Mechanical and Piezoelectric Properties of PZT Nanofibers

2009 ◽  
Author(s):  
Shiyou Xu ◽  
Yong Shi
Keyword(s):  
Lead Zirconate Titanate ◽  
Piezoelectric Properties ◽  
Sol Gel ◽  
Lead Zirconate ◽  
Electrospinning Process ◽  
Bending Test ◽  
Piezoelectric Response ◽  
Three Point Bending ◽  
Atomic Force ◽  
Average Grain Size

This paper reports the measurement of the mechanical and piezoelectric properties of Lead Zirconate Titanate (PbZr52Ti48O3, PZT) nanofibers. Partially aligned PZT nanofibers were fabricated by sol-gel electrospinning process. The diameters of the fiber were tuned from 50 to 150 nm by changing the concentration of the sol-gel in the precursor. The fiber consists of nanocrystal grains with average grain size of 10 nm. The Young’s modulus of individual fiber was obtained by nanoscale three-point bending using Atomic Force Microscope (AFM), which was 42.99GPa. Titanium strip was used as the substrate to collect the nanofibers for the three-point bending test to measure the piezoelectric response. The output voltages from the nanofibers under different strain were recorded by Labview, and the highest value of the output voltage was 0.17±0.005V. These results have shown that PZT nanofibers have great potential in nano sensor and actuator applications.

Characterization of Piezoelectric Response of PZT Nanofibers

2007 ◽  
Author(s):  
Shiyou Xu ◽  
Vinod Challa ◽  
Yong Shi
Keyword(s):  
Lead Zirconate Titanate ◽  
Sol Gel ◽  
Lead Zirconate ◽  
Electrospinning Process ◽  
Bending Test ◽  
Piezoelectric Response ◽  
Dynamic Mechanical Analyzer ◽  
Three Point Bending ◽  
Average Grain Size

This paper reports the characterization of piezoelectric response of the Lead Zirconate Titanate (PbZr52Ti48O3) PZT nanofibers by three-point bending test using dynamic mechanical analyzer (DMA). PZT nanofibers were fabricated by sol-gel electrospinning process. The diameters of the fiber obtained were from 50 to 150 nm. The fiber consists of nanocrystal grains with average grain size of 10 nm. Titanium strip was used as substrate to collect the nanofibers for the three-point bending test to demonstrate the piezoresponse. The output voltage from the nanofibers under 0.5% strain was 0.17±0.005V, which was recorded by Labview. These results have shown that PZT nanofibers have great potential for nano sensor and actuator applications.

Effect of Processing Conditions on the Piezoelectric Properties of Sol-gel Derived Pb(Zr,Ti)O3 Films for Micromechanical Applications

2005 ◽  
Vol 20 (6) ◽  
pp. 1428-1435 ◽  
Author(s):  
J. Pérez ◽  
P.M. Vilarinho ◽  
A.L. Kholkin ◽  
J. Manuel Herrero ◽  
C. Zaldo
Keyword(s):  
Lead Zirconate Titanate ◽  
Annealing Temperature ◽  
Piezoelectric Properties ◽  
Sol Gel ◽  
Lead Zirconate ◽  
Piezoelectric Response ◽  
Preparation Conditions ◽  
Sol Gel Process ◽  
Pzt Films ◽  
Interface Effects

Lead zirconate titanate (PZT) films of composition close to the morphotropic phase boundary were deposited onto standard Si/SiO2/Ti/Pt substrates using a modified sol-gel process. The preparation conditions were optimized to obtain high-quality films at sufficiently low temperature (Ta - 500 °C). The dielectric, ferroelectric, and piezoelectric properties of the films were then measured as a function of the annealing temperature and the number of distillations to evaluate their suitability for micromechanical applications. The maximum values of the longitudinal charge and voltage piezoelectric coefficients were d33 ∼ 65 pm/V and g33 ∼ 4 × 10−3 Vm/N, respectively. The results indicate that the piezoelectric properties improved and became saturated with increasing number of distillations and are almost independent on Ta. Only moderate decrease of the piezoelectric response with frequency suggests that the investigated PZT films can be used in high-frequency piezoelectric applications. The results are discussed in terms of the microstructure and interface effects on the piezoelectric deformation in ferroelectric thin films.

Sol-Gel Derived PZT Thick Films with Nano-Sized Microstructure

2002 ◽  
Vol 748 ◽  
Author(s):  
C. L. Zhao ◽  
Z. H. Wang ◽  
W. Zhu ◽  
O. K. Tan ◽  
H. H. Hng
Keyword(s):  
Lead Zirconate Titanate ◽  
Electromechanical Coupling ◽  
Thick Films ◽  
Sol Gel ◽  
Essential Element ◽  
Processing Parameters ◽  
Lead Zirconate ◽  
Piezoelectric Response ◽  
Coupling Coefficients ◽  
Pzt Films

ABSTRACTLead zirconate titanate (PZT) films are promising for acoustic micro-devices applications because of their extremely high electromechanical coupling coefficients and excellent piezoelectric response. Thicker PZT films are crucial for these acoustic applications. A hybrid sol-gel technology has been developed as a new approach to realize simple and cost-effective fabrication of high quality PZT thick films. In this paper, PZT53/47 thick films with a thickness of 5–50 μm are successfully deposited on Pt-coated silicon wafer by using the hybrid sol-gel technology. The obtained PZT thick films are dense, crack-free, and have a nano-sized microstructure. The processing parameters of this technology have been evaluated. The microstructure of the film has been observed using field-emission scanning electron microscopy and the crystallization process has been monitored by the X-ray diffraction. The thick films thus made are good candidates for fabrication of piezoelectric diaphragm which will be an essential element of microspeaker and microphone arrays.

