scholarly journals Surface Morphology of Fe(III)-Porphyrin Thin Layers as Characterized by Atomic Force Microscopy

2018 ◽  
Vol 16 (3) ◽  
pp. 233
Author(s):  
Utari Utari ◽  
Kusumandari Kusumandari ◽  
Budi Purnama ◽  
Mudasir Mudasir ◽  
Kamsul Abraha
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Thin Layer ◽  
Indium Tin Oxide ◽  
Rotational Speed ◽  
Thin Layers ◽  
Atmospheric Conditions ◽  
Force Microscopy ◽  
Atomic Force ◽  
Coating Methods

Surface morphology of Fe(III)–porphyrin thin layers was studied using atomic force microscopy. The thin layer samples used in these experiments were deposited by spin coating methods on indium–tin-oxide substrates at room temperature under atmospheric conditions. Variations of thin layer of Fe(III)-porphyrin were done by modifying the rotational speed and the concentration of the solution. The experimental results demonstrated that the Fe(III)–porphyrin layers were observed as discrete nanomolecular islands. Both the number of nano-islands and thickness of the layer increased significantly with increasing concentration. A layer thickness of 15 nm was obtained for low concentrations of 0.00153 M and become 25 nm for dense concentrations of 0.153 M. Conversely, the higher number of islands were deposited on the surface of the substrate at a lower rotational speed.

Surface morphology of As-deposited and laser-damaged dielectric mirror coatings studied in-situ by atomic force microscopy

1992 ◽  
Author(s):  
Mark R. Kozlowski ◽  
Michael C. Staggs ◽  
Mehdi Balooch ◽  
Robert J. Tench ◽  
Wigbert J. Siekhaus
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Force Microscopy ◽  
Dielectric Mirror ◽  
Atomic Force

Bonding Force Investigation between C-S-H Clusters in the C3S Pastes and AFM Tip

2011 ◽  
Vol 250-253 ◽  
pp. 630-635
Author(s):  
Hai Yan Sun ◽  
Ai Min Gong ◽  
Yu Lin Peng
Keyword(s):  
Atomic Force Microscopy ◽  
Normal Distribution ◽  
Experimental Method ◽  
Mechanical Characteristic ◽  
Structural Model ◽  
Atmospheric Conditions ◽  
Bonding Force ◽  
Force Microscopy ◽  
Solid Ratio ◽  
Atomic Force

With the experimental objects of the C3S pastes curing at 60 days with water-solid ratio of 0.5, the micro mechanical characteristic between C-S-H clusters and tip has been investigated in the low scale. The results show that the experimental method is feasible for bonding force between C-S-H clusters and tip using atomic force microscopy (AFM) in the real atmospheric conditions. Though bonding force values are discrete in view of the anisotropy character of the cement-based material, the normal distribution can be fitted for the variation of bonding force between C-S-H blusters in the C3S pastes and AFM tip with a mean of 6.2nN. Even if bonding force values is somewhat higher due to the roughness and the measuring conditions in the paper, the experimental method using AFM could still be effective for the lateral correlation for bonding force of the different systems. The research on bonding force between C-S-H clusters would play the important role in establishing the new microscopic structural model.

Surface morphology studies on sublimation grown GaN by atomic force microscopy

1999 ◽  
Vol 200 (3-4) ◽  
pp. 348-352 ◽  
Author(s):  
R.S Qhalid Fareed ◽  
S Tottori ◽  
K Nishino ◽  
S Sakai
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Force Microscopy ◽  
Atomic Force

Chromic Polydiacetylene Single Crystals: Atomic Force Microscopy Studies

1995 ◽  
Vol 413 ◽  
Author(s):  
V. Shivshankar ◽  
C. Sung ◽  
J. Kumar ◽  
S. K. Tripathy ◽  
D. J. Sandman
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Single Crystals ◽  
Ambient Conditions ◽  
Free Standing ◽  
Force Microscopy ◽  
Sensor Performance ◽  
Atomic Force ◽  
Variable Surface

ABSTRACTWe have studied the surface morphology of free standing single crystals of thermochromic polydiacetylenes (PDAs), namely, ETCD and IPUDO (respectively, the ethyl and isopropyl urethanes of 5,7-dodecadiyn-1,12-diol), by Atomic Force Microscopy (AFM) under ambient conditions. Micron scale as well as molecularly resolved images were obtained. The micron scale images indicate a variable surface, and the molecularly resolved images show a well defined 2-D lattice that is interpreted in terms of molecular models and known crystallographic data. Thereby information about surface morphology, which is crucial to potential optical device or chromic sensor performance is available. We also report the observation of a “macroscopic shattering” of the IPUDO monomer crystal during in-situ UV polymerization studies.

The Investigation of Thin Protecting Layers on Roughened Galvanized Steel Surfaces Produced by Different Coating Methods

2008 ◽  
Vol 589 ◽  
pp. 433-438 ◽  
Author(s):  
Péter Németh ◽  
Ágnes Csanády ◽  
Katalin Papp ◽  
Anna C. Pintér ◽  
László Szabó ◽  
...  
Keyword(s):  
Thickness Distribution ◽  
Thin Layers ◽  
Galvanized Steel ◽  
Photoemission Spectroscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Coating Methods ◽  
Chemical States ◽  
Steel Surfaces ◽  
Thickness Variations

Protective, chromate substitute thin layers on roughened galvanized surfaces produced at OCAS (Arcelor, Belgium) were characterized and compared using Scanning Electron Microscopy (SEM+EDS), Atomic Force Microscopy (AFM), Nanoindentation and X-ray Photoemission Spectroscopy (XPS). EDX maps, line scans and point analyses obtained at various places of the surfaces have shown differences between the CVD and silane nanolayers in the matter of thickness distribution and composition. At cross-section specimens the thickness of the layers could be shown. The hardness differences caused by layer thickness variations are hard to follow by nanoindentation as the penetration depth of the indenter is much larger than the thickness of the coatings. XPS measurements can distinguish between the chemical states of silicon in CVD and silane coatings.

MICROCRACKS IN ~ 100 MeV Si7+-ION-IRRADIATED p-SILICON SURFACES

2004 ◽  
Vol 11 (03) ◽  
pp. 265-269
Author(s):  
O. P. SINHA ◽  
P. C. SRIVASTAVA ◽  
V. GANESAN
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Target Surface ◽  
Silicon Surfaces ◽  
Force Microscopy ◽  
Atomic Force ◽  
Induced Stress

The p-silicon surfaces have been irradiated with ~ 100 MeV Si 7+ions to a fluence of 2.2×1013 ions cm -2, and surface morphology has been studied with atomic force microscopy (AFM). Interesting features of cracks of ~ 47 nm in depth and ~ 103 nm in width on the irradiated surfaces have been observed. The observed features seemed to have been caused by the irradiation-induced stress in the irradiated regions of the target surface.

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