scholarly journals Intrinsic Sensing Properties of Chrysotile Fiber Reinforced Piezoelectric Cement-Based Composites

Sensors ◽  
2018 ◽  
Vol 18 (9) ◽  
pp. 2999 ◽  
Author(s):  
Jianlin Luo ◽  
Chunwei Zhang ◽  
Lu Li ◽  
Baolin Wang ◽  
Qiuyi Li ◽  
...  
Keyword(s):  
Cyclic Loading ◽  
Lead Zirconate Titanate ◽  
Piezoelectric Coefficient ◽  
Piezoelectric Properties ◽  
Electrical Response ◽  
Sol Gel ◽  
Piezoelectric Sensor ◽  
Cement Composite ◽  
Lead Zirconate ◽  
Micro Hardness

Lead-zirconate-titanate (PZT) nanoscale powder was first synthesized by the sol-gel method, then PZT and 0–3 type PZT/chrysotile fiber (CSF)/cement composite (PZTCC) wafers were fabricated after grind-mixing PZT powder with strontium carbonate and/or cement, ductile CSF in tandem with press-sintered process, respectively. The crystal structure (XRD), microstructure (SEM), piezoelectric properties after surface silver penetration, and polarization of the PZT and PZTCC wafer were investigated. Furthermore, self-sensing responses under either impulse or cyclic loading and micro-hardness toughness of PZTCC were also investigated. Results show that the incorporation of CSF and cement admixture weakens the perovskite crystalline peak of PZTCC; reduces the corresponding piezoelectric coefficient from 119.2 pC/N to 32.5 pC/N; but effectively bridges the gap on the toughness between PZTCC and concrete since the corresponding microhardness with 202.7 MPa of PZTCC is close to that of concrete. A good linear and fast electrical response against either impulse or cyclic loading of the PZTCC is achieved with their respective sensitivity, linearity, and repeatability to 1.505 mV/N, 2.42%, and 2.11%. The sensing responses and toughness of PZTCC is encouraging as an intrinsic piezoelectric sensor for real-time health monitoring of ductile concrete structures.

scholarly journals Piezoelectric properties of PZT by an ethylene glycol-based chemical solution synthesis

2021 ◽  
Author(s):  
Ewout van der Veer ◽  
Beatriz Noheda ◽  
Mónica Acuautla
Keyword(s):  
Thin Film ◽  
Ethylene Glycol ◽  
Lead Zirconate Titanate ◽  
Piezoelectric Properties ◽  
Sol Gel ◽  
Lead Zirconate ◽  
Grain Structure ◽  
Solution Synthesis ◽  
Zirconate Titanate ◽  
Layer Thin Film

AbstractWe have investigated a water-stable sol–gel method based on ethylene glycol as a solvent and bridging ligand for the synthesis of ferroelectric lead zirconate titanate in bulk and thin film forms. This method offers lower toxicity of the solvent, higher stability toward atmospheric moisture and a simplified synthetic procedure compared to traditional sol–gel methods. However, the piezoelectric properties of products produced using this method have yet to be systematically studied. We have measured the ferroelectric and piezoelectric properties and compared them to existing literature using different synthesis techniques. Ceramic pellets of Nb-doped lead zirconate titanate (PNZT) in the tetragonal phase were produced with high density and good piezoelectric properties, comparable to those reported in the literature and those found in commercial piezoelectric elements. In addition, a nine-layer thin film stack was fabricated by spin coating onto platinized silicon substrates. The films were crack-free and showed a perovskite grain structure with a weak (111) orientation. Piezoelectric measurements of the film showed a piezoelectric coefficient comparable to literature values and good stability toward fatigue.

