Radical analysis and residence-time effect of silicon nitride atomic layer deposition processes with trisilylamine and NH3 plasmas
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2020 ◽
Vol 38
(6)
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pp. 062406
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2012 ◽
Vol 30
(1)
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pp. 01A115
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2020 ◽
Vol 38
(2)
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pp. 022602
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