Photon count dynamic range determination for optically stimulated luminescence decay measurements in YAP:Mn

2018 ◽  
Vol 10 ◽  
Author(s):  
D. Afanassyev ◽  
S. Ubizskii ◽  
V. Rabyk ◽  
V. Paslavsky
Keyword(s):  
Dynamic Range ◽  
Luminescence Decay ◽  
Optically Stimulated Luminescence ◽  
Photon Count ◽  
Range Determination

Dose-dependent change in the optically stimulated luminescence decay of Al2O3:C

2009 ◽  
Vol 44 (5-6) ◽  
pp. 543-547 ◽  
Author(s):  
R.H. Biswas ◽  
M.K. Murari ◽  
A.K. Singhvi
Keyword(s):  
Luminescence Decay ◽  
Optically Stimulated Luminescence ◽  
Dependent Change ◽  
Dose Dependent

scholarly journals Using LiF crystals for high-performance neutron imaging with micron-scale resolution

2015 ◽  
Vol 3 ◽  
Author(s):  
A. Faenov ◽  
M. Matsubayashi ◽  
T. Pikuz ◽  
Y. Fukuda ◽  
M. Kando ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
Linear Response ◽  
High Performance ◽  
Dynamic Range ◽  
High Spatial Resolution ◽  
Neutron Imaging ◽  
Optically Stimulated Luminescence ◽  
Plasma Sources ◽  
Imaging Detector ◽  
Z Pinch

This paper describes an overview of our recent discovery – clear demonstration that LiF crystals can be efficiently used as a high-performance neutron imaging detector based on optically stimulated luminescence of color centers generated by neutron irradiation. It is shown that the neutron images we have obtained are almost free from granular noise, have a spatial resolution of ${\sim}5.4~{\rm\mu}\text{m}$ and a linear response with a dynamic range of at least $10^{3}$ . The high contrast and good sensitivity of LiF crystals allow us to distinguish two holes with less than 2% transmittance difference. We propose to use such detectors in areas where high spatial resolution with high image gradation resolution is needed, including diagnostics of different plasma sources such as laser and z-pinch produced plasmas.

Optically stimulated luminescence decay and dosimetric properties of cerium‐doped potassium sulfate phosphor

Luminescence ◽  
2021 ◽  
Author(s):  
Renata Majgier ◽  
Mikhail Tsvirko ◽  
Arkadiusz Mandowski
Keyword(s):  
Luminescence Decay ◽  
Optically Stimulated Luminescence ◽  
Potassium Sulfate

A 124-dB Dynamic-Range SPAD Photon-Counting Image Sensor Using Subframe Sampling and Extrapolating Photon Count

2021 ◽  
pp. 1-1
Author(s):  
Jun Ogi ◽  
Takafumi Takatsuka ◽  
Kazuki Hizu ◽  
Yutaka Inaoka ◽  
Hongbo Zhu ◽  
...  
Keyword(s):  
Dynamic Range ◽  
Photon Counting ◽  
Image Sensor ◽  
Photon Count

Slow-Scan CCD Observation of Backscattering Patterns in SEM

1992 ◽  
Vol 50 (2) ◽  
pp. 1308-1309
Author(s):  
F. Ouyang ◽  
D. A. Ray ◽  
O. L. Krivanek
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Dynamic Range ◽  
High Sensitivity ◽  
Lens System ◽  
Wide Dynamic Range ◽  
Peltier Cooler ◽  
Diffraction Patterns ◽  
Scanning Electron

Electron backscattering Kikuchi diffraction patterns (BKDP) reveal useful information about the structure and orientation of crystals under study. With the well focused electron beam in a scanning electron microscope (SEM), one can use BKDP as a microanalysis tool. BKDPs have been recorded in SEMs using a phosphor screen coupled to an intensified TV camera through a lens system, and by photographic negatives. With the development of fiber-optically coupled slow scan CCD (SSC) cameras for electron beam imaging, one can take advantage of their high sensitivity and wide dynamic range for observing BKDP in SEM.We have used the Gatan 690 SSC camera to observe backscattering patterns in a JEOL JSM-840A SEM. The CCD sensor has an active area of 13.25 mm × 8.83 mm and 576 × 384 pixels. The camera head, which consists of a single crystal YAG scintillator fiber optically coupled to the CCD chip, is located inside the SEM specimen chamber. The whole camera head is cooled to about -30°C by a Peltier cooler, which permits long integration times (up to 100 seconds).

