In-Situ Monitoring of Oxide Ion Induced Breakdown in Amorphous Tantalum Oxide Thin Film Using Acoustic Emission Measurement
2014 ◽
Vol 55
(10)
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pp. 1553-1556
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2016 ◽
Vol 2016.16
(0)
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pp. C5-3
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1998 ◽
Vol 47
(5)
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pp. 489-494
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1967 ◽
Vol 3
(1)
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pp. 14-20
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Keyword(s):
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2021 ◽
Vol 111
(07-08)
◽
pp. 495-500
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