layer using microwave-plasma CVD at low temperature (150°C) are reported. The strained-Si layer has been characterized using AFM, TEM and Raman spectroscopy. The C-V and G-V characteristics of ZrO2 films have been used to calculate the interface trap density, Dit, near the midgap energy, and the fixed oxide charge density, Qf/q. These are found to be 2.24 × 1012 cm−2 eV−1 and 1.45 × 1011 cm−2, respectively. Poole-Frenkel (PF) conduction mechanism is found to dominate the current conduction at room temperature.
2010 ◽
Vol 204
(16-17)
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pp. 2817-2821
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1994 ◽
Vol 3
(4-6)
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pp. 515-519
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1990 ◽
Vol 13
(6)
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pp. 697-702
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2007 ◽
Vol 13
(11)
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pp. 595-600
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2020 ◽
Vol 22
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pp. 100816
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