scholarly journals HIGH-PURITY SHAPE CASTING WITH AN ELECTRON-BEAM FURNACE.

1967 ◽  
Author(s):  
C.W. Dean ◽  
R.E. McDonald
Keyword(s):  
2016 ◽  
Vol 27 (35) ◽  
pp. 355301 ◽  
Author(s):  
Rosa Córdoba ◽  
Nidhi Sharma ◽  
Sebastian Kölling ◽  
Paul M Koenraad ◽  
Bert Koopmans

2000 ◽  
Vol 13 (3) ◽  
pp. 413-417 ◽  
Author(s):  
Yukinori Ochiai ◽  
Shoko Manako ◽  
Hiromasa Yamamoto ◽  
Takahiro Teshima ◽  
Jun-ichi Fujita ◽  
...  

Metallurgist ◽  
2011 ◽  
Vol 55 (7-8) ◽  
pp. 607-614 ◽  
Author(s):  
V. A. Osokin ◽  
V. A. Panibratskii ◽  
P. A. Shpak ◽  
E. L. Piyuk

2010 ◽  
Vol 87 (5-8) ◽  
pp. 1550-1553 ◽  
Author(s):  
R. Córdoba ◽  
J. Sesé ◽  
J.M. De Teresa ◽  
M.R. Ibarra

1993 ◽  
Vol 46 (2) ◽  
pp. 317 ◽  
Author(s):  
KSA Butcher ◽  
D Alexiev ◽  
TL Tansley

Measurements of minority carrier diffusion lengths for p-type and n-type GaAs were carried out using an electron beam induced current (EBIC) technique. The GaAs material was grown by liquid phase epitaxy (LPE) at the Australian Nuclear Science and Technology Organisation. The diffusion lengths measured for high purity p-type and n-type LPE-GaAs samples were observed to be longer than any previously reported.


Author(s):  
Hans Migge

Inclusions of BeO are of tremendous importance on the mechanical properties of Beryllium [1,2]. The BeO particle sizes of different hot pressed materials are in the range between 400 Å and 10 μm for BeO contents between 0.5 and 3.6%[3]. However, there is no investigation about the BeO dispersion in high purity (<200 ppm BeO) ingots. Information on this subject should be derived from the diffuse Debye rings of BeO, which as yet are thought to come from the very thin oxide scale on the Be-surface [3].0.1 mm foils of Berylco IF—1 from KBI with BeO < 200 ppm were analyzed at 100 kV in the as received condition or after annealing for 1 hour at 900°C in ultrahigh vacuum. With the electron beam parallel to [00.1], [11.1], [02.1], [12.1], [03.1], [12.2] (using different grains) always four diffuse BeO rings of the type {10.0}, {10.1}, {11.0}and the unresolved {20.0}/{11.2} appear in the SAD-pattern.


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