Advanced X-Ray Inspection Techniques for IC Reverse Engineering

2016 ◽  
Author(s):  
Rosanne M. LaVoy ◽  
Fred Babian ◽  
Andrew Reid
Keyword(s):  
Sample Preparation ◽  
Reverse Engineering ◽  
The Novel ◽  
X Ray ◽  
Case Examples ◽  
Advantages And Disadvantages ◽  
X Ray Imaging ◽  
Inspection Techniques ◽  
Preparation Techniques ◽  
Sample Configuration

Abstract The need for reverse engineering (for IP verification or for reproducibility) has reached unprecedented levels requiring not only the inspection of the circuitry but also the understanding of the packaging and interconnects. Achieving the best X-ray inspection for a particular application depends on an in-depth understanding of the X-ray system configuration, the sample configuration, and the sample preparation techniques available. This paper presents various case examples on the development of advanced X-ray inspection techniques for IC reverse engineering, along with information on the limitations of X-ray imaging, issues with 3D reconstruction, models for resolution configuration improvement, and advantages and disadvantages of advanced sample preparation techniques. It is observed that the novel X-ray inspection techniques, combined with appropriate sample prep techniques, provide the necessary resolution to achieve results necessary for current reverse engineering needs.

Advanced X-Ray Inspection Techniques for Counterfeit IC Detection

2016 ◽  
Author(s):  
Rosanne M. LaVoy ◽  
Fred Babian ◽  
Andrew Reid
Keyword(s):  
Sample Preparation ◽  
Tomographic Reconstruction ◽  
Imaging Systems ◽  
X Ray ◽  
X Ray Imaging ◽  
Security And Reliability ◽  
Inspection Techniques ◽  
Preparation Techniques ◽  
2D Images

Abstract It is known by both the commercial and government suppliers, one of the best ways to guarantee the security and reliability of IC's is to image the IC directly using an x-ray microscope. These images can be inspected for many signs of counterfeit electronics. Unfortunately, previous generations of x-ray imaging systems have not kept up with the increasingly sophisticated counterfeiting techniques. Traditional 2D X-ray inspection techniques are becoming inadequate for imaging and verifying features due to the limited resolution of these systems for thick samples and because 2D images contain too many overlapping features to easily discern, making identification very difficult. This paper discusses the development of advanced sample preparation techniques for counterfeit IC detection. It presents information on the limitations of X-ray imaging and 3D tomographic reconstruction, and on the models for resolution configuration improvement.

The Changing Role of Advanced Sample Preparation in X-Ray Inspection Supporting 2.5D and 3D Sample Failure Analysis

2015 ◽  
Author(s):  
Rosanne M. LaVoy ◽  
Fred Babian ◽  
Matthew Mulholland ◽  
Scott Silverman
Keyword(s):  
Sample Preparation ◽  
Failure Analysis ◽  
Tomographic Reconstruction ◽  
Integrated Approach ◽  
The Novel ◽  
Throughput Time ◽  
X Ray ◽  
Flip Chips ◽  
X Ray Imaging ◽  
Changing Role

Abstract The X-ray inspection of fully assembled samples is becoming ever more important as the benefits of using area array packages/chip scale packages/flip chips are applied to more and more products. Sample preparation has traditionally been used to improve access to geometry or a specific location with a known defect that requires verification. The novel paradigm is an integrated approach to sample preparation and X-ray inspection to optimize resolution and throughput time performance with minimally deprocessed sample. This paper, covering the limitations of X-Ray imaging and 3D tomographic reconstruction, discusses the development of models for throughput time and resolution by failure analysis labs. It also discusses the processes involved in advanced sample preparation techniques and global BGA removal to obtain improved resolution at die level.

