Trace Elements Analysis by Pixe Spectroscopy

Abstract The trace element analysis system is presented using Proton Induced X-ray Emission (PIXE) analysis at a new Ion Beam Centre in Trnava. Standard PIXE system dedicated to the measurement of thick solid samples was extended by a new application for trace element analysis in aerosol samples. The sample holder was modified with respect to the dimensions of the aerosol filters, and a new sample holder and a Faraday cup (FC) were made. The first results of the PIXE aerosol analysis are presented in this paper. Furthermore, the geometric efficiency of the detection system was verified using 55Fe radioactive source emitting monoenergetic Mn X-ray lines. The measured data were compared with the Monte Carlo simulations regarding/disregarding the X-ray attenuation.

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Elemental Analysis of Biomedical Samples by Pixe

Advances in X-ray Analysis ◽

10.1154/s0376030800015342 ◽

1977 ◽

Vol 21 ◽

pp. 261-266

Author(s):

J. A. Guffey ◽

H. A. Van Rinsvelt ◽

W. R. Adams ◽

R. M. Sarper ◽

Z. Karcioglu ◽

...

Keyword(s):

Trace Elements ◽

Early Detection ◽

Trace Element ◽

Elemental Analysis ◽

Diagnostic Tool ◽

Trace Element Analysis ◽

Analytical Tool ◽

Element Analysis ◽

Pixe Analysis ◽

X Ray

The use of particle-induced X-ray emission (PIXE) analysis as a standard analytical tool in the study of trace elements is well known. In the present investigation, an attempt is made to correlate human diseases with the presence or absence of trace elements and/or the changes in their concentration in healthy and diseased tissues. If such correlations do actually exist, trace element analysis could certainly be used as a diagnostic tool for the early detection of diseases and there is considerable interest in such information.

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TRACE ELEMENT ANALYSIS IN ANTS COLLECTED IN JAPAN, FINLAND AND SWEDEN

International Journal of PIXE ◽

10.1142/s0129083592000415 ◽

1992 ◽

Vol 02 (03) ◽

pp. 405-411 ◽

Cited By ~ 4

Author(s):

K. KITAO

Keyword(s):

Trace Elements ◽

Trace Element ◽

Trace Element Analysis ◽

Reasonable Accuracy ◽

Element Analysis ◽

Pixe Analysis ◽

X Ray ◽

Minor Elements ◽

Analytical Results ◽

Pixe Method

Particle induced x-ray emission has been used to determine the concentration of trace elements in ants (Formicidae). Scanning PIXE analysis was also used to determine the distribution of these elements. Samples of ants were collected from gardens, buildings or from the roadway in Japan, Finland and Sweden. The only pre-treatments were dusting and washing. In each run of experiments we used only one individual ant and have obtained the analytical results of a reasonable accuracy. We have detected chemical minor elements, i.e., Mn, Fe, Cu, Zn, Rb, Br and Sr. The PIXE, and scanning PIXE method proved to be useful and sensitive enough to measure trace elements in such small insects as ants.

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Trace element analysis on Si wafer surfaces by TXRF at the ID32 ESRF undulator beamline

Journal of Synchrotron Radiation ◽

10.1107/s0909049597016737 ◽

1998 ◽

Vol 5 (3) ◽

pp. 1064-1066 ◽

Cited By ~ 15

Author(s):

Luc Ortega ◽

Fabio Comin ◽

Vincenzo Formoso ◽

Andreas Stierle

Keyword(s):

Synchrotron Radiation ◽

Trace Element ◽

Trace Element Analysis ◽

Element Analysis ◽

Double Crystal ◽

X Ray ◽

Double Crystal Monochromator ◽

First Results ◽

Set Up ◽

Wave Methods

Synchrotron radiation total-reflection X-ray fluorescence (SR-TXRF) has been applied to the impurity analysis of Si wafers using a third-generation synchrotron radiation undulator source. A lower limit of detectability (LLD) for Ni atoms of 17 fg (1.7 × 108 atoms cm−2) has been achieved with an optical set-up based on an Si(111) double-crystal monochromator and a horizontal sample geometry. These first results are very promising for synchrotron radiation trace element analysis since we estimate that it is possible to lower the LLD by a factor of about 25 by employing appropriate optics and detectors. The use of a crystal monochromator opens new possibilities to perform absorption and scattering experiments (NEXAFS and X-ray standing-wave methods) for chemical and structural analysis of ultratrace elements.

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