scholarly journals Thin-film morphologies of block copolymers with nanoparticles

2015 ◽  
Vol 30 (S1) ◽  
pp. S16-S24 ◽  
Author(s):  
Dieter Jehnichen ◽  
Doris Pospiech ◽  
Peter Friedel ◽  
Guping He ◽  
Alessandro Sepe ◽  
...  
Keyword(s):  
Thin Films ◽  
Diblock Copolymers ◽  
Grazing Incidence ◽  
Polymer Surfaces ◽  
Nanostructured Surfaces ◽  
Force Microscopy ◽  
Molar Ratios ◽  
X Ray Scattering ◽  
Atomic Force

Diblock copolymers (BCPs) show phase separation on mesoscopic length scales and form ordered morphologies in both bulk and thin films, the latter resulting in nanostructured surfaces. Morphologies in thin films are strongly influenced by film parameters, the ratio of film thickness and bulk domain spacing. Laterally structured polymer surfaces may serve as templates for controlled assembly of nanoparticles (NPs). We investigated the BCP of poly(n-pentyl methacrylate) and poly(methyl methacrylate) which show bulk morphologies of stacked lamellae or hexagonally packed cylinders. Thin films were investigated by atomic force microscopy and grazing-incidence small-angle X-ray scattering. For film thicknesses f well below dbulk, standing cylinder morphologies were observed in appropriate molar ratios, while film thicknesses around and larger than dbulk resulted in cylinders arranged parallel to surface. To alter and/or improve the morphology also in presence of different NPs (e.g., silica, gold), solvent vapour annealing (SVA) was applied. The BCP morphology usually remains unchanged but periodicities change depending on type and amount of incorporated NPs. It was found that silica clusters enlarge lateral distances of cylinders, whereas Au NPs reduce it. The effect of SVA is weak. The quality of morphology is slightly improved by SVA and lateral distances remain constant or are slightly reduced.

Comparative study of the roughness of optical surfaces and thin films by use of x-ray scattering and atomic force microscopy

1999 ◽  
Vol 38 (4) ◽  
pp. 684 ◽  
Author(s):  
Victor E. Asadchikov ◽  
Angela Duparré ◽  
Stefan Jakobs ◽  
Albert Yu. Karabekov ◽  
Igor V. Kozhevnikov ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Comparative Study ◽  
X Ray ◽  
Force Microscopy ◽  
Optical Surfaces ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Ray Scattering

Analysis of randomly oriented structures by grazing-incidence small-angle neutron scattering

2012 ◽  
Vol 45 (2) ◽  
pp. 245-254 ◽  
Author(s):  
Denis Korolkov ◽  
Peter Busch ◽  
Lutz Willner ◽  
Emmanuel Kentzinger ◽  
Ulrich Rücker ◽  
...  
Keyword(s):  
Molecular Weight ◽  
Small Angle ◽  
Diblock Copolymers ◽  
Weight Fraction ◽  
Grazing Incidence ◽  
Force Microscopy ◽  
Self Organized ◽  
Atomic Force ◽  
Instrumental Resolution ◽  
Evaluation Of Data

A formalism is presented which allows the quantitative evaluation of data from grazing-incidence small-angle neutron and X-ray scattering – GISANS and GISAXS – in the framework of the distorted wave Born approximation. While several aspects have been reported previously, this formalism combines solutions for scattering intensities in both reflection and transmission hemispheres, taking into account instrumental resolution effects. This formalism is applied to the case of GISANS from self-organized diblock copolymers, ordered in perpendicular lamellar structures on an Si wafer in randomly oriented short-range-ordered regions. The periodicity ofD= 85 (9) nm found for deuterated polystyrene–polybutadiene of molecular weight  Mw= 165 kg mol−1and a molecular weight fraction of the deuterated polystyrene block of 52% is consistent with atomic force microscopy and specular neutron reflectivity results.

Thin Films of Poly(isoprene-b-ethylene Oxide) Diblock Copolymers on Mica: An Atomic Force Microscopy Study

Langmuir ◽  
2013 ◽  
Vol 29 (7) ◽  
pp. 2339-2349 ◽  
Author(s):  
Michail Kalloudis ◽  
Emmanouil Glynos ◽  
Stergios Pispas ◽  
John Walker ◽  
Vasileios Koutsos
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Ethylene Oxide ◽  
Diblock Copolymers ◽  
Microscopy Study ◽  
Atomic Force Microscopy Study ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Structural and Morphological Properties of As-Deposited and Heat Treated Blended Graphene Oxide / Poly(3,4-Ethylenedioxythiophene)-Poly(Styrenesulfonate) Thin Films

2021 ◽  
pp. 4416-4424
Author(s):  
Saja Qasim ◽  
Ameer F. AbdulAmeer ◽  
Ali H A Jalaukhan
Keyword(s):  
Thin Films ◽  
Graphene Oxide ◽  
Xrd Analysis ◽  
Morphological Properties ◽  
Sem Images ◽  
Force Microscopy ◽  
Atomic Force ◽  
Heat Treated ◽  
Spin Coater