scholarly journals Piezoelectric properties of PZT by an ethylene glycol-based chemical solution synthesis

2021 ◽  
Author(s):  
Ewout van der Veer ◽  
Beatriz Noheda ◽  
Mónica Acuautla
Keyword(s):  
Thin Film ◽  
Ethylene Glycol ◽  
Lead Zirconate Titanate ◽  
Piezoelectric Properties ◽  
Sol Gel ◽  
Lead Zirconate ◽  
Grain Structure ◽  
Solution Synthesis ◽  
Zirconate Titanate ◽  
Layer Thin Film

AbstractWe have investigated a water-stable sol–gel method based on ethylene glycol as a solvent and bridging ligand for the synthesis of ferroelectric lead zirconate titanate in bulk and thin film forms. This method offers lower toxicity of the solvent, higher stability toward atmospheric moisture and a simplified synthetic procedure compared to traditional sol–gel methods. However, the piezoelectric properties of products produced using this method have yet to be systematically studied. We have measured the ferroelectric and piezoelectric properties and compared them to existing literature using different synthesis techniques. Ceramic pellets of Nb-doped lead zirconate titanate (PNZT) in the tetragonal phase were produced with high density and good piezoelectric properties, comparable to those reported in the literature and those found in commercial piezoelectric elements. In addition, a nine-layer thin film stack was fabricated by spin coating onto platinized silicon substrates. The films were crack-free and showed a perovskite grain structure with a weak (111) orientation. Piezoelectric measurements of the film showed a piezoelectric coefficient comparable to literature values and good stability toward fatigue.

The Use of Correlation and Frequency Analysis for Detection of Deformation in 7050 Aluminum Beams

2015 ◽  
Vol 655 ◽  
pp. 263-266
Author(s):  
Fei Yi Liao ◽  
Shi Jun Li ◽  
Yuan Lin
Keyword(s):  
Frequency Domain ◽  
Lead Zirconate Titanate ◽  
Lamb Waves ◽  
Piezoelectric Materials ◽  
Lead Zirconate ◽  
Bending Test ◽  
Test Machine ◽  
Three Point Bending ◽  
Potential Applications ◽  
Aluminum Beam

Lead zirconate titanate (PZT) is one of the most widely used ferroelectric and piezoelectric materials. Its piezoelectricity is widely used in the applications of structural health monitoring (SHM). Here, we use PZT ceramics as sensors to detect the deformation of structure using guided Lamb waves. In order to well analyze the multi-modes of Lamb waves and achieve detection of deformation in superposed wave peaks, correlation and Fourier transform were used to extract peaks in both time and frequency domain. In this paper, a 7050 aluminum beam and three-point bending test machine were utilized to test the changes of waves when different deformations were introduced. With the adjustment of correlation index, change of time delay and new peaks occurring in time domain demonstrated the change of deformations. In frequency domain, the change of central frequencies and magnitudes also demonstrated the change of deformations. The study shows the potential applications of PZT sensors in detection of deformation.

Frequency-dependent electromechanical properties for sol-gel deposited ferroelectric lead zirconate titanate thin layers: Thickness and processing effects

1995 ◽  
Vol 10 (6) ◽  
pp. 1435-1440 ◽  
Author(s):  
Jie-Fang Li ◽  
Dwight Viehland ◽  
C.D.E. Lakeman ◽  
D.A. Payne
Keyword(s):  
Lead Zirconate Titanate ◽  
Sol Gel ◽  
Polarization Switching ◽  
Lead Zirconate ◽  
Thin Layers ◽  
Piezoelectric Response ◽  
Electromechanical Properties ◽  
Measurement Frequency ◽  
Processing Effects ◽  
Hysteresis Characteristics

The electromechanical properties of sol-gel-derived ferroelectric Pb(Zr0.53Ti0.47)O3 (PZT 53/47) thin layers deposited on silicon were determined as a function of field strength, measurement frequency, and total thickness. Both electrically induced strains (∊) and piezoelectric properties (d33) were characterized by interferometry. Dielectric spectroscopy and polarization switching (P-E) measurements were determined for comparative purposes. An asymmetry between forward and the reverse bias conditions in the ∊-E displacements was found for both five-layer deposited and nine-layer deposited structures. However, no asymmetry was observed in the P-E hysteresis characteristics. In addition, the electrically induced strains and the piezoelectric response were found to be dependent on measurement frequency. No significant frequency dependence was observed in the polarization or dielectric responses. The results are discussed in terms of a possible clamping effect on polarization switching.

Piezoelectric Properties of Sol-Gel Derived PZT Thin Films with Various Zr/Ti Ratios

1997 ◽  
Vol 493 ◽  
Author(s):  
G. Teqwee ◽  
K. C. McCarthy ◽  
F. S. McCarthy ◽  
D. G. Davis ◽  
J. T. Dawley ◽  
...  
Keyword(s):  
Thin Films ◽  
Lead Zirconate Titanate ◽  
Single Phase ◽  
Piezoelectric Properties ◽  
Sol Gel ◽  
Lead Zirconate ◽  
Piezoelectric Thin Films ◽  
Microelectromechanical Devices ◽  
Acoustic Wave Devices ◽  
Optical Lever

ABSTRACTPiezoelectric thin films are useful for application in microelectromechanical devices. A series of sol-gel derived PZT (lead zirconate titanate) thin films with various Zr/Ti ratios were prepared on platinized substrates. These films were fired to 650C - 700C to crystallize them into single-phase perovskite films, and their piezoelectric properties were measured using optical lever-based instrumentation. Large d33 piezoelectric coefficients up to 400 pm/V were obtained at the morphotropic phase boundary (PZT 53/47), making such films attractive in applications such as thin film transducers, microcanti levers and surface acoustic wave devices.

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