scholarly journals Evaluation of the Cross-Sectional Shape of μ–Grooves Produced in Stainless Steel 304 by Laser-Induced Etching Technique

Micromachines ◽  
2021 ◽  
Vol 12 (2) ◽  
pp. 144
Author(s):  
Jonghun Kim ◽  
Kwang H. Oh

The variation in cross-sectional profile of a microgroove fabricated with focused and diverging laser irradiation is demonstrated with ray tracing. To verify the result of ray tracing, stainless-steel 304 microgrooves were manufactured utilizing the conventional lens-based and optical fiber-based laser-induced etching techniques in phosphoric acid solution. Three distinctive groove geometries, i.e., a flat surface with no groove, an intermediate stage groove, and a fully developed V-groove, were rendered for numerical analysis. For focusing mode, the first and second reflections were caused by high laser intensity and the second reflected beam could lead to variation in the groove shape such as a U-shaped groove or a V-shaped groove in accordance with etchant concentration. On the contrary, a weak laser entirely distributed at the groove sidewall could not induce a chemical reaction, leading to a V-shaped groove. The effect of process variables such as laser power (intensity) and etchant concentration on the cross-sectional profiles of a groove are closely examined through the computed simulation results.

Author(s):  
Asif Mohammed ◽  
Katherine A. Cashell

AbstractThis paper investigates the structural behaviour and design of duplex and ferritic stainless steel stub columns with a circular hollow cross-section (CHS) at elevated temperature. A numerical model is developed to supplement the limited test results on stainless steel CHS stub columns in the literature. Following validation, the numerical approach is employed to gain an understanding of the critical behavioural characteristics which have not previously been studied. In addition, the paper considers and extends the continuous strength method (CSM) to include duplex and ferritic stainless steel for CHS stub columns in fire. The CSM employs a base curve linking the cross-section resistance to its deformation capacity and implements an elastic, linear hardening material model. The cross-sectional resistances obtained from the proposed CSM are compared with those from the numerical analysis, as well as with the standardised procedures in the European, American and Australia/New Zealand design standards. It is demonstrated that CSM can lead to more accurate and less scattered strength predictions than current design codes.


Author(s):  
J.-F. Revol ◽  
Y. Van Daele ◽  
F. Gaill

The only form of cellulose which could unequivocally be ascribed to the animal kingdom is the tunicin that occurs in the tests of the tunicates. Recently, high-resolution solid-state l3C NMR revealed that tunicin belongs to the Iβ form of cellulose as opposed to the Iα form found in Valonia and bacterial celluloses. The high perfection of the tunicin crystallites led us to study its crosssectional shape and to compare it with the shape of those in Valonia ventricosa (V.v.), the goal being to relate the cross-section of cellulose crystallites with the two allomorphs Iα and Iβ.In the present work the source of tunicin was the test of the ascidian Halocvnthia papillosa (H.p.). Diffraction contrast imaging in the bright field mode was applied on ultrathin sections of the V.v. cell wall and H.p. test with cellulose crystallites perpendicular to the plane of the sections. The electron microscope, a Philips 400T, was operated at 120 kV in a low intensity beam condition.


1960 ◽  
Vol 19 (3) ◽  
pp. 803-809
Author(s):  
D. J. Matthews ◽  
R. A. Merkel ◽  
J. D. Wheat ◽  
R. F. Cox

2018 ◽  
Author(s):  
Sang Hoon Lee ◽  
Jeff Blackwood ◽  
Stacey Stone ◽  
Michael Schmidt ◽  
Mark Williamson ◽  
...  

Abstract The cross-sectional and planar analysis of current generation 3D device structures can be analyzed using a single Focused Ion Beam (FIB) mill. This is achieved using a diagonal milling technique that exposes a multilayer planar surface as well as the cross-section. this provides image data allowing for an efficient method to monitor the fabrication process and find device design errors. This process saves tremendous sample-to-data time, decreasing it from days to hours while still providing precise defect and structure data.


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