    In this study the as-deposited and heat treated at 423K of conductive blend graphene oxide (GO)/ poly(3,4-ethylenedioxythiophene)-poly(styrenesulfonate) (PEDOT:PSS) thin films was prepared with different PEDOT:PSS concentration (0, 0.25, 0.5, 0.75 and 1)w/w on pre-cleaned glass substrate by spin coater. The XRD analysis indicate the existence of the preffered peak (001) of GO around 2θ=8.24° which is domain in all GO/ PEDOT:PSS films characterized for GO, this result approve the good quality of the PEDOT:PSS dispersion in GO, this peak shifted to the lower 2θ with increasing PEDOT:PSS concentration and after annealing process. The scanning electron microscopy (SEM) images and atomic force microscopy (AFM) clearly show the GO flakes and go to disappear with increasing the PEDOT:PSS concentration. 

scholarly journals Synthesis of Dinaphtho[2,3-d:2’,3’-d’]anthra[1,2-b:5,6-b’]dithiophene (DNADT) Derivatives: Effect of Alkyl Chains on Transistor Properties

2020 ◽  
Vol 21 (7) ◽  
pp. 2447
Author(s):  
Takumi Ishida ◽  
Yuta Sawanaka ◽  
Ryota Toyama ◽  
Zhenfei Ji ◽  
Hiroki Mori ◽  
...  
Keyword(s):  
Field Effect ◽  
Theoretical Calculations ◽  
Grazing Incidence ◽  
Aromatic Rings ◽  
Force Microscopy ◽  
Alkyl Chains ◽  
X Ray Scattering ◽  
Atomic Force ◽  
Type Molecule ◽  
Effect Transistor

To investigate organic field-effect transistor (OFET) properties, a new thienoacene-type molecule, 4,14-dihexyldinaphtho[2,3-d:2’,3’-d’]anthra[1,2-b:5,6-b’]dithiophene (C6-DNADT), consisting of π-conjugated nine aromatic rings and two hexyl chains along the longitudinal molecular axis has been successfully synthesized by sequential reactions, including Negishi coupling, epoxidation, and cycloaromatization. The fabricated OFET using thin films of C6-DNADT exhibited p-channel FET properties with field-effect mobilities (µ) of up to 2.6 × 10−2 cm2 V−1 s−1, which is ca. three times lower than that of the parent DNADT molecule (8.5 × 10−2 cm2 V−1 s−1). Although this result implies that the installation of relatively short alkyl chains into the DNADT core is not suitable for transistor application, the origins for the FET performance obtained in this work is fully discussed, based on theoretical calculations and solid-state structure of C6-DNADT by grazing incidence wide-angle X-ray scattering (GIWAXS) and atomic force microscopy (AFM) analyses. The results obtained in this study disclose the effect of alkyl chains introduced onto the molecule on transistor characteristics.

Effects of nanoparticles on phase morphology in thin films of phase-separated diblock copolymers

2017 ◽  
Vol 32 (S1) ◽  
pp. S141-S150
Author(s):  
Dieter Jehnichen ◽  
Doris Pospiech ◽  
Peter Friedel ◽  
Andriy Horechyy ◽  
Andreas Korwitz ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Phase Separation ◽  
Diblock Copolymers ◽  
Force Microscopy ◽  
Atomic Force ◽  
Gold Silver ◽  
Lateral Distance ◽  
Morphology Changes ◽  
Periodic Nanostructure

This study investigates the morphology changes in thin diblock copolymer (DiBCP) films occurring in the interaction with modified nanoparticles (NPs). Magnetite (Fe3O4) and silica (SiOx) were prepared and used. Poly(pentyl methacrylate-b-methyl methacrylate) (PPMA-b-PMMA) (70/30 mol mol−1, hcp cylinders of the PMMA phase) DiBCP were employed to prepare thin films having thicknesses to realize standing cylinders in pure DiBCP films. The investigations aimed at two topics: (1) morphology after controlled incorporation of organo-modified NP (gold, silver, Fe3O4, SiOx) and (2) additional solvent vapour annealing (SVA) with tetrahydrofuran (and chloroform for comparison). The laterally ordered morphology in thin films was examined by GISAXS and atomic force microscopy. Keeping the same type of morphology in nanocomposites, the dimensions of the periodic nanostructure altered depending on type and amount of incorporated NP. It was found that SiOx clusters enlarge the lateral distance of the PMMA cylinders, whereas metallic NPs reduce this parameter. Applying SVA improves the phase separation slightly, whereas lateral distances were kept constant or were reduced a little. Switching of domain orientation upon SVA could not be detected in the presence of NPs located at the polymer/substrate interface.

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