scholarly journals Synthesis of Dinaphtho[2,3-d:2’,3’-d’]anthra[1,2-b:5,6-b’]dithiophene (DNADT) Derivatives: Effect of Alkyl Chains on Transistor Properties

2020 ◽  
Vol 21 (7) ◽  
pp. 2447
Author(s):  
Takumi Ishida ◽  
Yuta Sawanaka ◽  
Ryota Toyama ◽  
Zhenfei Ji ◽  
Hiroki Mori ◽  
...  
Keyword(s):  
Field Effect ◽  
Theoretical Calculations ◽  
Grazing Incidence ◽  
Aromatic Rings ◽  
Force Microscopy ◽  
Alkyl Chains ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Type Molecule ◽  
Effect Transistor

To investigate organic field-effect transistor (OFET) properties, a new thienoacene-type molecule, 4,14-dihexyldinaphtho[2,3-d:2’,3’-d’]anthra[1,2-b:5,6-b’]dithiophene (C6-DNADT), consisting of π-conjugated nine aromatic rings and two hexyl chains along the longitudinal molecular axis has been successfully synthesized by sequential reactions, including Negishi coupling, epoxidation, and cycloaromatization. The fabricated OFET using thin films of C6-DNADT exhibited p-channel FET properties with field-effect mobilities (µ) of up to 2.6 × 10−2 cm2 V−1 s−1, which is ca. three times lower than that of the parent DNADT molecule (8.5 × 10−2 cm2 V−1 s−1). Although this result implies that the installation of relatively short alkyl chains into the DNADT core is not suitable for transistor application, the origins for the FET performance obtained in this work is fully discussed, based on theoretical calculations and solid-state structure of C6-DNADT by grazing incidence wide-angle X-ray scattering (GIWAXS) and atomic force microscopy (AFM) analyses. The results obtained in this study disclose the effect of alkyl chains introduced onto the molecule on transistor characteristics.

scholarly journals Thin-film morphologies of block copolymers with nanoparticles

2015 ◽  
Vol 30 (S1) ◽  
pp. S16-S24 ◽  
Author(s):  
Dieter Jehnichen ◽  
Doris Pospiech ◽  
Peter Friedel ◽  
Guping He ◽  
Alessandro Sepe ◽  
...  
Keyword(s):  
Thin Films ◽  
Diblock Copolymers ◽  
Grazing Incidence ◽  
Polymer Surfaces ◽  
Nanostructured Surfaces ◽  
Force Microscopy ◽  
Molar Ratios ◽  
X Ray Scattering ◽  
Atomic Force

Diblock copolymers (BCPs) show phase separation on mesoscopic length scales and form ordered morphologies in both bulk and thin films, the latter resulting in nanostructured surfaces. Morphologies in thin films are strongly influenced by film parameters, the ratio of film thickness and bulk domain spacing. Laterally structured polymer surfaces may serve as templates for controlled assembly of nanoparticles (NPs). We investigated the BCP of poly(n-pentyl methacrylate) and poly(methyl methacrylate) which show bulk morphologies of stacked lamellae or hexagonally packed cylinders. Thin films were investigated by atomic force microscopy and grazing-incidence small-angle X-ray scattering. For film thicknesses f well below dbulk, standing cylinder morphologies were observed in appropriate molar ratios, while film thicknesses around and larger than dbulk resulted in cylinders arranged parallel to surface. To alter and/or improve the morphology also in presence of different NPs (e.g., silica, gold), solvent vapour annealing (SVA) was applied. The BCP morphology usually remains unchanged but periodicities change depending on type and amount of incorporated NPs. It was found that silica clusters enlarge lateral distances of cylinders, whereas Au NPs reduce it. The effect of SVA is weak. The quality of morphology is slightly improved by SVA and lateral distances remain constant or are slightly reduced.

Nanometer surface gratings on Si(100) characterized by x-ray scattering under grazing incidence and atomic force microscopy

1997 ◽  
Vol 81 (3) ◽  
pp. 1212-1216 ◽  
Author(s):  
T. H. Metzger ◽  
K. Haj-Yahya ◽  
J. Peisl ◽  
M. Wendel ◽  
H. Lorenz ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Grazing Incidence ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Ray Scattering

scholarly journals A non-volatile resistive memory effect in 2,2′,6,6′-tetraphenyl-dipyranylidene thin films as observed in field-effect transistors and by conductive atomic force microscopy