Three Dimensional X-Ray Computed Tomography in Materials Science

MRS Bulletin ◽  
1988 ◽  
Vol 13 (1) ◽  
pp. 13-18 ◽  
Author(s):  
J.H. Kinney ◽  
Q.C. Johnson ◽  
U. Bonse ◽  
M.C. Nichols ◽  
R.A. Saroyan ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Sample Preparation ◽  
Visible Light ◽  
Three Dimensional ◽  
Materials Characterization ◽  
Imaging Technology ◽  
X Ray ◽  
X Ray Imaging ◽  
Visible Light Imaging

Imaging is the cornerstone of materials characterization. Until the middle of the present century, visible light imaging provided much of the information about materials. Though visible light imaging still plays an extremely important role in characterization, relatively low spatial resolution and lack of chemical sensitivity and specificity limit its usefulness.The discovery of x-rays and electrons led to a major advance in imaging technology. X-ray diffraction and electron microscopy allowed us to characterize the atomic structure of materials. Many materials vital to our high technology economy and defense owe their existence to the understanding of materials structure brought about with these high-resolution methods.Electron microscopy is an essential tool for materials characterization. Unfortunately, electron imaging is always destructive due to the sample preparation that must be done prior to imaging. Furthermore, electron microscopy only provides information about the surface of a sample. Three dimensional information, of great interest in characterizing many new materials, can be obtained only by time consuming sectioning of an object.The development of intense synchrotron light sources in addition to the improvements in solid state imaging technology is revolutionizing materials characterization. High resolution x-ray imaging is a potentially valuable tool for materials characterization. The large depth of x-ray penetration, as well as the sensitivity of absorption crosssections to atomic chemistry, allows x-ray imaging to characterize the chemistry of internal structures in macroscopic objects with little sample preparation. X-ray imaging complements other imaging modalities, such as electron microscopy, in that it can be performed nondestructively on metals and insulators alike.

Application of XRF in the Aluminum Industry

1992 ◽  
Vol 36 ◽  
pp. 121-137
Author(s):  
Frank R. Feret
Keyword(s):  
Sample Preparation ◽  
Aluminum Industry ◽  
Raw Materials ◽  
Fluorescence Analysis ◽  
Aluminum Production ◽  
X Ray ◽  
Xrf Analysis ◽  
The Aluminum Industry ◽  
Preparation Techniques

X-ray fluorescence analysis has been used in the aluminum industry since the beginning of the 1950's. Initial applications involved predominantly raw materials such as bauxite. During the last decades its use expanded to every stage of aluminum production and today, XRF analysis is a recognized analyticaI technique, applied routinely in exploration, reduction and fabrication processes. Typical XRF applications in the aluminum industry at present are listed in Table 1. The number of determinations given represents usual industrial requirements, and may vary between laboratories. The sample preparation techniques are again the most commonly used for the applications.

Comparison of Three Sample Preparation Techniques for Determination of Organic Bromide and Chloride in Halogenated Lipids by X-Ray Fluorescence Spectroscopy

1980 ◽  
Vol 63 (4) ◽  
pp. 709-712
Author(s):  
Henry B S Conacher ◽  
Rajinder K Chadha ◽  
Gladys Lacroix
Keyword(s):  
Thin Film ◽  
Sample Preparation ◽  
Fluorescence Spectroscopy ◽  
Vegetable Oils ◽  
X Ray ◽  
Thin Film Technique ◽  
High Concentrations ◽  
Preparation Techniques

Abstract Three sample preparation techniques—thin-film, solution, and cellulose pellet—were applied to the determination of bromide in brominated lipids by X-ray fluorescence spectroscopy. Using brominated vegetable oils of known bromide content it was demonstrated that the thin-film technique could result in erroneously high bromide contents, which could also vary with the amount of oil applied, depending on the solvent used. As solutions in hexane, slightly high bromide contents were observed at high concentrations. With the cellulose pellets, bromide contents similar to known values were observed. It was concluded that the cellulose pellet procedure, although more time consuming, and less convenient for ready recovery of sample, was the most suitable for organic bromide determination. Similar results were indicated for chlorinated oils.

scholarly journals RAD_IQ: A free software for characterization of digital X-ray imaging devices based on the novel IEC 62220-1-1:2015 International Standard