Effect of Polarization on the Microstructure and Piezoelectric Properties of PZT-Cement Composites

2008 ◽  
Vol 55-57 ◽  
pp. 381-384 ◽  
Author(s):  
Arnon Chaipanich ◽  
Nittaya Jaitanong
Keyword(s):  
Portland Cement ◽  
Lead Zirconate Titanate ◽  
Piezoelectric Coefficient ◽  
Piezoelectric Properties ◽  
Lead Zirconate ◽  
Cement Composites ◽  
Poling Field ◽  
Polarization Condition ◽  
Zirconate Titanate ◽  
The Ideal

Lead zirconate titanate (PZT)-Portland cement (PC) composites were produced and successfully poled at different poling field and time. The effect of polarization on the microstructure and piezoelectric properties were then investigated. It was found that, at a fixed poling field up to 2 kV/mm, the piezoelectric coefficient (d33) was found to increase with poling time. The optimum poling time was found at 45 minutes where d33 value is 42 pC/N. The optimum and most practical poling field found for the composite was at 2 kV/mm. Lower poling field would give the composite lower piezoelectricity and poling field that is too high would result to breakdown of samples. Therefore, from these results, a poling field of 2 kV/mm at 45 minutes would be the ideal polarization condition used in poling PZT-PC composites.

Piezoelectric Properties of Sol-Gel Derived PZT Thin Films with Various Zr/Ti Ratios

1997 ◽  
Vol 493 ◽  
Author(s):  
G. Teqwee ◽  
K. C. McCarthy ◽  
F. S. McCarthy ◽  
D. G. Davis ◽  
J. T. Dawley ◽  
...  
Keyword(s):  
Thin Films ◽  
Lead Zirconate Titanate ◽  
Single Phase ◽  
Piezoelectric Properties ◽  
Sol Gel ◽  
Lead Zirconate ◽  
Piezoelectric Thin Films ◽  
Microelectromechanical Devices ◽  
Acoustic Wave Devices ◽  
Optical Lever

ABSTRACTPiezoelectric thin films are useful for application in microelectromechanical devices. A series of sol-gel derived PZT (lead zirconate titanate) thin films with various Zr/Ti ratios were prepared on platinized substrates. These films were fired to 650C - 700C to crystallize them into single-phase perovskite films, and their piezoelectric properties were measured using optical lever-based instrumentation. Large d33 piezoelectric coefficients up to 400 pm/V were obtained at the morphotropic phase boundary (PZT 53/47), making such films attractive in applications such as thin film transducers, microcanti levers and surface acoustic wave devices.

Effect of Processing Conditions on the Piezoelectric Properties of Sol-gel Derived Pb(Zr,Ti)O3 Films for Micromechanical Applications

2005 ◽  
Vol 20 (6) ◽  
pp. 1428-1435 ◽  
Author(s):  
J. Pérez ◽  
P.M. Vilarinho ◽  
A.L. Kholkin ◽  
J. Manuel Herrero ◽  
C. Zaldo
Keyword(s):  
Lead Zirconate Titanate ◽  
Annealing Temperature ◽  
Piezoelectric Properties ◽  
Sol Gel ◽  
Lead Zirconate ◽  
Piezoelectric Response ◽  
Preparation Conditions ◽  
Sol Gel Process ◽  
Pzt Films ◽  
Interface Effects

Lead zirconate titanate (PZT) films of composition close to the morphotropic phase boundary were deposited onto standard Si/SiO2/Ti/Pt substrates using a modified sol-gel process. The preparation conditions were optimized to obtain high-quality films at sufficiently low temperature (Ta - 500 °C). The dielectric, ferroelectric, and piezoelectric properties of the films were then measured as a function of the annealing temperature and the number of distillations to evaluate their suitability for micromechanical applications. The maximum values of the longitudinal charge and voltage piezoelectric coefficients were d33 ∼ 65 pm/V and g33 ∼ 4 × 10−3 Vm/N, respectively. The results indicate that the piezoelectric properties improved and became saturated with increasing number of distillations and are almost independent on Ta. Only moderate decrease of the piezoelectric response with frequency suggests that the investigated PZT films can be used in high-frequency piezoelectric applications. The results are discussed in terms of the microstructure and interface effects on the piezoelectric deformation in ferroelectric thin films.