RSC Advances ◽  
2017 ◽  
Vol 7 (6) ◽  
pp. 3336-3342 ◽  
Author(s):  
Marc Courté ◽  
Sandeep G. Surya ◽  
Ramesh Thamankar ◽  
Chao Shen ◽  
V. Ramgopal Rao ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Memory Effect ◽  
Field Effect ◽  
Field Effect Transistor ◽  
Field Effect Transistors ◽  
Resistive Memory ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Effect Transistor

A non-volatile resistive memory effect is observed in 2,2′,6,6′-tetraphenyldipyranylidene (DIPO-Ph4), a large planar quinoïd π-conjugated heterocycle, in a field-effect transistor (FET) configuration and by conductive atomic force microscopy (c-AFM).

scholarly journals Characterization of the shape and line-edge roughness of polymer gratings with grazing incidence small-angle X-ray scattering and atomic force microscopy

2016 ◽  
Vol 49 (3) ◽  
pp. 823-834 ◽  
Author(s):  
Hyo Seon Suh ◽  
Xuanxuan Chen ◽  
Paulina A. Rincon-Delgadillo ◽  
Zhang Jiang ◽  
Joseph Strzalka ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Grazing Incidence ◽  
Line Edge Roughness ◽  
X Ray ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Edge Roughness ◽  
Average Shape ◽  
Polymer Gratings

Grazing-incidence small-angle X-ray scattering (GISAXS) is increasingly used for the metrology of substrate-supported nanoscale features and nanostructured films. In the case of line gratings, where long objects are arranged with a nanoscale periodicity perpendicular to the beam, a series of characteristic spots of high-intensity (grating truncation rods, GTRs) are recorded on a two-dimensional detector. The intensity of the GTRs is modulated by the three-dimensional shape and arrangement of the lines. Previous studies aimed to extract an average cross-sectional profile of the gratings, attributing intensity loss at GTRs to sample imperfections. Such imperfections are just as important as the average shape when employing soft polymer gratings which display significant line-edge roughness. Herein are reported a series of GISAXS measurements of polymer line gratings over a range of incident angles. Both an average shape and fluctuations contributing to the intensity in between the GTRs are extracted. The results are critically compared with atomic force microscopy (AFM) measurements, and it is found that the two methods are in good agreement if appropriate corrections for scattering from the substrate (GISAXS) and contributions from the probe shape (AFM) are accounted for.

“Hairy Tube” Polymer Templates From Diblock Copolymer Thin Films

2002 ◽  
Vol 728 ◽  
Author(s):  
Igor Tokarev ◽  
Sergiy Minko ◽  
Manfred Stamm
Keyword(s):  
Plasma Etching ◽  
Hexagonal Lattice ◽  
Grazing Incidence ◽  
Thin Polymer Films ◽  
Force Microscopy ◽  
X Ray Scattering ◽  
Polymer Templates ◽  
Atomic Force ◽  
Thin Polymer ◽  
Regular Arrays

AbstractWe report about the fabrication of polymeric nanotemplates for the fabrication of regular arrays of nanocylindrical domains. Using combi-like macromolecules obtained by complexation of polystyrene-block-poly(4-vinylpyridine) (PS-b-P4VP) copolymer with a low molecular weight surfactant pentadecylphenol (PDP) we prepared thin polymer films deposited on a neutral substrate. The block-copolymer – PDP complex segregates into cylindrical morphology formed by P4VP-PDP fragments. The PDP molecules were easily removed by selective solvent (methanol) after annealing of the film. The resulting morphology consists of cylindrical channels of 7-8 nm in diameter oriented perpendicular to the substrate and regular packed in the hexagonal lattice with the period of 21 nm. Dry plasma etching, Atomic Force Microscopy (AFM), and Grazing Incidence Small Angle X-ray Scattering (GISAXS) were employed to characterize the films.

Growth of thermally stable crystalline C60 films on flat-lying copper phthalocyanine

2016 ◽  
Vol 4 (3) ◽  
pp. 1028-1032 ◽  
Author(s):  
Terry McAfee ◽  
Aubrey Apperson ◽  
Harald Ade ◽  
Daniel B. Dougherty
Keyword(s):  
Copper Phthalocyanine ◽  
Grazing Incidence ◽  
Thermally Stable ◽  
X Ray ◽  
Force Microscopy ◽  
Cupc Film ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Stable Growth ◽  
C60 Films

We observe thermally stable growth of fcc(111) films of fullerene-C60 on top of crystalline, flat-lying, CuPc film structures on graphite using combined grazing incidence wide-angle X-ray scattering and atomic force microscopy.

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