Preparation and Characterization of Three Dimensional Sn-Co Alloy Based on Porous Ni for Lithium-Ion Batteries

2011 ◽  
Vol 399-401 ◽  
pp. 1457-1460
Author(s):  
Li Xia Xu ◽  
Shi Chao Zhang ◽  
Wen Bo Liu
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Pulse Current ◽  
Three Dimensional ◽  
Lithium Ion ◽  
Cycling Performance ◽  
Ni Substrate ◽  
Pulse Current Electrodeposition ◽  
Scanning Electron

A three-dimensional dendritic Sn-Co anode was prepared on the porous Ni substrate via pulse current electrodeposition methond, and characterized by means of scanning electron microscope (SEM), energy dispersive (EDX) analyzer. Then its electrochemical property were studied by means of charging-discharging (C-D) test. The influences of the current density and eletrochemical technique has been studied. Besides this, the importance of annealing for the cycling performance of the as-prepared electrode had been dicussed.

Characterization of Sputtered Films using the Scanning Electron Microscope

1973 ◽  
Vol 31 ◽  
pp. 44-45
Author(s):  
R. F. Schneidmiller ◽  
W. F. Thrower ◽  
C. Ang
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
Sputtered Films ◽  
Plasma Sputtering ◽  
Microelectronic Devices ◽  
Control Film ◽  
Scanning Electron

Solid state materials in the form of thin films have found increasing structural and electronic applications. Among the multitude of thin film deposition techniques, the radio frequency induced plasma sputtering has gained considerable utilization in recent years through advances in equipment design and process improvement, as well as the discovery of the versatility of the process to control film properties. In our laboratory we have used the scanning electron microscope extensively in the direct and indirect characterization of sputtered films for correlation with their physical and electrical properties.Scanning electron microscopy is a powerful tool for the examination of surfaces of solids and for the failure analysis of structural components and microelectronic devices.

Microstructures of Low Angle Boundaries of the Second Generation Single Crystal Superalloy DD6

2011 ◽  
Vol 284-286 ◽  
pp. 1584-1587
Author(s):  
Zhen Xue Shi ◽  
Jia Rong Li ◽  
Shi Zhong Liu ◽  
Jin Qian Zhao
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Thin Layer ◽  
Single Crystal ◽  
Second Generation ◽  
Three Dimensional ◽  
Single Crystal Superalloy ◽  
Transition Electron ◽  
Scanning Electron

The specimens of low angle boundaries were machined from the second generation single crystal superalloy DD6 blades. The microstructures of low angle boundaries (LAB) were investigated from three scales of dendrite, γ′ phase and atom with optical microscopy (OM), scanning electron microscope (SEM), transition electron microscope (TEM) and high resolution transmission electrion microscopy (HREM). The results showed that on the dendrite scale LAB is interdendrite district formed by three dimensional curved face between the adjacent dendrites. On the γ′ phase scale LAB is composed by a thin layer γ phase and its bilateral imperfect cube γ′ phase. On the atom scale LAB is made up of dislocations within several atom thickness.

scholarly journals Three-dimensional Observation of the Rat Endocrine Pancreas by a Scanning Electron Microscope

1990 ◽  
Vol 12 (3) ◽  
pp. 315-322 ◽  
Author(s):  
Masanori HISAOKA ◽  
Joji HARATAKE ◽  
Osamu YAMAMOTO ◽  
Akio HORIE
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Endocrine Pancreas ◽  
Three Dimensional ◽  
Scanning Electron
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