scholarly journals Interfacial reactions between solid Ni and liquid Sn-Zn alloys

2015 ◽  
Vol 51 (2) ◽  
pp. 179-184 ◽  
Author(s):  
V. Gandova
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Interfacial Reactions ◽  
Diffusion Couples ◽  
Zn Diffusion ◽  
Ni Substrate ◽  
Industry Applications ◽  
Zn Alloys ◽  
Scanning Electron ◽  
Intermetallic Layers

The limitation of the harmful lead-containing solders used in the electronics and other industry applications change lead with another metals. Interfacial reactions between Sn-Zn alloys and Ni substrate after annealing at 400 and 450?C were studied. Three intermetallic compounds Ni3Sn4, T1, ?-Ni5Zn21 and liquid Sn were observed in the Ni/Sn-Zn diffusion couples. Scanning electron microscope was used for the investigation of the microstructure. The microhardness measurement of the intermetallic layers was also performed.

Preparation and Characterization of Three Dimensional Sn-Co Alloy Based on Porous Ni for Lithium-Ion Batteries

2011 ◽  
Vol 399-401 ◽  
pp. 1457-1460
Author(s):  
Li Xia Xu ◽  
Shi Chao Zhang ◽  
Wen Bo Liu
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Pulse Current ◽  
Three Dimensional ◽  
Lithium Ion ◽  
Cycling Performance ◽  
Ni Substrate ◽  
Pulse Current Electrodeposition ◽  
Scanning Electron

A three-dimensional dendritic Sn-Co anode was prepared on the porous Ni substrate via pulse current electrodeposition methond, and characterized by means of scanning electron microscope (SEM), energy dispersive (EDX) analyzer. Then its electrochemical property were studied by means of charging-discharging (C-D) test. The influences of the current density and eletrochemical technique has been studied. Besides this, the importance of annealing for the cycling performance of the as-prepared electrode had been dicussed.

Preparation of Pd/PPy/Foam-Ni Electrode and its Electrocatalytic Hydrodechlorination of Dichlorophenols

2021 ◽  
Vol 1035 ◽  
pp. 1078-1088
Author(s):  
Zhen Peng Ma ◽  
Shu Xia Zhang ◽  
Zhi Gang Yang
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Specific Surface ◽  
Surface Area ◽  
Removal Efficiency ◽  
Specific Surface Area ◽  
Supporting Electrolyte ◽  
Electrocatalytic Hydrogenation ◽  
Ni Substrate ◽  
Scanning Electron

Based on mechanism of ECH (Electrocatalytic Hydrogenation),the Pa/PPy/Foam-Ni (Pd/PPY/Ni) prepared by electrical depositing was used as cathode to detoxifythree kinds of dichlorophenol (DCP) and improve their biodegradability. According to the dechloridation ability of electrodes prepared under different conditions, the factors were optimized. The removal efficiency of 2,4-dichlorophenol（2,4-DCP）reaches 64.45% when the supporting electrolyte is p-toluenesulfonic acid and the voltage is 0.6V and polymerizing time is 20mins. Analyzing the photograph from SEM (Scanning Electron Microscope), it shows that PPy (PolyPyrrole) changes depositing properties of Pa on foam-Ni substrate, which increases specific surface area and special ductility so as to benefit Pd to deposite on Ni substrate and improve ECH.

scholarly journals Ni-Bi-Zn ternary system investigation using diffusion couples technique

2016 ◽  
Vol 52 (1) ◽  
pp. 113-118 ◽  
Author(s):  
V.D. Gandova
Keyword(s):  
Phase Diagram ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Ternary System ◽  
Binary Phase Diagram ◽  
Chemical Compositions ◽  
Diffusion Couples ◽  
Diffusion Layers ◽  
Diffusion Paths ◽  
Scanning Electron

An investigation of Ni-Bi-Zn system was performed using a diffusion couples technique and the diffusion paths were constructed. For that purpose diffusion couples consisting of solid Ni and liquid Bi-Zn phase were annealed at 450?C. The phase and chemical compositions of the contact zone were determined by scanning electron microscope. The diffusion layers found in the Ni-Bi-Zn ternary system were Beta1, ?-Ni5Zn21 and liquid. No intermetallic compounds in Bi-Ni binary phase diagram were observed.

The Alteration of the Pore Spaces in Sandstones

1973 ◽  
Vol 31 ◽  
pp. 210-211
Author(s):  
R. E. Ferrell ◽  
G. G. Paulson
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
The Other ◽  
Coarse Grained ◽  
Depositional Fabric ◽  
Soluble Components ◽  
Scanning Electron ◽  
Shape And Size

The pore spaces in sandstones are the result of the original depositional fabric and the degree of post-depositional alteration that the rock has experienced. The largest pore volumes are present in coarse-grained, well-sorted materials with high sphericity. The chief mechanisms which alter the shape and size of the pores are precipitation of cementing agents and the dissolution of soluble components. Each process may operate alone or in combination with the other, or there may be several generations of cementation and solution.The scanning electron microscope has ‘been used in this study to reveal the morphology of the pore spaces in a variety of moderate porosity, orthoquartzites.

