scholarly journals Redeposition in plasma-assisted atomic layer deposition: Silicon nitride film quality ruled by the gas residence time

2015 ◽  
Vol 107 (1) ◽  
pp. 014102 ◽  
Author(s):  
Harm C. M. Knoops ◽  
K. de Peuter ◽  
W. M. M. Kessels
2017 ◽  
Vol 133 ◽  
pp. 10-16 ◽  
Author(s):  
Pei-Ci Jhang ◽  
Chi-Pin Lu ◽  
Jung-Yu Shieh ◽  
Ling-Wu Yang ◽  
Tahone Yang ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document