scholarly journals An Investigation of the Adsorption of Xanthate on Bornite in Aqueous Solutions using an Atomic Force Microscope

Minerals ◽  
2021 ◽  
Vol 11 (8) ◽  
pp. 906
Author(s):  
Jinhong Zhang
Keyword(s):  
Aqueous Solutions ◽  
Atomic Force Microscope ◽  
Force Measurement ◽  
Attenuated Total Reflection ◽  
Solution Ph ◽  
Substrate Adhesion ◽  
Atomic Force ◽  
Measurement Results ◽  
Industry Practice

An atomic force microscope (AFM) was applied to study of the adsorption of xanthate on bornite surfaces in situ in aqueous solutions. AFM images showed that xanthate, i.e., potassium ethyl xanthate (KEX) and potassium amyl xanthate (PAX), adsorbed strongly on bornite, and the adsorbate bound strongly with the mineral surface without being removed by flushing with ethanol alcohol. The AFM images also showed that the adsorption increased with the increased collector concentration and contact time. Xanthate adsorbed on bornite in a similar manner when the solution pH changed to pH 10. The AFM force measurement results showed that the probe–substrate adhesion increased due to the adsorption of xanthate on bornite. The sharp “jump-in” and “jump-off” points on force curve suggest that the adsorbate is not “soft” in nature, ruling out the existence of dixanthogen, an oily substance. Finally, the ATR-FTIR (attenuated total reflection-Fourier-transform infrared) result confirms that the adsorbate on bornite in xanthate solutions is mainly in the form of insoluble cuprous xanthate (CuX) instead of dixanthogen. This xanthate/bornite adsorption mechanism is very similar to what is obtained with the xanthate/chalcocite system, while it is different from the xanthate/chalcopyrite system, for which oily dixanthogen is the main adsorption product on the chalcopyrite surface. The present study helps clarify the flotation mechanism of bornite in industry practice using xanthate as a collector.

Imaging polymers, proteins and dna in aqueous solutions with the atomic force microscope

1989 ◽  
Vol 47 ◽  
pp. 32-33
Author(s):  
S.A.C. Gould ◽  
B. Drake ◽  
C.B. Prater ◽  
A.L. Weisenhorn ◽  
S.M. Lindsay ◽  
...  
Keyword(s):  
Amino Acids ◽  
Dna Sequencing ◽  
Aqueous Solutions ◽  
Atomic Force Microscope ◽  
Piezoelectric Crystal ◽  
Atomic Force ◽  
Structure Of Molecules ◽  
Optical Lever

The atomic force microscope (AFM) is an instrument that can be used to image many samples of interest in biology and medicine. Images of polymerized amino acids, polyalanine and polyphenylalanine demonstrate the potential of the AFM for revealing the structure of molecules. Images of the protein fibrinogen which agree with TEM images demonstrate that the AFM can provide topographical data on larger molecules. Finally, images of DNA suggest the AFM may soon provide an easier and faster technique for DNA sequencing.The AFM consists of a microfabricated SiO2 triangular shaped cantilever with a diamond tip affixed at the elbow to act as a probe. The sample is mounted on a electronically driven piezoelectric crystal. It is then placed in contact with the tip and scanned. The topography of the surface causes minute deflections in the 100 μm long cantilever which are detected using an optical lever.

Anin situatomic force microscope for normal-incidence nanofocus X-ray experiments

2016 ◽  
Vol 23 (5) ◽  
pp. 1110-1117 ◽  
Author(s):  
M. V. Vitorino ◽  
Y. Fuchs ◽  
T. Dane ◽  
M. S. Rodrigues ◽  
M. Rosenthal ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
High Speed ◽  
Normal Incidence ◽  
Organic Thin Film ◽  
X Ray ◽  
Atomic Force ◽  
Synchrotron Beamlines

A compact high-speed X-ray atomic force microscope has been developed forin situuse in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.

scholarly journals In situ observation of streptavidin-biotin binding on an immunoassay well surface using an atomic force microscope

FEBS Letters ◽  
1996 ◽  
Vol 390 (2) ◽  
pp. 161-164 ◽  
Author(s):  
S. Allen ◽  
J. Davies ◽  
A.C. Dawkes ◽  
M.C. Davies ◽  
J.C. Edwards ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
In Situ Observation ◽  
Atomic Force ◽  
Biotin Binding

scholarly journals Atomic force microscope with an adjustable probe direction and piezoresistive cantilevers operated in tapping-mode / Im Tapping-Modus betriebenes Rasterkraftmikroskop mit einstellbarer Antastrichtung und piezoresistiven Cantilevern

2019 ◽  
Vol 86 (s1) ◽  
pp. 12-16
Author(s):  
Janik Schaude ◽  
Julius Albrecht ◽  
Ute Klöpzig ◽  
Andreas C. Gröschl ◽  
Tino Hausotte
Keyword(s):  
Atomic Force Microscope ◽  
Metrological Traceability ◽  
Step Height ◽  
Tapping Mode ◽  
Atomic Force ◽  
In Situ Calibration ◽  
Measuring Machine ◽  
Piezoresistive Cantilevers

AbstractThis article presents a new tilting atomic force microscope (AFM) with an adjustable probe direction and piezoresistive cantilever operated in tapping-mode. The AFM is based on two rotational axes, which enable the adjustment of the probe direction to cover a complete hemisphere. The whole setup is integrated into a nano measuring machine (NMM-1) and the metrological traceability of the piezoresistive cantilever is warranted by in situ calibration on the NMM-1. To demonstrate the capabilities of the tilting AFM, measurements were conducted on a step height standard.

scholarly journals Nanopipette/Nanorod-Combined Quartz Tuning Fork–Atomic Force Microscope

Sensors ◽  
2019 ◽  
Vol 19 (8) ◽  
pp. 1794 ◽  
Author(s):  
Sangmin An ◽  
Wonho Jhe
Keyword(s):  
Atomic Force Microscope ◽  
Tuning Fork ◽  
High Sensitivity ◽  
Quartz Tuning Fork ◽  
Force Sensor ◽  
Au Nanoparticle ◽  
Ambient Conditions ◽  
Atomic Force ◽  
In Situ Detection

We introduce a nanopipette/quartz tuning fork (QTF)–atomic force microscope (AFM) for nanolithography and a nanorod/QTF–AFM for nanoscratching with in situ detection of shear dynamics during performance. Capillary-condensed nanoscale water meniscus-mediated and electric field-assisted small-volume liquid ejection and nanolithography in ambient conditions are performed at a low bias voltage (~10 V) via a nanopipette/QTF–AFM. We produce and analyze Au nanoparticle-aggregated nanowire by using nanomeniscus-based particle stacking via a nanopipette/QTF–AFM. In addition, we perform a nanoscratching technique using in situ detection of the mechanical interactions of shear dynamics via a nanorod/QTF–AFM with force sensor capability and high sensitivity.

In Situ Atomic Force Microscope Imaging of Supported Lipid Bilayers

2001 ◽  
Vol 2 (2) ◽  
pp. 105-108 ◽  
Author(s):  
Thomas Kaasgaard ◽  
Chad Leidy ◽  
John Hjort Ipsen ◽  
Ole G. Mouritsen ◽  
Kent Jørgensen
Keyword(s):  
Atomic Force Microscope ◽  
Lipid Bilayers ◽  
Supported Lipid Bilayers ◽  
Atomic Force ◽  
Microscope Imaging
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