Mechanical and Piezoelectric Properties of PZT Nanofibers

2009 ◽  
Author(s):  
Shiyou Xu ◽  
Yong Shi
Keyword(s):  
Lead Zirconate Titanate ◽  
Piezoelectric Properties ◽  
Sol Gel ◽  
Lead Zirconate ◽  
Electrospinning Process ◽  
Bending Test ◽  
Piezoelectric Response ◽  
Three Point Bending ◽  
Atomic Force ◽  
Average Grain Size

This paper reports the measurement of the mechanical and piezoelectric properties of Lead Zirconate Titanate (PbZr52Ti48O3, PZT) nanofibers. Partially aligned PZT nanofibers were fabricated by sol-gel electrospinning process. The diameters of the fiber were tuned from 50 to 150 nm by changing the concentration of the sol-gel in the precursor. The fiber consists of nanocrystal grains with average grain size of 10 nm. The Young’s modulus of individual fiber was obtained by nanoscale three-point bending using Atomic Force Microscope (AFM), which was 42.99GPa. Titanium strip was used as the substrate to collect the nanofibers for the three-point bending test to measure the piezoelectric response. The output voltages from the nanofibers under different strain were recorded by Labview, and the highest value of the output voltage was 0.17±0.005V. These results have shown that PZT nanofibers have great potential in nano sensor and actuator applications.

Micro- and Macroscopic Observations of the Microtexture, the Dielectric and Piezoelectric Properties in Bulk and Multilayer Pb (Zr, Ti)O3

2008 ◽  
Vol 55-57 ◽  
pp. 45-48
Author(s):  
N. Binhayeeniyi ◽  
A. Dasaesamoh ◽  
J. Khakong ◽  
P. Khaenamkaew ◽  
S. Muensit
Keyword(s):  
Lead Zirconate Titanate ◽  
Piezoelectric Properties ◽  
Sol Gel ◽  
Physical Property ◽  
Lead Zirconate ◽  
Solid State Method ◽  
Fundamental Properties ◽  
The Subject ◽  
Gel Technique ◽  
Dielectric And Piezoelectric Properties

The objective of the present paper is to give an insight of the fundamental properties strongly depended on the crystallizing phase, grain size, thickness, including stoichiometry of material. The subject of this work is the lead zirconate titanate [Pb(Zr,Ti)O3, PZT] with its composition located at the morphotropic phase boundary (MPB) that were prepared by a solid state method [1] and a conventional sol-gel technique [2,3]. The samples prepared by the first methods are in a bulk form while the latter the multilayer. The physical property and the dielectric and piezoelectric properties of the PZT samples have been discussed comparatively when the sample size decreasing from the bulk to the thin-film scale.

The Influence of Film Thickness on the Magnitude and Aging Behavior of the Transverse Piezoelectric Coefficient (d31) of PZT Thin Films

1997 ◽  
Vol 493 ◽  
Author(s):  
J. F. Shepard ◽  
F. Chu ◽  
P. J. Moses ◽  
S. Trolier-McKinstry
Keyword(s):  
Thin Films ◽  
Lead Zirconate Titanate ◽  
Piezoelectric Coefficient ◽  
Sol Gel ◽  
Pressure Oscillation ◽  
Lead Zirconate ◽  
Biaxial Stress ◽  
Charge Detection ◽  
Electronic Pressure ◽  
Lock In

The wafer flexure technique has been developed for the rapid measurement (less than 10 minutes) of the d31 coefficient of piezoelectric thin films. The technique is based upon the controlled bending of a clamped silicon substrate coated with a thin piezoelectric film. Flexure of the wafer results in the transfer of biaxial stress from the silicon to the film, and thus the production of an electric charge. The charge produced is used in conjunction with the applied principle stresses to determine the film's transverse piezoelectric coefficient (d31). For this study, the wafer flexure technique was modified from semi-ac operation to a mechanized ac measurement (i.e. electronic pressure oscillation and lock-in charge detection). Modifications made reduce electromagnetic noise and enhance both the resolution and precision of the device. The system was used to characterize the piezoelectric properties of lead zirconate titanate 52/48 thin films between 0.6 and 2.5 μm thick synthesized using a modified sol-gel technique. The transverse piezoelectric constants (d31) of the PZT films were found to range from −60 to −90 pC/N for the 0.6 and 2.5 μm films, respectively. Aging experiments of the d31; coefficients were also conducted and results showed values to be on the order of 4 to 8% per decade.

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