The Broad Applications of the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 20-21
Author(s):  
C. T. Nightingale ◽  
S. E. Summers ◽  
T. P. Turnbull
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Surface Topography ◽  
Great Depth ◽  
Resolving Power ◽  
Depth Of Field ◽  
Pictorial Representations ◽  
Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

Observability of Very Thick Specimen by Using Transmission Scanning Electron Microscope

1971 ◽  
Vol 29 ◽  
pp. 26-27
Author(s):  
K. Shibatomi ◽  
T. Yamanoto ◽  
H. Koike
Keyword(s):  
Electron Microscope ◽  
Image Quality ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Image Contrast ◽  
Objective Lens ◽  
Thick Specimen ◽  
Transmission Electron ◽  
Scanning Electron

In the observation of a thick specimen by means of a transmission electron microscope, the intensity of electrons passing through the objective lens aperture is greatly reduced. So that the image is almost invisible. In addition to this fact, it have been reported that a chromatic aberration causes the deterioration of the image contrast rather than that of the resolution. The scanning electron microscope is, however, capable of electrically amplifying the signal of the decreasing intensity, and also free from a chromatic aberration so that the deterioration of the image contrast due to the aberration can be prevented. The electrical improvement of the image quality can be carried out by using the fascionating features of the SEM, that is, the amplification of a weak in-put signal forming the image and the descriminating action of the heigh level signal of the background. This paper reports some of the experimental results about the thickness dependence of the observability and quality of the image in the case of the transmission SEM.

Resolution of a Transmitted Electron Image Formed by A Scanning Electron Microscope

1970 ◽  
Vol 28 ◽  
pp. 386-387
Author(s):  
S. Takashima ◽  
H. Hashimoto ◽  
S. Kimoto
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Objective Lens ◽  
Specimen Thickness ◽  
Probe Diameter ◽  
Transmission Electron ◽  
Electron Image ◽  
Conventional Transmission Electron Microscope ◽  
Scanning Electron

The resolution of a conventional transmission electron microscope (TEM) deteriorates as the specimen thickness increases, because chromatic aberration of the objective lens is caused by the energy loss of electrons). In the case of a scanning electron microscope (SEM), chromatic aberration does not exist as the restrictive factor for the resolution of the transmitted electron image, for the SEM has no imageforming lens. It is not sure, however, that the equal resolution to the probe diameter can be obtained in the case of a thick specimen. To study the relation between the specimen thickness and the resolution of the trans-mitted electron image obtained by the SEM, the following experiment was carried out.

Characterization of Sputtered Films using the Scanning Electron Microscope

1973 ◽  
Vol 31 ◽  
pp. 44-45
Author(s):  
R. F. Schneidmiller ◽  
W. F. Thrower ◽  
C. Ang
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
Sputtered Films ◽  
Plasma Sputtering ◽  
Microelectronic Devices ◽  
Control Film ◽  
Scanning Electron

Solid state materials in the form of thin films have found increasing structural and electronic applications. Among the multitude of thin film deposition techniques, the radio frequency induced plasma sputtering has gained considerable utilization in recent years through advances in equipment design and process improvement, as well as the discovery of the versatility of the process to control film properties. In our laboratory we have used the scanning electron microscope extensively in the direct and indirect characterization of sputtered films for correlation with their physical and electrical properties.Scanning electron microscopy is a powerful tool for the examination of surfaces of solids and for the failure analysis of structural components and microelectronic devices.

Field Emission SEM Equipped With Noise Compensator

1973 ◽  
Vol 31 ◽  
pp. 302-303
Author(s):  
S. Saito ◽  
H. Todokoro ◽  
S. Nomura ◽  
T. Komoda
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Low Contrast ◽  
Probe Current ◽  
High Resolution Images ◽  
Scanning Electron

Field emission scanning electron microscope (FESEM) features extremely high resolution images, and offers many valuable information. But, for a specimen which gives low contrast images, lateral stripes appear in images. These stripes are resulted from signal fluctuations caused by probe current noises. In order to obtain good images without stripes, the fluctuations should be less than 1%, especially for low contrast images. For this purpose, the authors realized a noise compensator, and applied this to the FESEM.Fig. 1 shows an outline of FESEM equipped with a noise compensator. Two apertures are provided gust under the field emission gun.

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