scholarly journals PIXE and Its Applications to Elemental Analysis

2019 ◽  
Vol 3 (2) ◽  
pp. 12 ◽  
Author(s):  
Keizo Ishii
Keyword(s):  
Elemental Analysis ◽  
Production Cross ◽  
Trace Element Analysis ◽  
High Energy ◽  
Ion Beams ◽  
High Energy Resolution ◽  
Environmental Study ◽  
X Rays ◽  
Pixe Analysis ◽  
X Ray

When charged particles collide with atoms, atomic inner shell electrons become ionized, producing characteristic X-rays. This phenomenon is called particle-induced X-ray emission (PIXE). The characteristic X-ray production cross-sections from PIXE are very large, and the characteristic X-rays of elements contained in a sample are easily measured by a Silicon detector with a high energy resolution. Hence, sodium to uranium can be detected with a sensitivity of ppb~ppm, and PIXE has been applied to trace element analysis. Scanning ion beams can be used to obtain the spatial distributions of elements in a sample. Furthermore, the distributions of elements inside a cell can be investigated using micro ion beams. PIXE analysis is a very useful technique for multi-elemental analysis and is now widely used in many fields and applications, including chemistry, medicine, biology, archaeology, agriculture, materials science, fisheries science, geology, petrology, environmental study, contamination monitoring, resource search, semiconductors, metal, astrophysics, earth science, criminal investigations, and food.

High energy resolution PIXE spectroscopy at the J. Stefan Institute, Ljubljana

2014 ◽  
Vol 24 (03n04) ◽  
pp. 205-215
Author(s):  
M. Kavčič
Keyword(s):  
Trace Element ◽  
Energy Resolution ◽  
Trace Element Analysis ◽  
High Energy ◽  
Energy Dispersive ◽  
High Energy Resolution ◽  
Pixe Analysis ◽  
X Ray ◽  
Analytical Technique ◽  
Stefan Institute

While traditional proton induced X-ray emission (PIXE) analytical technique is based on the energy dispersive solid state detectors used to collect the X-ray fluorescence from the sample, wavelength dispersive X-ray (WDX) spectrometers are applied in high energy resolution PIXE (HR-PIXE) analysis. The main drawback of the WDX spectroscopy is the relatively low efficiency making it less applicable for trace element PIXE analysis. However, the efficiency was enhanced significantly in modern spectrometers employing cylindrically or even spherically curved crystals combined with position sensitive X-ray detectors. The energy resolution of such a spectrometer may exceed the resolution of the energy dispersive detector by two orders of magnitude while keeping the efficiency at a high enough level to perform trace element analysis. In this paper, the recent history and the development of HR-PIXE spectroscopy at the J. Stefan Institute in Ljubljana is presented. Our current setup based on in-vacuum Johansson-type crystal spectrometer is presented in more details followed by some most recent applications.

scholarly journals Chemical State Mapping via Soft X-rays using a Wavelength Dispersive Soft X-ray Emission Spectrometer with High Energy Resolution

2013 ◽  
Vol 19 (S2) ◽  
pp. 1258-1259 ◽  
Author(s):  
H. Takahashi ◽  
N. Handa ◽  
T. Murano ◽  
M. Terauchi ◽  
M. Koike ◽  
...  
Keyword(s):  
Energy Resolution ◽  
High Energy ◽  
Chemical State ◽  
High Energy Resolution ◽  
X Rays ◽  
X Ray

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

scholarly journals Development of STJ as a New X-Ray Detector

1998 ◽  
Vol 188 ◽  
pp. 335-336
Author(s):  
N. Y. Yamasaki ◽  
T. Ohashi ◽  
K. Kikuchi ◽  
H. Miyazaki ◽  
E. Rokutanda ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Effective Area ◽  
High Energy ◽  
High Energy Resolution ◽  
X Rays ◽  
Large Area ◽  
Position Resolution ◽  
X Ray ◽  
Plane Detector ◽  
Nippon Steel Corporation

STJs are promising X-ray detectors as high energy resolution spectrometers due to the small excitation energy to break the Cooper pairs to product detectable electrons. The expected energy resolution is about 5 eV for a 6 keV incident X-rays (see review by Kraus et al. and Esposito et al.). We have developed a large area (178 × 178μm2) Nb/Al/AlOX/Al/Nb STJs (Kurakado et al. 1993) and series-connected STJs with a position resolution of 35μm for α particles (Kurakado 1997) at Nippon Steel Corporation. As a focal plane detector in future X-ray missions, we are developing STJs whose targert characteristics are; an energy resolution of 20 eV at 6keV, an effective area of 1 cm2, and position resolution of 100μm.

HIGH-ENERGY PIXE: THE X-RAY SPECTRUM OF URANIUM IN AUTUNITE

1993 ◽  
Vol 03 (02) ◽  
pp. 121-127 ◽  
Author(s):  
NORMAN M. HALDEN ◽  
FRANK C. HAWTHORNE
Keyword(s):  
Solid State ◽  
Proton Beam ◽  
High Energy ◽  
X Rays ◽  
High Energy Proton ◽  
Pixe Analysis ◽  
X Ray ◽  
Energy Proton ◽  
Ge Detector ◽  
Analytical Range

Autunite, a U-bearing mineral ( Ca(UO) 2( PO 4)2.10–12 H 2 O ), has been examined using a high-energy proton beam ( E p =40 MeV ) and Si(Li) and intrinsic Ge solid state detectors. The spectra obtained from the sample show clearly resolved U K α1, K α2 and K β X-ray lines (using the Ge detector) and Ca K α, K β X-rays, Sr K α, K β and U L X-rays (using the Si(Li) detector), this demonstrates the potential analytical range and flexibility of high energy PIXE analysis.