Quantitative energy-filtered electron diffraction

1994 ◽  
Vol 52 ◽  
pp. 992-993
Author(s):  
R. Vincent
Keyword(s):  
Electron Diffraction ◽  
Inelastic Scattering ◽  
Dynamic Range ◽  
Electron Optics ◽  
Surface Layers ◽  
High Brightness ◽  
Inclined Surfaces ◽  
Perfect Symmetry ◽  
Amorphous Surface ◽  
The Ideal

Microanalysis and diffraction on a sub-nanometre scale have become practical in modern TEMs due to the high brightness of field emission sources combined with the short mean free paths associated with both elastic and inelastic scattering of incident electrons by the specimen. However, development of electron diffraction as a quantitative discipline has been limited by the absence of any generalised theory for dynamical inelastic scattering. These problems have been simplified by recent innovations, principally the introduction of spectrometers such as the Gatan imaging filter (GIF) and the Zeiss omega filter, which remove the inelastic electrons, combined with annual improvements in the speed of computer workstations and the availability of solid-state detectors with high resolution, sensitivity and dynamic range.Comparison of experimental data with dynamical calculations imposes stringent requirements on the specimen and the electron optics, even when the inelastic component has been removed. For example, no experimental CBED pattern ever has perfect symmetry, departures from the ideal being attributable to residual strain, thickness averaging, inclined surfaces, incomplete cells and amorphous surface layers.

Direct measurement of electron-diffraction-pattern intensities using an energy loss spectrometer

1989 ◽  
Vol 47 ◽  
pp. 668-669
Author(s):  
A. G. Jackson ◽  
M. Rowe
Keyword(s):  
Thermal Effects ◽  
Dynamic Range ◽  
Scattering Amplitude ◽  
Dynamical Theory ◽  
Site Symmetry ◽  
Proof Of Concept ◽  
Parallel Acquisition ◽  
Kinematic Approximation ◽  
Speed Up ◽  
Structure Calculations

Diffraction intensities from intermetallic compounds are, in the kinematic approximation, proportional to the scattering amplitude from the element doing the scattering. More detailed calculations have shown that site symmetry and occupation by various atom species also affects the intensity in a diffracted beam. [1] Hence, by measuring the intensities of beams, or their ratios, the occupancy can be estimated. Measurement of the intensity values also allows structure calculations to be made to determine the spatial distribution of the potentials doing the scattering. Thermal effects are also present as a background contribution. Inelastic effects such as loss or absorption/excitation complicate the intensity behavior, and dynamical theory is required to estimate the intensity value.The dynamic range of currents in diffracted beams can be 104or 105:1. Hence, detection of such information requires a means for collecting the intensity over a signal-to-noise range beyond that obtainable with a single film plate, which has a S/N of about 103:1. Although such a collection system is not available currently, a simple system consisting of instrumentation on an existing STEM can be used as a proof of concept which has a S/N of about 255:1, limited by the 8 bit pixel attributes used in the electronics. Use of 24 bit pixel attributes would easily allowthe desired noise range to be attained in the processing instrumentation. The S/N of the scintillator used by the photoelectron sensor is about 106 to 1, well beyond the S/N goal. The trade-off that must be made is the time for acquiring the signal, since the pattern can be obtained in seconds using film plates, compared to 10 to 20 minutes for a pattern to be acquired using the digital scan. Parallel acquisition would, of course, speed up this process immensely.

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