scholarly journals Structural and Electronic Properties of Polycrystalline InAs Thin Films Deposited on Silicon Dioxide and Glass at Temperatures below 500 °C

Crystals ◽  
2021 ◽  
Vol 11 (2) ◽  
pp. 160 ◽  
Author(s):  
Anya Curran ◽  
Agnieszka Gocalinska ◽  
Andrea Pescaglini ◽  
Eleonora Secco ◽  
Enrica Mura ◽  
...  

Polycrystalline indium arsenide (poly InAs) thin films grown at 475 °C by metal organic vapor phase epitaxy (MOVPE) are explored as possible candidates for low-temperature-grown semiconducting materials. Structural and transport properties of the films are reported, with electron mobilities of ~100 cm2/V·s achieved at room temperature, and values reaching 155 cm2/V·s for a heterostructure including the polycrystalline InAs film. Test structures fabricated with an aluminum oxide (Al2O3) top-gate dielectric show that transistor-type behavior is possible when poly InAs films are implemented as the channel material, with maximum ION/IOFF > 250 achieved at −50 °C and ION/IOFF = 90 at room temperature. Factors limiting the ION/IOFF ratio are investigated and recommendations are made for future implementation of this material.

2011 ◽  
Vol 23 (12) ◽  
pp. 774-776 ◽  
Author(s):  
A B Krysa ◽  
D G Revin ◽  
J P Commin ◽  
C N Atkins ◽  
K Kennedy ◽  
...  

2014 ◽  
Vol 5 (1) ◽  
Author(s):  
Yiyin Mao ◽  
Junwei Li ◽  
Wei Cao ◽  
Yulong Ying ◽  
Pan Hu ◽  
...  

2014 ◽  
Vol 115 (11) ◽  
pp. 113508 ◽  
Author(s):  
Stéphane Brochen ◽  
Matthieu Lafossas ◽  
Ivan-Christophe Robin ◽  
Pierre Ferret ◽  
Frédérique Gemain ◽  
...  

2009 ◽  
Vol 6 (S2) ◽  
pp. S1029-S1032 ◽  
Author(s):  
T. Baghdadli ◽  
S. Ould Saad Hamady ◽  
S. Gautier ◽  
T. Moudakir ◽  
B. Benyoucef ◽  
...  

2006 ◽  
Vol 99 (2) ◽  
pp. 023514 ◽  
Author(s):  
J. Zúñiga-Pérez ◽  
V. Muñoz-Sanjosé ◽  
M. Lorenz ◽  
G. Benndorf ◽  
S. Heitsch ◽  
...  

1997 ◽  
Vol 493 ◽  
Author(s):  
H. Wang ◽  
Z. Wang ◽  
S. X. Shang ◽  
M. Wang

ABSTRACTFerroelectric Bi4Ti3O12 thin films were grown by atmospheric pressure metal-organic chemical vapor deposition. After rapid thermal annealing (RTA), the films have a (001) preferred orientation, The I-V and C-V characteristics were studied, the resistivity were in the rang of 1010∼1013 ω. cm, at room temperature. The memory window is about 3V. These results snow that The Bi4Ti3O12 films prepared at present work are suitable for making ferroelectric FEFETs memories. By using planar silicon processing, the FEFET devices have been fabricated, which shows clearly memory effect under a applied ±5V gate voltage.


2010 ◽  
Vol 150 (35-36) ◽  
pp. 1646-1649 ◽  
Author(s):  
Fengzhen Huang ◽  
Xiaomei Lu ◽  
Cong Chen ◽  
Weiwei Lin ◽  
Xiaochun Chen ◽  
...  

2000 ◽  
Vol 639 ◽  
Author(s):  
Hideki Hirayama ◽  
Atsuhiro Kinoshita ◽  
Takuya Yamanaka ◽  
Akira Hirata ◽  
Yoshinobu Aoyagi

ABSTRACTWe demonstrate room temperature intense ultraviolet (UV) emission wavelength ranging 300- 340 nm from InxAlyGa1-x-yN quaternary alloys grown by metal-organic vapor-phase-epitaxy (MOVPE). We found that the UV emission is drastically enhanced by introducing several percent of In into AlGaN. We fabricated single quantum well (SQW) consisting of InxAlyGa1-x-yN quaternary well and barrier, and clearly observed In segregation of sub-micron size from a cathode luminescence (CL) images. The intensity of 320nm-band emission from InAlGaN/InAlGaN QWs were as strong as those of 410nm-band emission from InGaN based QWs, at room temperature. The temperature dependence of photoluminescence (PL) emission for InAlGaN based QWs were much improved in comparison with GaN or AlGaN based QWs. We also grew Mg-doped InxAlyGa1-x-yN quaternary, and obtained hole concentration of 3×1017cm−3 by Hall measurement for high Al content (more than 50%) InxAlyGa1-x-yN quaternary.


Sign in / Sign up

Export Citation Format

Share Document