M-SHELL X-RAY TRANSITION RATES FOR HEAVY RARE EARTH ELEMENTS

1998 ◽  
Vol 08 (04) ◽  
pp. 235-251
Author(s):  
K. SERA ◽  
K. ISHII ◽  
H. ORIHARA
Keyword(s):  
Cross Sections ◽  
Production Cross ◽  
X Rays ◽  
Transition Rates ◽  
Heavy Rare Earth ◽  
Crystal Spectrometer ◽  
Pixe Analysis ◽  
X Ray ◽  
Heavy Lanthanides ◽  
Heavy Rare Earth Elements

Partial M-x-ray production cross sections, which have not been well investigated up to the present, were measured in detail for six heavy lanthanides; Dy , Ho , Er , Tm , Yb and Lu . As a result, it is found that intensities of Mα,β lines, which are dominant among all the M-x-rays, and (M1-N2, M1-N3, M2-N4) lines agree well with those predicted by theory. However, clear discrepancy is found for Mζ and Mγ x-rays. Although it was pointed out by a PIXE analysis with a high-resolution crystal spectrometer that special attention must be paid for an analysis of Mζ and Mγ lines, it is found from the present work that it is possible to perform quantitative analysis using Mα,β lines.

Mapping DNA and protein in biological samples using the scanning transmission x-ray microscope

1994 ◽  
Vol 52 ◽  
pp. 50-51
Author(s):  
X. Zhang ◽  
R. Balhorn ◽  
C. Jacobsen ◽  
J. Kirz ◽  
S. Williams
Keyword(s):  
Biological Samples ◽  
National Laboratory ◽  
Local Environment ◽  
High Energy ◽  
Brookhaven National Laboratory ◽  
High Energy Resolution ◽  
X Rays ◽  
X Ray ◽  
Scanning Transmission ◽  
Absorption Edges

The Scanning Transmission soft X-ray Microscope (STXM) at the XIA beamline at the National Synchrotron Light Source, Brookhaven National Laboratory, has achieved 50 nm Rayleigh resolution and has been used to image wet biological samples using the natural absorption differences between carbon and water in the water window (between carbon and oxygen K-absorption edges). The step-like jumps in the absorption of soft x-rays by materials as a function of energy have been used for elemental mapping. Examination of these absorption "edges" with high energy resolution resolves fine absorption structures. These fine structures are strongly affected by the atom's local environment, such that they carry detailed information about the atom's chemical state. We have used this chemical sensitivity to distinguish between materials which have similar elemental composition but are chemically different. Images with 50 nm resolution and spectra from a spot size less than (0.2 (μm)2 can be acquired routinely.Figure 1 shows the x-ray absorption fine structure spectra at the carbon absorption edge from DNA and bovine serum albumin (BSA, a typical protein) taken using the STXM.

Excitation and Detection of High Energy Characteristic X-rays (20-90 KeV) Using a Novel Radiometric Technique*

1984 ◽  
Vol 28 ◽  
pp. 99-102
Author(s):  
J. J. LaBrecque ◽  
P. A. Rosales
Keyword(s):  
Elemental Analysis ◽  
Energy Characteristic ◽  
High Energy ◽  
Beta Particle ◽  
X Rays ◽  
X Ray ◽  
Decay Modes ◽  
The Poor ◽  
Ge Detector ◽  
Radiometric Technique

Recently, we have developed a new radioisotope excited technique for x-ray fluorescence which employs “direct” beta particle excitation to produce characteristic x-rays for elemental analysis. We have also studied this technique with various other isotopes with different decay modes. But in all these previous works, we have only studied the x-ray energy region below the Bak lines (≤ 35 KeV), because of the poor efficiency of the Si(Li) semiconductor at higher energies.In this work we have employed a planar Ge detector, which has about a 100% efficiency in the range of about 20 to 100 KeV. We have also compared this detector with a HgI2 detector, even though its resolution and efficiency is far less than the planar Ge detector.

Elemental Analysis of Biomedical Samples by Pixe

1977 ◽  
Vol 21 ◽  
pp. 261-266
Author(s):  
J. A. Guffey ◽  
H. A. Van Rinsvelt ◽  
W. R. Adams ◽  
R. M. Sarper ◽  
Z. Karcioglu ◽  
...  
Keyword(s):  
Trace Elements ◽  
Early Detection ◽  
Trace Element ◽  
Elemental Analysis ◽  
Diagnostic Tool ◽  
Trace Element Analysis ◽  
Analytical Tool ◽  
Element Analysis ◽  
Pixe Analysis ◽  
X Ray

The use of particle-induced X-ray emission (PIXE) analysis as a standard analytical tool in the study of trace elements is well known. In the present investigation, an attempt is made to correlate human diseases with the presence or absence of trace elements and/or the changes in their concentration in healthy and diseased tissues. If such correlations do actually exist, trace element analysis could certainly be used as a diagnostic tool for the early detection of diseases and there is considerable interest in such information.

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