AMPLITUDE CHARACTERISTICS OF SILICON PHOTO-ELECTRON MULTIPLIER’S PHOTORESPORENSE
Currently, in many applications, photodetectors are needed that provide registration of optical radiation in a wide range of intensities and allow combining two operating modes: current mode and photon counting. These devices include silicon photoelectronic multipliers (SiPM), which have a number of advantages compared to electrovacuum photomultipliers and avalanche photodetectors. However, the influence on the photoresponse characteristics of SiPM of such important factors as the supply voltage and temperature has not been studied enough. The influence of these factors on the amplitude parameters of the photoresponse of SiPM is studied. The block diagram of the experimental setup is presented, with the help of which the photoresponse characteristics of SiPM with n+-n-p+ and p+-p-n+ structures manufactured by Integral OJSC (Republic of Belarus) were measured. The dependences of the average amplitude of the photoresponse on the supply voltage and temperature of silicon photomultipliers for various wave-lengths of optical radiation are presented. It was found that when SiPM were exposed to optical pulses with the same duration and energy exposure at the same temperature at the same overvoltage, the photoresponse amplitude was larger for a SiPMr with p+-p-n+ structure regardless of the wave-length of optical radiation. It was found that, when the overvoltage changes, the increase in the photoresponse amplitude is observed only in the overvoltage range ΔU = 0 ¸ 3 V for all the studied SiPM, irrespective of the wave-length of the detected optical radiation and temperature. It was determined that a decrease in temperature led to an increase in the amplitude of the photoresponse pulses. The temperature dependence of the amplitude of the photoresponse was most pronounced for SiPM with the p+-p-n+ structure. It was shown that the dependences of the average amplitude of the photomonitor Si-PM on the energy exposure have a linear section, the length of which depends on the wavelength of the detected optical radiation.