Growth and Self-Assembly of Silicon–Silicon Carbide Nanoparticles into Hybrid Worm-Like Nanostructures at the Silicon Wafer Surface
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This work describes the growth of silicon–silicon carbide nanoparticles (Si–SiC) and their self-assembly into worm-like 1D hybrid nanostructures at the interface of graphene oxide/silicon wafer (GO/Si) under Ar atmosphere at 1000 °C. Depending on GO film thickness, spread silicon nanoparticles apparently develop on GO layers, or GO-embedded Si–SiC nanoparticles self-assembled into some-micrometers-long worm-like nanowires. It was found that the nanoarrays show that carbon–silicon-based nanowires (CSNW) are standing on the Si wafer. It was assumed that Si nanoparticles originated from melted Si at the Si wafer surface and GO-induced nucleation. Additionally, a mechanism for the formation of CSNW is proposed.
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2012 ◽
Vol 581-582
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pp. 790-793
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2004 ◽
Vol 471-472
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pp. 26-31
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1996 ◽
Vol 16
(7)
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pp. 703-712
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2009 ◽
Vol 69-70
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pp. 253-257
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New Measurement Concept of Nanometer-Level Defects on Si Wafer Surface by Using Micro Contact Sensor
2012 ◽
Vol 497
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pp. 137-141
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