2021 ◽  
Vol 2090 (1) ◽  
pp. 012107
Author(s):  
A Konstantinidis ◽  
N Martini ◽  
V Koukou ◽  
G Fountos ◽  
N Kalyvas ◽  
...  
Keyword(s):  
Diagnostic Radiology ◽  
Noise Power ◽  
The Novel ◽  
Transfer Property ◽  
Noise Component ◽  
X Ray ◽  
International Standard ◽  
Software Products ◽  
X Ray Imaging

Abstract Characterization of digital X-ray imaging devices is very important because it can be used to measure and compare the performance of detectors used in Diagnostic Radiology. This characterization is usually made through the calculation of Modulation Transfer Function (MTF), Noise Power Spectrum (NPS) and Detective Quantum Efficiency (DQE). These parameters, especially the DQE, are very important because they quantify the effect of spatial resolution, contrast and noise on Radiographic image quality (IQ). The IEC 62220-1-1:2015 International Standard provides comprehensive guidelines how to capture and analyze X-ray images to characterize digital X-ray detectors. A novel, fast and free MATLAB-based software was developed, named RAD_IQ, to calculate the Signal Transfer Property (STP), perform Noise Component Analysis (NCA), and calculate the parameters MTF, NPS & DQE of X-ray detectors based on the novel IEC 62220-1-1:2015 International Standard for General Radiography and IEC 62220-1-1:2007 for Digital Mammography. Our results were validated against well-established software products used for quantitative image analysis of digital X-ray detectors. The calculated parameters were within 5% difference compared to available software products. The conclusion of our study was that RAD_IQ can be easily used from Medical Physicists, Biomedical Engineers and researchers without any programming experience to characterize the performance of digital X-ray detectors used in Diagnostic Radiology.

scholarly journals Recent Development in X-Ray Imaging Technology: Future and Challenges

Research ◽  
2021 ◽  
Vol 2021 ◽  
pp. 1-18
Author(s):  
Xiangyu Ou ◽  
Xue Chen ◽  
Xianning Xu ◽  
Lili Xie ◽  
Xiaofeng Chen ◽  
...  
Keyword(s):  
High Performance ◽  
Low Cost ◽  
Rapid Development ◽  
The Body ◽  
Future Research ◽  
X Rays ◽  
X Ray ◽  
Advantages And Disadvantages ◽  
X Ray Imaging ◽  
Imaging Performance

X-ray imaging is a low-cost, powerful technology that has been extensively used in medical diagnosis and industrial nondestructive inspection. The ability of X-rays to penetrate through the body presents great advances for noninvasive imaging of its internal structure. In particular, the technological importance of X-ray imaging has led to the rapid development of high-performance X-ray detectors and the associated imaging applications. Here, we present an overview of the recent development of X-ray imaging-related technologies since the discovery of X-rays in the 1890s and discuss the fundamental mechanism of diverse X-ray imaging instruments, as well as their advantages and disadvantages on X-ray imaging performance. We also highlight various applications of advanced X-ray imaging in a diversity of fields. We further discuss future research directions and challenges in developing advanced next-generation materials that are crucial to the fabrication of flexible, low-dose, high-resolution X-ray imaging detectors.

A sample preparation and microprobe x-ray imaging method for histological localization of cisplatin

1986 ◽  
Vol 44 ◽  
pp. 370-371
Author(s):  
G.R. Hook
Keyword(s):  
Sample Preparation ◽  
Abdominal Wall ◽  
Analytical Method ◽  
Analytical Methods ◽  
Imaging Method ◽  
Chemotherapeutic Drug ◽  
X Ray ◽  
X Ray Imaging ◽  
Head Neck

Cis-diamminedichloroplatinuum II (CDDP or cisplatin) is a chemotherapeutic drug used to treat cancers of the testicals, ovaries, head, neck and bladder. Although the histological distribution of cisplatin may provide important information on the drug's affect, the cisplatin histological distribution has not been determined because suitable sample preparation and analytical methods have not been developed. We describe here a sample preparation and analytical method to image cisplatin at histological resolution within rat abdominal wall tissue.

Sign in / Sign up

Export Citation Format

Share Document